JPS6367849B2 - - Google Patents
Info
- Publication number
- JPS6367849B2 JPS6367849B2 JP56073302A JP7330281A JPS6367849B2 JP S6367849 B2 JPS6367849 B2 JP S6367849B2 JP 56073302 A JP56073302 A JP 56073302A JP 7330281 A JP7330281 A JP 7330281A JP S6367849 B2 JPS6367849 B2 JP S6367849B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- photodetector
- light
- inspected
- output signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7330281A JPS57189046A (en) | 1981-05-15 | 1981-05-15 | Inspecting device for surface defect |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7330281A JPS57189046A (en) | 1981-05-15 | 1981-05-15 | Inspecting device for surface defect |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57189046A JPS57189046A (en) | 1982-11-20 |
| JPS6367849B2 true JPS6367849B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-12-27 |
Family
ID=13514224
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7330281A Granted JPS57189046A (en) | 1981-05-15 | 1981-05-15 | Inspecting device for surface defect |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57189046A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59155540U (ja) * | 1983-04-05 | 1984-10-18 | 三菱電機株式会社 | 欠陥検査装置 |
| JPS59155541U (ja) * | 1983-04-05 | 1984-10-18 | 三菱電機株式会社 | 欠陥検査装置 |
| FR2873207A1 (fr) * | 2004-07-16 | 2006-01-20 | Jean Francois Fardeau | Instrument de mesure optique, sans contact et en production, de l'etat de surface, de la rugosite, des defauts de forme, en surface d'un fil ou profile long |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5327087A (en) * | 1976-08-26 | 1978-03-13 | Toshiba Corp | Flaw detector |
| JPS559170A (en) * | 1978-07-07 | 1980-01-23 | Fujikura Ltd | Surface flaw detector |
-
1981
- 1981-05-15 JP JP7330281A patent/JPS57189046A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57189046A (en) | 1982-11-20 |