JPS633370B2 - - Google Patents

Description

[Detailed Description of the Invention] The present invention is a magnetic recording/reproducing device (hereinafter referred to as VTR).
The present invention provides a device that semi-automatically measures and inspects relatively physical characteristics of magnetic heads (hereinafter simply referred to as heads) used in magnetic heads (hereinafter simply referred to as heads), such as track width, inductance, insulation resistance, and conductive resistance. be.

In an azimuth recording type VTR, two heads with different track angles, an L head and an R head, are used in pairs, so the uniformity of the characteristics of the two heads has a great effect on the performance of the VTR. Therefore, it is necessary to measure and test the characteristics of the L head and the R head and to determine the best combination of the two heads. The apparatus of the present invention measures the track width, inductance, insulation resistance, conduction resistance, etc. all at once among the characteristics necessary to determine the pairing.

Conventionally, the physical characteristics of the head as described above have been measured and inspected in the inspection process and pairing process shown in FIG.
The track width is measured at the same time as the R classification, the heads are numbered and the measured values are recorded, the electromagnetic conversion characteristics are tested in step 2, and the inductance is measured one by one with a measuring device in step 3. Read and record the measured values. Step 1 with pairing in step 4,
Based on the data of measurements 2 and 3, L head and R
Determine the best combination of heads. After that, in step 5, insulation resistance and continuity resistance were measured and inspected. Therefore, process 1 → (process 2) → process 3 → (process 4) →
Process 5 and the head require a lot of handling and transportation, which can lead to defects such as damaging or breaking the head.Furthermore, if a defect occurs in the insulation or continuity test in process 5, there will be a loss of time up to process 4, and the measurement value will be lost. Recording, pass/fail judgment, and selection were done manually, which caused problems in terms of efficiency, workability, reliability, etc.

The present invention solves the conventional problems by developing a dedicated carrier.
This problem was solved by developing a head transport mechanism, a method for batch measurement and inspection of the physical properties of heads, and a method for automatically sorting out acceptable and rejected heads. Hereinafter, one embodiment of the present invention will be described based on the drawings.

FIG. 2 shows the inspection process and pairing process of the embodiment of the present invention. After L/R classification in step 1, electromagnetic conversion characteristics are inspected in step 2, a number is assigned to the head, and the head is stored in a sample supply carrier, and the sample supply carrier is installed in an automatic measurement and inspection device in step 3 for physical inspection. After measuring and inspecting the appropriate characteristics, only the passing heads are taken out using a passing sample storage carrier and paired in step 4. Therefore, the measurement and inspection of physical characteristics, which was conventionally carried out in three steps, is carried out in one step and semi-automatically in this embodiment, which improves efficiency and
This greatly improves workability and reliability.

3 and 4 show a plan view and a right side view of the sample 1 (magnetic head in this embodiment), in which the head chip 1a is adhesively fixed to the unit base 1c together with the printed board 1b. Printed board 1b
A terminal A1d and a terminal B1e are formed on the head chip 1a, and are connected by soldering to both ends of a lead wire 1f wound around the head chip 1a to obtain electromagnetic conversion.
A mounting hole 1g is formed in the unit base 1c.

FIG. 5 shows an overall external view of the apparatus of this embodiment, in which a measuring instrument box 2 has a monitor television 3, a television control unit 4, an operation display panel 5, and a measuring instrument 6, and a table 7 has a sample. 1 transport mechanism section 8 and a microscope 10 equipped with an ITV camera 9. 11 is a control circuit box. The sample 1 stored in the sample supply carrier 12 is transported by the transport mechanism section 8 to the measurement position at the bottom of the microscope 10, and the track width of the sample 1 is determined by the two black or white When the two electronic lines 3a are adjusted to the track width position, the two electronic lines 3a are magnified and applied to the monitor television 3 which is movably generated on the screen by the television control unit 4. The interval between the electronic lines 3a of the book is converted into the distance of the image of the microscope 10 and displayed on the operation display panel 5. The sample measuring section 13 measures the inductance, insulation resistance, and conduction resistance.
The measuring device 6 that is in contact with the terminals A1d and B1e of the sample 1 and connected to the sample measuring section 13 measures the measured value and displays the result on the operation display panel 5. The microcomputer 14 built in the control circuit box 11 makes a judgment of pass or fail in the measurement inspection, and the failing samples 1 are carried out by the transport mechanism section 8, and the passing samples 1 are neatly stored in the passing sample storage carrier 15. be done.

