JPS6348042B2 - - Google Patents

Info

Publication number
JPS6348042B2
JPS6348042B2 JP53110651A JP11065178A JPS6348042B2 JP S6348042 B2 JPS6348042 B2 JP S6348042B2 JP 53110651 A JP53110651 A JP 53110651A JP 11065178 A JP11065178 A JP 11065178A JP S6348042 B2 JPS6348042 B2 JP S6348042B2
Authority
JP
Japan
Prior art keywords
wafer
objective lens
amount
mask
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53110651A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5538505A (en
Inventor
Susumu Aiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11065178A priority Critical patent/JPS5538505A/ja
Publication of JPS5538505A publication Critical patent/JPS5538505A/ja
Publication of JPS6348042B2 publication Critical patent/JPS6348042B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automatic Focus Adjustment (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP11065178A 1978-09-11 1978-09-11 Follow-up focusing device Granted JPS5538505A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11065178A JPS5538505A (en) 1978-09-11 1978-09-11 Follow-up focusing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11065178A JPS5538505A (en) 1978-09-11 1978-09-11 Follow-up focusing device

Publications (2)

Publication Number Publication Date
JPS5538505A JPS5538505A (en) 1980-03-18
JPS6348042B2 true JPS6348042B2 (enrdf_load_stackoverflow) 1988-09-27

Family

ID=14541064

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11065178A Granted JPS5538505A (en) 1978-09-11 1978-09-11 Follow-up focusing device

Country Status (1)

Country Link
JP (1) JPS5538505A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005222889A (ja) * 2004-02-09 2005-08-18 Tokyo Seimitsu Co Ltd 対物レンズ駆動装置

Also Published As

Publication number Publication date
JPS5538505A (en) 1980-03-18

Similar Documents

Publication Publication Date Title
US4615621A (en) Auto-focus alignment and measurement system and method
CN106814546B (zh) 焦面检测装置、焦面标定方法与硅片曝光方法
US4506977A (en) Transfer apparatus provided with an auto-focusing mechanism
TWI462143B (zh) 動態調整電子束影像之聚焦之方法、動態量測欲檢測樣本之高度變化之裝置、電子束裝置、調整電子束之焦距之裝置
US4580900A (en) Auto focus alignment and measurement system and method
US20030044176A1 (en) Optical axis adjusting device
US4600282A (en) Alignment apparatus
JPS6348042B2 (enrdf_load_stackoverflow)
US4717257A (en) Alignment device
JPS61250506A (ja) 整合修正装置
JPH0936033A (ja) 半導体露光装置
JPS5917247A (ja) 露光装置
JPS59123811A (ja) 光学機械の最適な焦点調節を選ぶ方法
CN106647194B (zh) 一种焦面探测单元以及自动调焦的对准系统
JPS5858740A (ja) 半導体ウエハのそり測定装置
CN118050941B (zh) 一种自动对焦方法、系统、装置以及计算机程序产品
CN117129505B (zh) 一种微小区域检测的高通量能量色散x射线荧光光谱仪
JPS63261727A (ja) 板状体の面歪み補正方法
JP3340199B2 (ja) 非球面レンズの偏心測定装置
KR0122252Y1 (ko) 반도체 소자 제조시 사용되는 축소 노광 장치
JPH06224101A (ja) 二重焦点レンズ及び位置合せ装置
JPH0548355Y2 (enrdf_load_stackoverflow)
JP3303916B2 (ja) 電子線マイクロアナライザの原理を用いた試料面マッピング装置
JPS6144429Y2 (enrdf_load_stackoverflow)
JPH0447807B2 (enrdf_load_stackoverflow)