JPS6327797B2 - - Google Patents

Info

Publication number
JPS6327797B2
JPS6327797B2 JP59167341A JP16734184A JPS6327797B2 JP S6327797 B2 JPS6327797 B2 JP S6327797B2 JP 59167341 A JP59167341 A JP 59167341A JP 16734184 A JP16734184 A JP 16734184A JP S6327797 B2 JPS6327797 B2 JP S6327797B2
Authority
JP
Japan
Prior art keywords
memory cell
storage device
test
memory
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59167341A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60167199A (ja
Inventor
Osamu Matsuoka
Atsushi Nigorikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP59167341A priority Critical patent/JPS60167199A/ja
Publication of JPS60167199A publication Critical patent/JPS60167199A/ja
Publication of JPS6327797B2 publication Critical patent/JPS6327797B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP59167341A 1984-08-10 1984-08-10 半導体記憶装置の検査装置 Granted JPS60167199A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59167341A JPS60167199A (ja) 1984-08-10 1984-08-10 半導体記憶装置の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59167341A JPS60167199A (ja) 1984-08-10 1984-08-10 半導体記憶装置の検査装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP51129911A Division JPS5816559B2 (ja) 1976-10-27 1976-10-27 半導体記憶装置の検査装置および検査方法

Publications (2)

Publication Number Publication Date
JPS60167199A JPS60167199A (ja) 1985-08-30
JPS6327797B2 true JPS6327797B2 (enrdf_load_stackoverflow) 1988-06-06

Family

ID=15847929

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59167341A Granted JPS60167199A (ja) 1984-08-10 1984-08-10 半導体記憶装置の検査装置

Country Status (1)

Country Link
JP (1) JPS60167199A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5066124A (enrdf_load_stackoverflow) * 1973-10-12 1975-06-04

Also Published As

Publication number Publication date
JPS60167199A (ja) 1985-08-30

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