JPS6327749B2 - - Google Patents

Info

Publication number
JPS6327749B2
JPS6327749B2 JP57194773A JP19477382A JPS6327749B2 JP S6327749 B2 JPS6327749 B2 JP S6327749B2 JP 57194773 A JP57194773 A JP 57194773A JP 19477382 A JP19477382 A JP 19477382A JP S6327749 B2 JPS6327749 B2 JP S6327749B2
Authority
JP
Japan
Prior art keywords
value
sampling
threshold
image signal
values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57194773A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5984522A (ja
Inventor
Tetsuzo Tanimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57194773A priority Critical patent/JPS5984522A/ja
Publication of JPS5984522A publication Critical patent/JPS5984522A/ja
Publication of JPS6327749B2 publication Critical patent/JPS6327749B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Control Of Position Or Direction (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Image Input (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
JP57194773A 1982-11-08 1982-11-08 画像信号2値化閾値設定方式 Granted JPS5984522A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57194773A JPS5984522A (ja) 1982-11-08 1982-11-08 画像信号2値化閾値設定方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57194773A JPS5984522A (ja) 1982-11-08 1982-11-08 画像信号2値化閾値設定方式

Publications (2)

Publication Number Publication Date
JPS5984522A JPS5984522A (ja) 1984-05-16
JPS6327749B2 true JPS6327749B2 (enrdf_load_stackoverflow) 1988-06-06

Family

ID=16330000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57194773A Granted JPS5984522A (ja) 1982-11-08 1982-11-08 画像信号2値化閾値設定方式

Country Status (1)

Country Link
JP (1) JPS5984522A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224133A (ja) * 1985-07-24 1987-02-02 Toshiba Corp 樹脂封止型半導体装置の外観検査方法
JPH0448392A (ja) * 1990-06-18 1992-02-18 Fujitsu Ltd バーコード読み取り装置

Also Published As

Publication number Publication date
JPS5984522A (ja) 1984-05-16

Similar Documents

Publication Publication Date Title
US4819197A (en) Peak detector and imaging system
EP0404952B1 (en) Automatic focusing system
JPH01191003A (ja) マーク位置検出装置およびマーク配置方法
JPS6327749B2 (enrdf_load_stackoverflow)
US6445811B1 (en) Fingerprint image processing device and fingerprint image processing method
JPS6093878A (ja) 画像読取装置
JPS6195203A (ja) 光切断線検出装置
JPH01189549A (ja) 硝子欠点検出装置
JPH09160997A (ja) バーコード検出方法およびバーコード検出装置
JPH05260263A (ja) 画像読み取り装置
JPH1185960A (ja) 画像情報読取装置
JP2569667B2 (ja) 画像読取装置
JPS59205677A (ja) 画像判別方法
JPS624851B2 (enrdf_load_stackoverflow)
JPH0232477A (ja) 画像情報補正方法及び装置
JPS63155868A (ja) 画像読取装置
JPS61251363A (ja) 画像読取り装置
JPH03246777A (ja) パターン認識装置
JP2003346076A (ja) 画像処置装置
JPS62115973A (ja) 画像処理装置
JPS59168765A (ja) 画像判別方法及び装置
JPH01177278A (ja) 画像読取装置
JPS63147283A (ja) パタ−ン検出方法
JPS6268368A (ja) 画像前処理装置
JPS59185609U (ja) 表面あらさ測定装置