JPS633370B2 - - Google Patents

Info

Publication number
JPS633370B2
JPS633370B2 JP54095641A JP9564179A JPS633370B2 JP S633370 B2 JPS633370 B2 JP S633370B2 JP 54095641 A JP54095641 A JP 54095641A JP 9564179 A JP9564179 A JP 9564179A JP S633370 B2 JPS633370 B2 JP S633370B2
Authority
JP
Japan
Prior art keywords
sample
section
passing
storage
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54095641A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5619458A (en
Inventor
Chihiro Nakamura
Taketoshi Yonezawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP9564179A priority Critical patent/JPS5619458A/ja
Publication of JPS5619458A publication Critical patent/JPS5619458A/ja
Publication of JPS633370B2 publication Critical patent/JPS633370B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP9564179A 1979-07-26 1979-07-26 Automatic measuring-inspecting unit Granted JPS5619458A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9564179A JPS5619458A (en) 1979-07-26 1979-07-26 Automatic measuring-inspecting unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9564179A JPS5619458A (en) 1979-07-26 1979-07-26 Automatic measuring-inspecting unit

Publications (2)

Publication Number Publication Date
JPS5619458A JPS5619458A (en) 1981-02-24
JPS633370B2 true JPS633370B2 (cs) 1988-01-23

Family

ID=14143124

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9564179A Granted JPS5619458A (en) 1979-07-26 1979-07-26 Automatic measuring-inspecting unit

Country Status (1)

Country Link
JP (1) JPS5619458A (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH024557U (cs) * 1988-06-17 1990-01-12

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2773714B2 (ja) * 1995-10-26 1998-07-09 ティーディーケイ株式会社 磁気抵抗効果素子を有する磁気ヘッドの検査方法及び装置
JP4509020B2 (ja) * 2005-12-27 2010-07-21 Ｔｄｋ株式会社 磁気ヘッドの製造装置及び製造方法（選別分類）

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH024557U (cs) * 1988-06-17 1990-01-12

Also Published As

Publication number Publication date
JPS5619458A (en) 1981-02-24

Similar Documents

Publication Publication Date Title
DE19750949B4 (de) Testhandhabungsvorrichtung für horizontalen Transport
DE112005002446T5 (de) Bestückungsmaschine mit verbesserter Bauteilaufnahmeprüfung
CN112161558B (zh) 探针行程自动检测系统
KR0138753B1 (ko) Ic 검사 장치
CN117630706A (zh) 电池的开路电压测试装置
JP2958014B2 (ja) 表面装着された部品をもつプリント回路板の点検装置及び点検方法
JPS633370B2 (cs)
DE19581448C2 (de) Vorrichtungen und Verfahren zum automatischen Testen von Bauelementen
DE112005002693T5 (de) Prüfgerät für elektronische Bauelemente und Verfahren zur Erkennung schadhafter Klemmen
JP2025003476A (ja) 検査システム
DE19625876B4 (de) Automatisches Prüfmanipulatorsystem für IC-Prüfer
CN112684315B (zh) 一种印制线路板性能检测机及检测方法
JP2615204B2 (ja) つづみ型コアの分離供給装置並びにその選別仕分け装置
JPH0329335A (ja) 半導体チッププローバ
JP3233303B2 (ja) キャリアテープ性能試験機
EP0864874A2 (de) Verfahren und Vorrichtung zum Prüfen von Leiterplatten
JP2002328151A (ja) Ｔａｂ用オートハンドラ
JP2535078B2 (ja) 位置比較装置
JP3033617B2 (ja) ノズル検査装置
JPH03108677A (ja) Ｉｃデバイスのコンタクト機構
JPH03242566A (ja) 回路基板検査装置
JPH01125837A (ja) プロービング方法
CN119319083A (zh) 一种超导材料检测装置及其检测方法
JPH0756693B2 (ja) フロッピーディスク検査装置
JPS6186665A (ja) Ｉｃハンドラ