Next, the transport mechanism section 8 for the sample 1 and the sample measuring section 13, which are the main parts of the embodiment of the present invention, will be explained. 6th
7 and 7 are front and plan views of the transport mechanism section 8 and the sample measurement section 13 for the sample 1. The sample supply section 1 is equipped with a sample supply carrier 12 and moves back and forth.
6, a reciprocally movable sample pushing unit 18 for pushing out and conveying the sample 1 stored in the sample supply carrier 12 onto the sample guide rail 17; The sample sequential feeding section 19 repeats, and the sequentially fed samples 1 are taken out one by one and transported to the sample measuring section 13 at predetermined intervals, and the samples 1 that have been measured and inspected in the sample measuring section 13 are taken out and transported. A sample spacing section 20, a rejected sample dropping section 21 that carries out by gravity the sample 1 that has passed the measurement test, and a sample 1 that has passed the measurement test.
A passing sample dropping section 22 that releases the lower guide of the accepted sample 1 and allows it to fall naturally when the sample is transported to a preset position by the sample spacing sending section 20; It is composed of blocks of a reciprocating accepted sample storage section 23 equipped with a storage carrier 15.

Reference numeral 24 denotes a sample push-out pulley connected to a motor 25 and a rope 2 wound around the sample push-out pulley 24.
6a is fixed to the sample push-out section 18 via guide pulleys 27a, 27b, and 27c, and the sample push-out section 18 is reciprocated in the directions of arrows E and F by the drive of the motor 25, and is stored in the supply carrier 12. The sample 1 can be transported. Reference numeral 28 denotes a sample sequential feed pulley, which is connected to the rotating shaft of a pulse motor 29, and guides the rope 26b wound around the sample sequential feed pulley 28 through guide pulleys 27d, 27e,
The sample sequential feeding section 19 via 27f and 27g
The sample 1 can be transported by a predetermined amount on the sample guide rail 17 by driving the pulse motor 29.
Reference numeral 30 denotes an X-Y table on which the microscope 10 is fixed, which is fixed to the table 7 via a fixing plate 31 and a holding plate 32, and the adjustment of the microscope 10 in the X and Y directions is
- This is done by driving a pulse motor (not shown) attached to the Y table 30 so as to be interlocked with an adjustment micrometer (not shown), using the X adjustment switch 33 and the Y adjustment switch 34. For adjustment in the Z direction, use the Z direction adjustment knob 10 of the microscope 10.
This is done by driving a pulse motor (not shown) which is attached so as to be interlocked with the Z adjustment switch 35. Therefore, the position on the screen of the front shape of the head chip 1a of the sample 1 enlarged and projected onto the monitor television 3 can be easily adjusted.
36 and 37 are connected to the television control unit 4, and are connected to the monitor television 3.
These are electronic line adjustment knobs A and B for manually rotating and aligning the two electronic lines 3a on the screen to the track width of the sample 1 magnified and administered on the screen. 38 is a measurement switch.

FIG. 8 shows a block diagram of the transport mechanism section 8 for the sample 1. The samples 1 stored in the sample supply carrier 12 are transported in each block and are measured and inspected in the sample measuring section 13, and only the acceptable samples 1 are stored in the acceptable sample storage carrier 15 and taken out.

Next, the transport mechanism section 8 of the sample 1 and the sample measurement section 1
3 will be explained in detail. 9 and 10 show a top view and a right side view of the sample supply carrier 12. FIG.
The sample storage table 12a has a plurality of rows, for example ten rows, of sample storage grooves 12b for storing samples 1, and a plurality of, for example ten, samples 1 are stored in one row of the sample storage grooves 12b. Numbers are assigned to each of the sample storage grooves 12b in which the samples 1 are stored, and the samples 1 are stored in alignment after being measured and inspected in the electromagnetic conversion characteristic test in step 2 of FIG. The sample storage stand 12a
A slide plate 12c having a sample passage groove 12d is provided on both side surfaces of the slide guide plates A12e and B.
12f, and connected by a spring 12i to a spring hanging plate 12g of the slide plate 12c and a spring hanging shaft 12h fixed to the sample storage table 12a,
Normally (when not attached to the sample supply section 16), the sample storage groove 12b of the sample storage stand 12a and the sample passage groove 12d of the slide plate 12c are at different positions, preventing the sample 1 stored in the sample storage groove from falling. This is a configuration that prevents this. When the sample supply carrier 12 is attached to the sample supply section 16, the slide plate 12
e is the sample storage groove 12b of the sample storage stand 12a.
Then, the slide plate 12c can be moved to a position where the sample passage groove 12d is aligned, allowing the sample 1 to pass.

