JPS638612B2 - - Google Patents

Info

Publication number
JPS638612B2
JPS638612B2 JP57090582A JP9058282A JPS638612B2 JP S638612 B2 JPS638612 B2 JP S638612B2 JP 57090582 A JP57090582 A JP 57090582A JP 9058282 A JP9058282 A JP 9058282A JP S638612 B2 JPS638612 B2 JP S638612B2
Authority
JP
Japan
Prior art keywords
circuit
output
test mode
input
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57090582A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58207648A (ja
Inventor
Hideki Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57090582A priority Critical patent/JPS58207648A/ja
Publication of JPS58207648A publication Critical patent/JPS58207648A/ja
Publication of JPS638612B2 publication Critical patent/JPS638612B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP57090582A 1982-05-28 1982-05-28 集積回路のテストモ−ド設定回路 Granted JPS58207648A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57090582A JPS58207648A (ja) 1982-05-28 1982-05-28 集積回路のテストモ−ド設定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57090582A JPS58207648A (ja) 1982-05-28 1982-05-28 集積回路のテストモ−ド設定回路

Publications (2)

Publication Number Publication Date
JPS58207648A JPS58207648A (ja) 1983-12-03
JPS638612B2 true JPS638612B2 (enrdf_load_stackoverflow) 1988-02-23

Family

ID=14002430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57090582A Granted JPS58207648A (ja) 1982-05-28 1982-05-28 集積回路のテストモ−ド設定回路

Country Status (1)

Country Link
JP (1) JPS58207648A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61287315A (ja) * 1985-06-13 1986-12-17 Mitsubishi Electric Corp 半導体集積回路
JPH0644031B2 (ja) * 1985-11-15 1994-06-08 富士通株式会社 テスト回路
JP3838722B2 (ja) * 1997-01-13 2006-10-25 ローム株式会社 強制動作機能付き制御回路を有する半導体装置
US6225842B1 (en) 1998-01-09 2001-05-01 Rohm Co., Ltd. Control device with forced operation function and semiconductor integrated circuit device
DE60021705T2 (de) * 1999-11-29 2006-06-01 Koninklijke Philips Electronics N.V. Verfahren und integrierte schaltung gestaltet zur beschickung eines prüfmusters auf einen einzelnen gemeinsamen anschlussstift
JP6062795B2 (ja) * 2013-04-25 2017-01-18 エスアイアイ・セミコンダクタ株式会社 半導体装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932897B2 (ja) * 1975-10-15 1984-08-11 株式会社東芝 集積回路
JPS5734458Y2 (enrdf_load_stackoverflow) * 1975-11-07 1982-07-29
JPS56160049A (en) * 1980-05-14 1981-12-09 Matsushita Electric Ind Co Ltd Mode change-over circuit

Also Published As

Publication number Publication date
JPS58207648A (ja) 1983-12-03

Similar Documents

Publication Publication Date Title
US4961013A (en) Apparatus for generation of scan control signals for initialization and diagnosis of circuitry in a computer
JPH0760400B2 (ja) 論理回路の診断方法
US5867453A (en) Self-setup non-overlap clock generator
KR100393472B1 (ko) 스캔테스트용자동리세트바이패스제어
JPS638612B2 (enrdf_load_stackoverflow)
JPH10290146A (ja) グリッチ信号を除去するための回路
US6081913A (en) Method for ensuring mutual exclusivity of selected signals during application of test patterns
JP3363691B2 (ja) 半導体論理集積回路
JPH0133052B2 (enrdf_load_stackoverflow)
US5341403A (en) Means to avoid data distortion in clock-synchronized signal sampling
JPS60142282A (ja) 半導体集積回路
US5708380A (en) Test for hold time margins in digital systems
KR100244430B1 (ko) 반도체 칩의 테스트 회로
JP2591849B2 (ja) テスト回路
JPH0391195A (ja) メモリ回路
US6683483B1 (en) Clock pulse width control circuit
JP3147057B2 (ja) 半導体集積回路およびその使用方法
JPS6089127A (ja) パルス信号発生回路
KR100214327B1 (ko) 인터럽트 발생회로와 방법
JPH039428B2 (enrdf_load_stackoverflow)
KR900006412B1 (ko) 카운터를 사용한 테스트 논리회로
JPH02203611A (ja) フリップフロップ回路
JPS6259942B2 (enrdf_load_stackoverflow)
JPH0495785A (ja) 半導体集積回路装置
JPH0160792B2 (enrdf_load_stackoverflow)