JPS63313030A - 光ファイバ試験装置 - Google Patents

光ファイバ試験装置

Info

Publication number
JPS63313030A
JPS63313030A JP14878387A JP14878387A JPS63313030A JP S63313030 A JPS63313030 A JP S63313030A JP 14878387 A JP14878387 A JP 14878387A JP 14878387 A JP14878387 A JP 14878387A JP S63313030 A JPS63313030 A JP S63313030A
Authority
JP
Japan
Prior art keywords
light
optical fiber
polarization
optical
wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14878387A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0547060B2 (enExample
Inventor
Muneki Ran
蘭　宗樹
Kazuo Nagata
和生 永田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP14878387A priority Critical patent/JPS63313030A/ja
Publication of JPS63313030A publication Critical patent/JPS63313030A/ja
Publication of JPH0547060B2 publication Critical patent/JPH0547060B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
JP14878387A 1987-06-15 1987-06-15 光ファイバ試験装置 Granted JPS63313030A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14878387A JPS63313030A (ja) 1987-06-15 1987-06-15 光ファイバ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14878387A JPS63313030A (ja) 1987-06-15 1987-06-15 光ファイバ試験装置

Publications (2)

Publication Number Publication Date
JPS63313030A true JPS63313030A (ja) 1988-12-21
JPH0547060B2 JPH0547060B2 (enExample) 1993-07-15

Family

ID=15460579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14878387A Granted JPS63313030A (ja) 1987-06-15 1987-06-15 光ファイバ試験装置

Country Status (1)

Country Link
JP (1) JPS63313030A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1005213A3 (nl) * 1990-09-28 1993-05-25 Ando Electric Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken.
JP2008116278A (ja) * 2006-11-02 2008-05-22 Central Res Inst Of Electric Power Ind 光デバイスを含む光ファイバ線路の障害点検出方法及び障害点検出システム
JP2017198668A (ja) * 2016-04-15 2017-11-02 ヴァイアヴィ・ソリューションズ・インコーポレイテッドＶｉａｖｉ Ｓｏｌｕｔｉｏｎｓ Ｉｎｃ． ブリルアン及びレイリー分布センサ
CN108168848A (zh) * 2018-02-13 2018-06-15 南光高科（厦门）激光科技有限公司 一种多模光纤测试装置

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1005213A3 (nl) * 1990-09-28 1993-05-25 Ando Electric Apparaat voor het testen van optische vezel door optische heterodyne techniek te gebruiken.
JP2008116278A (ja) * 2006-11-02 2008-05-22 Central Res Inst Of Electric Power Ind 光デバイスを含む光ファイバ線路の障害点検出方法及び障害点検出システム
JP2017198668A (ja) * 2016-04-15 2017-11-02 ヴァイアヴィ・ソリューションズ・インコーポレイテッドＶｉａｖｉ Ｓｏｌｕｔｉｏｎｓ Ｉｎｃ． ブリルアン及びレイリー分布センサ
US10073006B2 (en) 2016-04-15 2018-09-11 Viavi Solutions Inc. Brillouin and rayleigh distributed sensor
US10876925B2 (en) 2016-04-15 2020-12-29 Viavi Solutions Inc. Brillouin and rayleigh distributed sensor
US11422060B2 (en) 2016-04-15 2022-08-23 Viavi Solutions Inc. Brillouin and rayleigh distributed sensor
CN108168848A (zh) * 2018-02-13 2018-06-15 南光高科（厦门）激光科技有限公司 一种多模光纤测试装置
CN108168848B (zh) * 2018-02-13 2024-05-03 南光高科（厦门）激光科技有限公司 一种多模光纤测试装置

Also Published As

Publication number Publication date
JPH0547060B2 (enExample) 1993-07-15

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