JPS63187333U - - Google Patents
Info
- Publication number
- JPS63187333U JPS63187333U JP7900487U JP7900487U JPS63187333U JP S63187333 U JPS63187333 U JP S63187333U JP 7900487 U JP7900487 U JP 7900487U JP 7900487 U JP7900487 U JP 7900487U JP S63187333 U JPS63187333 U JP S63187333U
- Authority
- JP
- Japan
- Prior art keywords
- wiring pattern
- probe card
- circuits
- holes
- reducing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案による一実施例のプローブカー
ドの１／４を示す平面図、第２図は本考案による
一実施例のプローブカードの側断面図、第３図は
従来のプローブカードの側断面図、第４図は従来
のプローブカードの１／４を示す平面図、である
。
図において、１は基板、２は配線パターン、３
はプローブニードル、４はスルーホール、５は電
子部品、６は被測定素子、６ａはパツド、を示す
。
FIG. 1 is a plan view showing 1/4 of a probe card according to an embodiment of the present invention, FIG. 2 is a sectional side view of a probe card according to an embodiment of the present invention, and FIG. 3 is a side view of a conventional probe card. FIG. 4 is a sectional view, and FIG. 4 is a plan view showing 1/4 of a conventional probe card. In the figure, 1 is the board, 2 is the wiring pattern, 3
4 is a probe needle, 4 is a through hole, 5 is an electronic component, 6 is a device to be measured, and 6a is a pad.
Claims (1)
パターン１２の回路数を減少させることなく、前
記配線パターン１２よりも中心寄りに、スルーホ
ール４を有する独立した複数の配線パターン２を
追加して設けたことを特徴とするプローブカード
。 A plurality of independent wiring patterns 2 having through-holes 4 are additionally provided closer to the center than the wiring pattern 12 without reducing the number of circuits in the existing wiring pattern 12. A probe card characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7900487U JPS63187333U (en) | 1987-05-25 | 1987-05-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7900487U JPS63187333U (en) | 1987-05-25 | 1987-05-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63187333U true JPS63187333U (en) | 1988-11-30 |
Family
ID=30928466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7900487U Pending JPS63187333U (en) | 1987-05-25 | 1987-05-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63187333U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5878436A (en) * | 1981-11-05 | 1983-05-12 | Seiichiro Sogo | Assembled body of test probe |
| JPS6171367A (en) * | 1984-09-17 | 1986-04-12 | Hiyuuguru Electron Kk | Fixed probe card |
-
1987
- 1987-05-25 JP JP7900487U patent/JPS63187333U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5878436A (en) * | 1981-11-05 | 1983-05-12 | Seiichiro Sogo | Assembled body of test probe |
| JPS6171367A (en) * | 1984-09-17 | 1986-04-12 | Hiyuuguru Electron Kk | Fixed probe card |