FIG. 11 shows a configuration diagram of the sample supply section 16. 3
Reference numeral 9 denotes a sample supply stand, which controls and moves the slide plate 12c of the sample supply carrier 12. It has a slide plate regulating base 40 (that is, the sample storage groove 12b
and the sample passage groove 12d), a sample supply table holding table A42 having a built-in ball bush 41,
It is slidably attached to the guide shaft 44 via the same B43. The guide shaft 44 is fixed to the table 7 via a guide shaft holder 45, and a ball screw nut 46 is fixed to the sample supply table holder A42 via a nut mounting plate 47. The ball screw 48 is fixed to the table 7 and rotatably attached to a ball screw holder 50 containing a ball bearing 49. A gear A51 attached to one end of the ball screw 48 meshes with a gear 54 attached to the shaft of a pulse motor 53 fixed to a motor mount 52, and transmits the rotational drive of the pulse motor 53 to the sample supply table 39. , the sample supply stage 39 is moved back and forth in the directions of arrows A and B. The pulse motor 53 is connected to the sample supply carrier 12 mounted on the sample supply stage 39.
The sample supply carrier 12 is moved to the pitch (p) of the sample storage groove 12b according to the progress of the measurement inspection of the sample 1 using a feed pulse corresponding to one pitch of the sample storage groove 12b.
Perform pitch feed (in the direction of arrow A) for several minutes. In other words, when a plurality of samples 1 stored in the first row of sample storage grooves 12b of the sample supply carrier 12 are pushed out and conveyed to the sample guide rail 17 by the sample extrusion section 18, the pulse motor 53 is driven and the two rows of samples 1 are The sample storage groove 12b is located at the sample extrusion section 18.
It is pitch-fed in the direction of arrow A to the position where it engages. When pitch feeding and pushing out of the sample 1 are completed, the pulse motor 53 returns the sample supply table 39 to the starting position by continuous reverse rotation driving.

Figures 12 and 13 show the sample guide rail 17.
and a side view of the configuration of the rejected sample dropping section 21 and
The XII-XII arrow view is shown. The sample guide rail 17 includes sample guide tables A17a, B17b, C17c,
It is composed of a guide stand holder A17d and a guide stand B17e. The protrusion 7a of the sample sequential feeding section 19 can pass through the gap α provided between the sample guide tables A17a and B17b, making it possible to sequentially feed the samples 1. The sample feeding shaft 94 of the sample interval feeding section 20 can pass through the gap β, making it possible to feed the sample 1 at intervals. In Fig. 13, a is the sample sequential feeding section 19.
b is the measurement position of sample 1, and c is the position of sample 1 according to the sample spacing feed table 92.
This is the grip position. Reference numeral 55 denotes a reject sample dropping table disposed at the above c position, which forms a part of the sample guide rail 17, is slidably attached to a guide shaft 56 fixed to the sample guide stand A17a, and is attached to the guide shaft 56 fixed to the sample guide stand A17a. The sample guide stand A17a is normally pressed by a spring 58 fitted onto the shaft 56 and regulated by a holding plate 57. The rejected sample drop table 55 is connected by an interlocking shaft 63 to an interlocking plate 62 which is rotatable about a fulcrum shaft 61 connected to a movable shaft 60a of a solenoid 60 fixed to the table 7 via a mounting plate 59, The operation of the solenoid 60 causes the reject sample drop table 55 to slide in the direction of arrow D, releasing a portion of the sample guide rail 17. Therefore, when a sample 1 that has been measured and inspected by the sample measuring section 13 and has failed is transferred to the rejected sample drop table 55 by the sample spacing section 20, a signal is given to the solenoid 60, which operates to detect the rejected sample. Sample 1 naturally falls through the gap 150 under its own weight and is carried out. When the accepted sample 1 is transported, the rejected sample drop table 55 moves in the direction of arrow C and becomes a sample guide rail again.

