JPS6352454B2 - - Google Patents
Info
- Publication number
- JPS6352454B2 JPS6352454B2 JP62079210A JP7921087A JPS6352454B2 JP S6352454 B2 JPS6352454 B2 JP S6352454B2 JP 62079210 A JP62079210 A JP 62079210A JP 7921087 A JP7921087 A JP 7921087A JP S6352454 B2 JPS6352454 B2 JP S6352454B2
- Authority
- JP
- Japan
- Prior art keywords
- alignment
- wafer
- shot
- printing
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62079210A JPS62271430A (ja) | 1987-03-31 | 1987-03-31 | ウエハ−処理方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62079210A JPS62271430A (ja) | 1987-03-31 | 1987-03-31 | ウエハ−処理方法 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57210986A Division JPS59101830A (ja) | 1982-12-01 | 1982-12-01 | 転写装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62271430A JPS62271430A (ja) | 1987-11-25 |
| JPS6352454B2 true JPS6352454B2 (enrdf_load_html_response) | 1988-10-19 |
Family
ID=13683576
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62079210A Granted JPS62271430A (ja) | 1987-03-31 | 1987-03-31 | ウエハ−処理方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62271430A (enrdf_load_html_response) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58103150A (ja) * | 1981-12-16 | 1983-06-20 | Matsushita Electric Ind Co Ltd | 半導体基板の製造方法 |
| JPS5932130A (ja) * | 1982-08-16 | 1984-02-21 | Hitachi Ltd | 露光方法および露光装置 |
-
1987
- 1987-03-31 JP JP62079210A patent/JPS62271430A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62271430A (ja) | 1987-11-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0141012B2 (enrdf_load_html_response) | ||
| KR101048191B1 (ko) | 위치 정렬 대상물의 재등록 방법 및 그 방법을 기록한 기록매체 | |
| US4641071A (en) | System for controlling drive of a wafer stage | |
| JPS6352454B2 (enrdf_load_html_response) | ||
| JP2000155430A (ja) | 両面露光装置における自動アライメント方法 | |
| JP2869826B2 (ja) | 半導体製造方法 | |
| JPH1116806A (ja) | プリアライメントサーチを含む位置合わせ方法 | |
| JPS61110428A (ja) | 半導体焼付装置 | |
| JP2003237031A (ja) | スクリーン印刷用アライメント装置 | |
| JPS62179116A (ja) | 半導体製造装置 | |
| JP2005338555A (ja) | 露光装置、露光方法および露光処理プログラム | |
| KR100280417B1 (ko) | 웨이퍼마크검출시스템 | |
| JPH104047A (ja) | 半導体製造装置及びコマンド設定方法 | |
| JP2006041126A (ja) | 操作・表示装置、表示方法及び表示プログラム | |
| KR20010077238A (ko) | 웨이퍼 정렬 장치 및 이에 적합한 정렬 방법 | |
| CN114041110B (zh) | 图像显示装置及图像显示方法 | |
| KR100268040B1 (ko) | 반도체 웨이퍼 패턴의 크기 및 오버레이 측정 장치 | |
| JPH04326507A (ja) | 半導体露光方法 | |
| JPH05102008A (ja) | 半導体露光装置 | |
| JPH09199400A (ja) | 半導体製造装置および該装置を用いた半導体製造方法 | |
| JP2000173914A (ja) | 半導体製造装置、表示装置、位置検出装置および方法 | |
| KR100734648B1 (ko) | 얼라인유닛을 구비한 반도체 노광장치 | |
| JPS6362099B2 (enrdf_load_html_response) | ||
| JPS62133719A (ja) | 半導体製造装置 | |
| JPH04365312A (ja) | 半導体露光装置 |