JPS6342739B2 - - Google Patents

Info

Publication number
JPS6342739B2
JPS6342739B2 JP55151893A JP15189380A JPS6342739B2 JP S6342739 B2 JPS6342739 B2 JP S6342739B2 JP 55151893 A JP55151893 A JP 55151893A JP 15189380 A JP15189380 A JP 15189380A JP S6342739 B2 JPS6342739 B2 JP S6342739B2
Authority
JP
Japan
Prior art keywords
sample
rays
sample holding
slit
profile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55151893A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5776446A (en
Inventor
Mineo Kumazawa
Mari Takagi
Tadashi Masuda
Akio Fujimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON ETSUKUSUSEN KK
Original Assignee
NIPPON ETSUKUSUSEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON ETSUKUSUSEN KK filed Critical NIPPON ETSUKUSUSEN KK
Priority to JP55151893A priority Critical patent/JPS5776446A/ja
Publication of JPS5776446A publication Critical patent/JPS5776446A/ja
Publication of JPS6342739B2 publication Critical patent/JPS6342739B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55151893A 1980-10-29 1980-10-29 X-ray goniometer Granted JPS5776446A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55151893A JPS5776446A (en) 1980-10-29 1980-10-29 X-ray goniometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55151893A JPS5776446A (en) 1980-10-29 1980-10-29 X-ray goniometer

Publications (2)

Publication Number Publication Date
JPS5776446A JPS5776446A (en) 1982-05-13
JPS6342739B2 true JPS6342739B2 (enrdf_load_stackoverflow) 1988-08-25

Family

ID=15528494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55151893A Granted JPS5776446A (en) 1980-10-29 1980-10-29 X-ray goniometer

Country Status (1)

Country Link
JP (1) JPS5776446A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4938981B2 (ja) * 2005-01-13 2012-05-23 キヤノン株式会社 結晶方位測定方法

Also Published As

Publication number Publication date
JPS5776446A (en) 1982-05-13

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