JPS6344220B2 - - Google Patents
Info
- Publication number
- JPS6344220B2 JPS6344220B2 JP57217177A JP21717782A JPS6344220B2 JP S6344220 B2 JPS6344220 B2 JP S6344220B2 JP 57217177 A JP57217177 A JP 57217177A JP 21717782 A JP21717782 A JP 21717782A JP S6344220 B2 JPS6344220 B2 JP S6344220B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- monitor
- electron beam
- photomask
- exposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/44—Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57217177A JPS59105647A (ja) | 1982-12-09 | 1982-12-09 | 電子ビーム露光方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57217177A JPS59105647A (ja) | 1982-12-09 | 1982-12-09 | 電子ビーム露光方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63082326A Division JPS63288018A (ja) | 1988-04-05 | 1988-04-05 | 電子ビーム露光方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59105647A JPS59105647A (ja) | 1984-06-19 |
| JPS6344220B2 true JPS6344220B2 (enExample) | 1988-09-02 |
Family
ID=16700065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57217177A Granted JPS59105647A (ja) | 1982-12-09 | 1982-12-09 | 電子ビーム露光方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59105647A (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59124129A (ja) * | 1982-12-29 | 1984-07-18 | Fujitsu Ltd | 電子ビ−ム露光方法 |
| JPS63288018A (ja) * | 1988-04-05 | 1988-11-25 | Mitsubishi Electric Corp | 電子ビーム露光方法 |
| US5296917A (en) * | 1992-01-21 | 1994-03-22 | Mitsubishi Denki Kabushiki Kaisha | Method of monitoring accuracy with which patterns are written |
| JP2011034120A (ja) * | 2010-11-17 | 2011-02-17 | Renesas Electronics Corp | フォトマスクペア |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5846054B2 (ja) * | 1977-02-03 | 1983-10-14 | 三菱電機株式会社 | フオトマスク |
| JPS5819551Y2 (ja) * | 1978-10-04 | 1983-04-22 | 富士通株式会社 | フオトマスク |
-
1982
- 1982-12-09 JP JP57217177A patent/JPS59105647A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59105647A (ja) | 1984-06-19 |
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