JPS6365885B2 - - Google Patents

Info

Publication number
JPS6365885B2
JPS6365885B2 JP19282082A JP19282082A JPS6365885B2 JP S6365885 B2 JPS6365885 B2 JP S6365885B2 JP 19282082 A JP19282082 A JP 19282082A JP 19282082 A JP19282082 A JP 19282082A JP S6365885 B2 JPS6365885 B2 JP S6365885B2
Authority
JP
Japan
Prior art keywords
light beam
measured
parallel scanning
light
scanning light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP19282082A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5983007A (ja
Inventor
Yoshiharu Kuwabara
Hiroyoshi Hamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Priority to JP19282082A priority Critical patent/JPS5983007A/ja
Publication of JPS5983007A publication Critical patent/JPS5983007A/ja
Publication of JPS6365885B2 publication Critical patent/JPS6365885B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP19282082A 1982-11-02 1982-11-02 光学式測定機 Granted JPS5983007A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19282082A JPS5983007A (ja) 1982-11-02 1982-11-02 光学式測定機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19282082A JPS5983007A (ja) 1982-11-02 1982-11-02 光学式測定機

Publications (2)

Publication Number Publication Date
JPS5983007A JPS5983007A (ja) 1984-05-14
JPS6365885B2 true JPS6365885B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-12-19

Family

ID=16297522

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19282082A Granted JPS5983007A (ja) 1982-11-02 1982-11-02 光学式測定機

Country Status (1)

Country Link
JP (1) JPS5983007A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018115985A (ja) * 2017-01-19 2018-07-26 リコーインダストリアルソリューションズ株式会社 ガス分布検出光学装置およびガス分布検出装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01206205A (ja) * 1988-02-12 1989-08-18 Keyence Corp スペックルパターン干渉計
JPH0530084Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1988-06-28 1993-08-02
JP6951107B2 (ja) 2017-04-18 2021-10-20 株式会社ミツトヨ 光学式外径測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018115985A (ja) * 2017-01-19 2018-07-26 リコーインダストリアルソリューションズ株式会社 ガス分布検出光学装置およびガス分布検出装置

Also Published As

Publication number Publication date
JPS5983007A (ja) 1984-05-14

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