Figures 14 and 15 show the sample extrusion section 18.
and a front view of a configuration diagram of the sample sequential feeding section 19. Reference numeral 64 denotes a sample extrusion table having a sample extrusion protrusion 64a, which includes a ball bush 65 and is slidably attached to a guide shaft 66. The guide shaft 66 is held by guide shaft holders A67 and B68 fixed to the table 7. The rope 26a wound around the sample push-out pulley 24 shown in FIG.
It is fixed to the sample extrusion table 14 via rope fixing plates A69 and B70 via 7b and 27c. The protrusion 64a of the sample pushing stand 64 pushes the inside of the first row of sample storage grooves 12b of the sample supply carrier 12 mounted on the sample feeding stand 39 into the sample feeding stand 39.
is set at a position where it moves back and forth at the position before the pitch feed, and therefore, the sample push-out table 64 moves in the direction of the arrow H by the drive of the motor 25, and the protrusion 64a
Sample storage groove 12 of the sample supply carrier
One row of the samples 1 stored in B are simultaneously pushed out and conveyed to the sample guide rail 17, and when the pushing out is completed, the sample supply carrier 12 is moved in the direction of the arrow to a position where it does not come into contact with the sample supply carrier 12 during pitch movement (state in FIG. 15). Return and prepare for extruding the next sample 1. 71
is a ball bushing (not shown) on the sample feed stage.
The rope 26b, which is slidably attached to the guide shaft 66 and wound around the sample sequential feed pulley 28 shown in FIG.
e, 27f, 27g to the sample sequential feed table 7
1 is fixed to a rope fixing plate C72 and the same is fixed to D73. 74 are gaps α and β of the sample guide rail 17.
A sample sequential feed plate having a protrusion 74a that engages with the sample sequential feed plate 71 to sequentially feed the sample 1.
It is slidably attached to a guide shaft 75 fixed to the guide shaft 75, is biased in the direction of arrow T by a spring 76 fitted onto the guide shaft 75, and is normally pressed against a regulating plate 77. The sample sequential feeding plate 74 is connected to an interlocking shaft 82 so as to be rotatable with an interlocking plate 81 rotatable on a fulcrum shaft 80 connected to a movable shaft 79a of a solenoid 79 attached to a ball bush holding plate 78. It slides in the directions of arrows T and H with the action of . Therefore, when the sample push-out section 18 is operated, the solenoid 79 operates at the sample push-out position (solid line position in FIG. 15), moves the sample push-out plate 74 in the direction of the arrow H, and moves the sample guide rail 17.
The protrusion 74a of the sample extrusion plate 74 is released, and the sample is completely extruded.While this state is maintained, the protrusion 74a of the sample extrusion plate 74 moves the sample sequentially through the continuous drive of the pulse motor 29. The solenoid 79 is moved in the direction of the arrow to the position where it engages with the last sample end of the sample 1 that has been pushed out and conveyed, and at that position, the solenoid 79 is returned to move the protrusion 74a into the rail 17 as shown by the imaginary line in FIG. The sample 1 is inserted, and then the pulse motor 29 is driven in reverse to send each sample 1 in sequence to the position (a).

