JPS5776446A - X-ray goniometer - Google Patents

X-ray goniometer

Info

Publication number
JPS5776446A
JPS5776446A JP55151893A JP15189380A JPS5776446A JP S5776446 A JPS5776446 A JP S5776446A JP 55151893 A JP55151893 A JP 55151893A JP 15189380 A JP15189380 A JP 15189380A JP S5776446 A JPS5776446 A JP S5776446A
Authority
JP
Japan
Prior art keywords
sample
ray
domain
rotating
goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55151893A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6342739B2 (enrdf_load_stackoverflow
Inventor
Mineo Kumazawa
Mari Takagi
Tadashi Masuda
Akio Fujimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON X SEN KK
Original Assignee
NIPPON X SEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON X SEN KK filed Critical NIPPON X SEN KK
Priority to JP55151893A priority Critical patent/JPS5776446A/ja
Publication of JPS5776446A publication Critical patent/JPS5776446A/ja
Publication of JPS6342739B2 publication Critical patent/JPS6342739B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55151893A 1980-10-29 1980-10-29 X-ray goniometer Granted JPS5776446A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55151893A JPS5776446A (en) 1980-10-29 1980-10-29 X-ray goniometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55151893A JPS5776446A (en) 1980-10-29 1980-10-29 X-ray goniometer

Publications (2)

Publication Number Publication Date
JPS5776446A true JPS5776446A (en) 1982-05-13
JPS6342739B2 JPS6342739B2 (enrdf_load_stackoverflow) 1988-08-25

Family

ID=15528494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55151893A Granted JPS5776446A (en) 1980-10-29 1980-10-29 X-ray goniometer

Country Status (1)

Country Link
JP (1) JPS5776446A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194743A (ja) * 2005-01-13 2006-07-27 Canon Inc 結晶方位測定方法およびそれに用いる試料ホルダー

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194743A (ja) * 2005-01-13 2006-07-27 Canon Inc 結晶方位測定方法およびそれに用いる試料ホルダー

Also Published As

Publication number Publication date
JPS6342739B2 (enrdf_load_stackoverflow) 1988-08-25

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