JPS5984522A - 画像信号２値化閾値設定方式 - Google Patents

画像信号２値化閾値設定方式

Info

Publication number
JPS5984522A
JPS5984522A JP57194773A JP19477382A JPS5984522A JP S5984522 A JPS5984522 A JP S5984522A JP 57194773 A JP57194773 A JP 57194773A JP 19477382 A JP19477382 A JP 19477382A JP S5984522 A JPS5984522 A JP S5984522A
Authority
JP
Japan
Prior art keywords
value
sampling
image signal
alignment mark
threshold
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57194773A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6327749B2 (enrdf_load_stackoverflow
Inventor
Tetsuzo Tanimoto
谷本　哲三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57194773A priority Critical patent/JPS5984522A/ja
Publication of JPS5984522A publication Critical patent/JPS5984522A/ja
Publication of JPS6327749B2 publication Critical patent/JPS6327749B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Control Of Position Or Direction (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Image Input (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
JP57194773A 1982-11-08 1982-11-08 画像信号２値化閾値設定方式 Granted JPS5984522A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57194773A JPS5984522A (ja) 1982-11-08 1982-11-08 画像信号２値化閾値設定方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57194773A JPS5984522A (ja) 1982-11-08 1982-11-08 画像信号２値化閾値設定方式

Publications (2)

Publication Number Publication Date
JPS5984522A true JPS5984522A (ja) 1984-05-16
JPS6327749B2 JPS6327749B2 (enrdf_load_stackoverflow) 1988-06-06

Family

ID=16330000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57194773A Granted JPS5984522A (ja) 1982-11-08 1982-11-08 画像信号２値化閾値設定方式

Country Status (1)

Country Link
JP (1) JPS5984522A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224133A (ja) * 1985-07-24 1987-02-02 Toshiba Corp 樹脂封止型半導体装置の外観検査方法
US5302814A (en) * 1990-06-18 1994-04-12 Fujitsu Limited Bar code reading apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224133A (ja) * 1985-07-24 1987-02-02 Toshiba Corp 樹脂封止型半導体装置の外観検査方法
US5302814A (en) * 1990-06-18 1994-04-12 Fujitsu Limited Bar code reading apparatus

Also Published As

Publication number Publication date
JPS6327749B2 (enrdf_load_stackoverflow) 1988-06-06

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