FIG. 16 and FIG. 17 show the sample interval feeding section 20.
18 shows a plan view and a right side view of the configuration of the acceptable sample dropping section 22, and FIG. 18 shows a detailed view of the sample interval feeding section 20. A sliding plate 83 is fixed to an X-direction feed base 86 containing a ball bush 85 slidably attached to a guide shaft 84, and the guide shaft 84 is fixed to a guide shaft holder C87 fixed to the table 7.
It is held in the same D88. Reference numeral 89 denotes an air cylinder A, and the cylinder rod 89a is connected to a ball bush holding plate 91 via a rod holder A90, and the operation of the air cylinder A89 moves the sliding plate 83 in the X direction, that is, in the directions of arrows H and F. Reference numeral 92 denotes a sample spacing feed base, which is equipped with a sample feed shaft 94 having elasticity and a built-in spring 93, and a sample feed rack 95 having a plurality of sample feed protrusions 95a. The guide shaft 97 is movably mounted on the sliding plate 8.
It is held in a guide shaft holder 98 fixed to 3. Reference numeral 99 denotes an air cylinder B, which is fixed to the sliding plate 83 via a mounting base 100, and a cylinder rod 99a is connected to the sample spacing feed table 92 via a rod holder B101, and the sample is moved by the operation of the air cylinder B99. The interval feed table 92 is moved in the Y direction. Therefore, the sample spacing feed table 92 can be moved in the X direction and the Y direction. The interval feeding of sample 1 will be explained in detail with reference to FIG. When the samples 1 are sequentially fed by the sample sequential feeding section 19 to the position (a) of the sample guide rail 17, the sample spacing feed table 92 moves in the direction of arrow ``nu'' (FIG. 18 shows the direction of arrow nu). ), insert the sample feed shaft 94 into the mounting hole 1g of sample 1.
are fitted, and then the sample 1 is taken out and conveyed to position (b), which is the measurement position, by moving in the direction of arrow H. Next, it moves in the directions of arrows A and F to return to its original position. At this time, the sample sequential feeding section 19 operates, and when the measurement and inspection of the sample 1 that sequentially feeds the next sample 1 to the position (a) is completed, the sample spacing feeding table 9
2 is an X-Y movement in the directions of arrows N, H, R, and F. Sample 1 at position (a) moves to position (b), and sample 1 at position (b) moves to position (b).
(c) transported to position. The position (c) is the rejected sample dropping section 21, and when the rejected sample 1 is transported to the position (c), it is carried out by gravity. The accepted sample 1 engages with the protrusion 95a of the sample feeding rack 95 and is conveyed by X-Y movement in the directions of the arrows N, H, R, and F. 102 and 103 are the upper and lower shooters that guide the fall of the accepted sample 1, and the connecting plate 1.
04 and is fixed to the table 7 via a shooter fixing base 105. 106 is passing sample 1
A passing sample dropping table forming a part of the guide rail of , which is slidably attached to the guide shaft 107;
The guide shaft 107 has one end connected to the upper shooter 1.
02, and is held by a guide shaft holder 109 whose one end is fixed to a mounting ramp 108. 110 is an air cylinder C, which is fixed to the mounting ramp 108 via a mounting base 111, and includes a cylinder rod 110a and a rod holder C11.
The passing sample dropping table 106 is connected to the passing sample dropping table 106 via the air cylinder C110, and by the operation of the air cylinder C110, the passing sample dropping table 106 slides in the direction of the arrow R, and the passing sample 1
Remove part of the guide rail. Therefore, when the accepted sample is transported to the preset position, the air cylinder C110 is operated, and the accepted sample 1 guided to the acceptable sample drop table 106 is completely loaded with its own weight and is transferred to the upper shooter 102 and the lower shooter 10.
The sample is guided by the falling guide groove 113 provided at No. 3 and falls naturally. Reference numeral 114 denotes a sample guide stand D, which is fixed to the upper shooter 102 via guide stand holding stands C115 and D116.

FIG. 19 shows a configuration diagram of the accepted sample storage section 23. Reference numeral 117 denotes a passed sample storage stand, on which the passed sample storage carrier 15 is mounted and the ball bush 11 is mounted.
8 built-in storage stand holding stand A119 and B120
The guide shaft 121 is slidably attached to the guide shaft 121 via the guide shaft holder A12.
A ball screw nut 124 is fixed to the storage table holder A119 via a nut mounting plate 125. The ball screw 126 includes a ball screw holder A128 with a built-in ball bearing 127 fixed to the guide shaft holder A122, and a ball screw holder B with a built-in ball bearing 127 fixed via a ball screw mounting plate A129 and the same B130.
131 and is rotatably attached. A gear A132 attached to one end of the ball screw 126
The motor mounting base 1 is attached to the ball screw mounting plate A129.
It meshes with a gear B135 attached to the shaft of a fixed pulse motor 134 via a gear B135, transmits the rotational drive of the pulse motor 134 to the accepted sample storage stand 117, and moves this accepted sample storage stand 117 along the arrows and keys. Move back and forth in the direction. The pulse motor 134 moves the passing sample storage carrier 15 in accordance with the storage of the passed sample 1 by sending pulses for one pitch of the passing sample storage inclined frame 15a of the passed sample storage carrier 15 mounted on the passed sample storage stand 117. 15 passed Pitch of sample storage inclined frame 15a (p)
Perform pitch feed in the direction of the arrow W for several minutes. That is, when the passing sample 1 is stored in the first row of passing sample storage inclined frames 15a of the passing sample storage carrier 15, the pulse motor 134 is driven, and the second row of passing sample storage inclined frames 15a is loaded with the passing sample 1. The sample is pitch-fed to a position where it engages with the falling position of the acceptable sample in the falling part 22. When pitch feeding and storage of the acceptable sample 1 are completed, the pulse motor 134 returns the acceptable sample storage table 117 to the starting position (the position in FIG. 19) by continuous reverse rotation driving.

20 and 21 show a plan view and a right side view of the acceptable sample storage carrier 15. The passed sample storage carrier 15 has the same number of passed sample storage inclined frames 15a in one row as the number of samples to be stored in one row of the sample storage grooves 12b of the sample supply carrier 12 that stores the passed samples 1, and the sample storage grooves 12b. 12b, and the same number is given to each accepted sample storage inclined frame 15a at a position corresponding to the number given to the sample storage groove 12b. Therefore, the accepted samples naturally dropped from the accepted sample dropping section 22 are neatly stored in the accepted sample storage inclined frame 15a of the accepted sample storage carrier 15 designated with the same number as the sample number of the sample supply carrier 12.

22 and 23 show a top view and a right side view of the configuration of the sample measuring section 13. FIG. Reference numeral 136 denotes a measuring table, which has a sample fixing shaft 138 that has a built-in spring 137 and is elastic, and a measuring pin 140 that also has a built-in spring and is held by an elastic insulating plate 139, and is slidably attached to a guide shaft 141. has been done. The guide shaft 141 is attached to a guide shaft holder 143 fixed to a substrate 142. The substrate 142 is fixed to the table 7 via the mounting plate 114. 145 is an air cylinder D, which is fixed to the substrate 142 via a mounting base 146;
Cylinder rod 145a is rod holder D1
It is connected to the measuring table 136 through the air cylinder D147, and the measuring table 136 is moved by the operation of the air cylinder D145. Therefore, the sample fixing shaft 138 is fitted into the mounting hole 1g of the sample 1 transferred to the measurement position shown in FIG. contacts the terminals A1d and B1e of the sample 1, and the sample 1
enables measurement and inspection of physical properties of

As explained above, the present invention exhibits the following effects.

In the sample measuring section, the sample, for example, the magnetic head, is pressed and fixed in position, and at the same time the measuring pin comes into contact with the terminal of the magnetic head. Therefore, the inductance, insulation resistance, and continuity resistance are simultaneously measured and inspected using a measuring device connected to the measurement pin, and the track width is also measured at the same time. can be measured by aligning it with the enlarged and projected track width of the magnetic head, resulting in a significant reduction in measurement time.

Judgment as to whether the sample passes or fails is made immediately after the measurement test, and based on the results, the rejected samples can be dropped and carried out, and only the passed samples can be lined up and stored in the passed sample storage carrier. Therefore, there is no need to sort and carry out rejected samples, and the pass/fail ratio of passed and rejected samples can be easily determined.

When the sample supply carrier is not used in this device, slide plates attached to both sides are in a position to prevent the sample from falling, making it easy to transport the sample and make effective use of it.

A plurality of samples arranged and stored in a sample supply carrier can be simultaneously conveyed along a sample guide rail, and the conveyed samples are sent sequentially by a predetermined amount and at intervals by a predetermined amount to a measurement position. By measuring and inspecting the samples while they are being transported, it is not necessary to take them out one by one from the sample supply carrier, which saves time.

Simplification is achieved without the need for special measures by allowing the removal of rejected samples and the storage of accepted samples into the acceptable sample supply carrier by allowing the samples to fall naturally under their own weight.

In the passed sample storage carrier, by making the place where the rejected sample is placed a blank number, the sample number can be determined by the number assigned to each sample storage inclined frame of the passed sample storage carrier, making it easier to take out the sample, etc. is easy.

[Brief explanation of the drawing]

Figure 1 is a diagram of the conventional inspection and bearing process.
Figure 2 and subsequent figures show an embodiment of the present invention, with Figure 2 being a diagram of the inspection and pairing process, Figure 3 being a front view of the sample to be measured (magnetic head), and Figure 4 being a right side view of the same. Figure 5 is an overall external view of the automatic measurement and inspection device, Figure 6 is a front view showing the overall configuration of the sample transport mechanism, Figure 7 is a plan view of the same, and Figure 8 is a block diagram of the sample transport mechanism. , FIG. 9 is a plan view showing the configuration of the sample supply carrier, FIG. 10 is a right side view of the sample supply carrier, and FIG.
Figure 1 is a configuration diagram of the sample supply section, Figure 12 is a side view showing the configuration of the sample guide rail and the passing sample drop section, Figure 13 is a view taken along arrows XII-XII in Figure 12, and Figure 14 is a diagram showing the configuration of the sample supply section.
The figure is a front view showing the structure of the sample pushing section and the sample sequential feeding section, FIG. 15 is a plan view of the same, FIG. 18 is a detailed view of the sample spacing feeding section, FIG. 19 is a configuration diagram of the acceptable sample storage section, FIG. 20 is a plan view of the acceptable sample storage carrier, and FIG. 21 is a right side view of the same, and FIG. FIG. 22 is a plan view showing the configuration of the sample measuring section, and FIG. 23 is a right side view of the same. 1...Sample, 12...Sample supply carrier, 1
2a...Sample storage stand, 12b...Sample storage groove, 1
2c...Slide plate, 12d...Sample passage groove, 1
3... Sample measurement section, 15... Acceptable sample storage carrier, 15a... Acceptable sample storage inclined frame, 16...
Sample supply section, 17...Sample guide rail, 18...
Sample extrusion section, 19...Sample sequential feeding section, 20
... Sample spacing sending section, 21... Rejected sample dropping section, 22... Passing sample dropping section, 52... Motor,
53... Pulse motor, 55... Rejected sample drop table, 60... Solenoid (drive device), 64...
Sample pushing stand, 71...Sample sequential feeding stand, 79
... Solenoid (drive device), 89 ... Air cylinder, 92 ... Sample spacing feed stand, 95 ... Sample feed rack, 99 ... Air cylinder, 10
6... Passing sample dropping table, 110... Air cylinder, 117... Passing sample storage stand, 134... Pulse motor, 138... Sample fixing shaft (pressing body),
140...Measuring pin, 145...Air cylinder.

Claims (1)

[Scope of Claims] 1. A sample supply carrier for storing a sample to be measured, a sample measurement section, and a sample feeding means for feeding an appropriate number of samples in the sample supply carrier to the sample measurement section along a sample guide rail. , a sending means for sending out the sample measured in the sample measuring section from the measuring section; a passing sample storage section for storing the passed samples among the samples sent out by the sending means; and a passing sample storage section for storing the rejected samples. The sample supply carrier is provided with a sample storage stand having a plurality of rows of sample storage grooves, and a sample storage stand disposed on both sides of the storage stand so as to be movable back and forth within a certain small range along the sides. and a slide plate having the same number of sample passage grooves as sample storage grooves, and a spring that biases the slide plate in one direction so that each sample passage groove does not coincide with each sample storage groove. The section is provided with a pressing body that presses and fixes the sample, and a measuring pin that comes into contact with the connection terminal of the press-fixed sample, and the sample feeding means is provided with a pressing body that presses and fixes the sample. It has a sample extrusion section that pushes out the sample to the guide rail, and a sample sequential feeding section that sequentially sends each sample pushed out by the extrusion section to the sample measuring section, and the sample is sent to the sending means by the sample feeding means. The protrusion engages with each sample to bring each sample one by one to the measurement position, and the protrusion comes into contact with the sample feed shaft that is carried out from this measurement position and both sides of the sample carried out by the sample feed shaft. a sample interval feeding section having a sample feeding rack for sending out the sample as a lever, a passing sample dropping table connected to the sample guide rail below the feeding means in the passing sample storage section; A drive device is provided which detects when a passing sample has reached a predetermined position on the dropping table, and in response to a detection command, removes the passing sample dropping table from the guide rail and allows the passing sample to fall naturally, A reject sample dropping table forming a part of the sample guide rail is provided below the sample spacing feeding section, and the reject sample dropping table is removed from the guide rail based on a rejection command from the sample measuring section. An automatic measurement and inspection device characterized by having a drive device that allows a sample to fall naturally. 2. The automatic measurement and inspection apparatus according to claim 1, wherein the sample supply carrier is fed pitch by pitch in the same pitch as each sample storage groove. 3 A passing sample storage carrier is provided in the passing sample storage section, and the passing sample storage carrier is provided with the same number of passing sample storage inclined frames as the samples in the sample storage grooves of the sample supply carrier, and each of the inclined frames is provided with a passing sample storage carrier. 2. The automatic measurement and inspection device according to claim 1, wherein each sample in the groove is given a corresponding number.