JPS63154971A - Printed circuit board inspection jig - Google Patents

Printed circuit board inspection jig

Info

Publication number
JPS63154971A
JPS63154971A JP61302944A JP30294486A JPS63154971A JP S63154971 A JPS63154971 A JP S63154971A JP 61302944 A JP61302944 A JP 61302944A JP 30294486 A JP30294486 A JP 30294486A JP S63154971 A JPS63154971 A JP S63154971A
Authority
JP
Japan
Prior art keywords
circuit board
printed circuit
pin
inspection jig
board inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61302944A
Other languages
Japanese (ja)
Other versions
JPH0656401B2 (en
Inventor
Takanobu Tawara
田原 隆伸
Ryoji Azuma
東 良治
Shoichi Abe
正一 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP61302944A priority Critical patent/JPH0656401B2/en
Publication of JPS63154971A publication Critical patent/JPS63154971A/en
Publication of JPH0656401B2 publication Critical patent/JPH0656401B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE:To enable implementation of a test and measurement of even a circuit board with a contact formed at a small pitch, by making a pin body for a jig as a small-diameter section on the circuit board size thereof. CONSTITUTION:An inspection jig 15 has a plate inspector provided with a circuit board side member 19 which has a number of through holes 17a arranged at a pitch of a number of measuring pins 16 set at a specified pitch of 0.1 inch, for instance and through holes 19a formed corresponding to the position of a pin side plate member 17 and a contact 18a formed on a printed circuit board 18. Then, a pin 10 for a printed circuit board inspection jig provided on the jig 15 is arranged slantly between the through holes 17a and 19a and deflects mainly at the portion of a small-diameter section 11a. As a result, a measuring pin 16 is electrically connected to the contact 18a to perform a test and measurement of the circuit board 18.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、所定ピッチで配列された測定ピンを備えたプ
リント基板検査装置と、所定ピッチ以外のピッチで配列
された接点を有するプリント基板との電気的接続を行な
うプリント基板検査治具に関する。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention provides a printed circuit board inspection device equipped with measurement pins arranged at a predetermined pitch, and contacts arranged at a pitch other than the predetermined pitch. The present invention relates to a printed circuit board inspection jig that electrically connects to a printed circuit board having a.

(従来の技術) 従来、例えばIC等の接点は、0,1インチ(2,51
mn)の所定のピッチで形成されるよう規格化されてお
り、プリント基板の試@測定を行なうプリント基板検査
装置には、この所定ピッチで多数の測定ピンが配列され
ている。
(Prior Art) Conventionally, for example, the contact points of ICs, etc. have a diameter of 0.1 inch (2.51
The measurement pins are standardized to be formed at a predetermined pitch of mn), and a large number of measurement pins are arranged at this predetermined pitch in a printed circuit board inspection apparatus that performs test@measurement of printed circuit boards.

そして、このような所定ピンチ以外のピッチで接点を形
成されたプリント基板の試験測定を行なう場合は、例え
ば第5図に示すようなプリント基板検査治具を用いて試
験測定を行なっている。
When testing and measuring a printed circuit board in which contacts are formed at a pitch other than the predetermined pitch, for example, a printed circuit board inspection jig as shown in FIG. 5 is used to perform the test and measurement.

このようなプリント基板検査治具は、基板検査装置に0
.1インチの所定ピッチで多数配列された測定用ピン1
のピッチで配列された多数の透孔2aを有し、例えばア
クリル、ポリカーボネート等から構成されるピン側板部
材2と、ピン側板部材2の上方に配置され、プリント基
板3に形成された接点3aの位置に対応して形成されな
透孔4aを備え、例えばアクリル、ポリカーボネート等
から構成される基板側板部材4と、透孔2aおよび透孔
4aに挿入されるプリント基板検査治具用ピン5とから
構成されている。
This type of printed circuit board inspection jig is suitable for board inspection equipment.
.. Measuring pins 1 arranged in large numbers at a predetermined pitch of 1 inch
A pin side plate member 2 having a large number of through holes 2a arranged at a pitch of 2 and made of, for example, acrylic, polycarbonate, etc., and a contact point 3a disposed above the pin side plate member 2 and formed on a printed circuit board 3. A board side plate member 4 comprising through holes 4a formed corresponding to positions and made of, for example, acrylic, polycarbonate, etc., and pins 5 for a printed circuit board inspection jig inserted into the through holes 2a and the through holes 4a. It is configured.

なお、プリント基板検査治具用ピン5は、例えば長さ8
1.5mn、直径1.5511程度の一様な太さのピン
本体5aからなり、上端部に、先端に突起状のデーパ部
を有し例えば長さ2.511Im〜直径1 、9nn程
度の大径の基板側接続部5bを備え、反対側端部にテー
パ状に凹陥された測定ピン側接続部5cを備えな構成と
されている。
Note that the pin 5 for the printed circuit board inspection jig has a length of 8, for example.
It consists of a pin body 5a with a uniform thickness of about 1.5 mm and a diameter of about 1.5511 mm, and has a tapered part with a protrusion at the top end, and has a length of, for example, 2.511 mm to a diameter of about 1.9 mm. The measuring pin side connecting portion 5c is provided with a tapered recessed measuring pin side connecting portion 5c at the opposite end.

そして、プリント基板検査治具用ピン5は、基板側板部
材4の上方から透孔4aに挿入され、透孔2aに挿入さ
れる。このとき、大径の基板側接続部5bは、透孔4a
よつ大径とされており、例えばプリント基板検査治具を
持上げた時にこの基板側接続部5bが、基板側板部材4
上面に係止されて、プリント基板検査治具用ピン5の脱
落を防止している。
Then, the printed circuit board inspection jig pin 5 is inserted into the through hole 4a from above the board side plate member 4, and then into the through hole 2a. At this time, the large diameter board side connecting portion 5b is connected to the through hole 4a.
For example, when the printed circuit board inspection jig is lifted, this board side connection part 5b is connected to the board side plate member 4.
It is locked on the top surface to prevent the printed circuit board inspection jig pin 5 from falling off.

上記構成のプリント基板検査治具では、測定用ピン1の
ピッチと、プリント基板3に形成された接点3aのピッ
チとが異なる場合でも、測定用ピン1と接点3aとの間
にプリント基板検査治具用ピン5が斜めに配置されるこ
とにより、測定用ピン1と接点3aとの電気的接続を行
い、測定可能とするものである。また、プリント基板検
査治具用ピン5は、容易に脱着が可能とされ、種類の異
なるプリント基板3の測定を行なう場合は、接点3aに
対応した透孔4aを備えた基板側板部材4のみを交換す
ることによって測定することができるよう構成されてい
る。
In the printed circuit board inspection jig having the above configuration, even if the pitch of the measuring pins 1 and the pitch of the contacts 3a formed on the printed circuit board 3 are different, the printed circuit board inspection jig has a gap between the measuring pins 1 and the contacts 3a. By arranging the tool pin 5 diagonally, the measurement pin 1 and the contact point 3a are electrically connected to enable measurement. In addition, the pins 5 for the printed circuit board inspection jig can be easily attached and detached, and when measuring different types of printed circuit boards 3, only the board side plate member 4 equipped with the through hole 4a corresponding to the contact point 3a is used. It is constructed so that it can be measured by exchanging it.

(発明が解決しようとする問題点) しかしながら近年は、高集積化のため、基板に形成され
る接点のピッチは、所定の基準ピッチより小さなピッチ
で形成される場合が多い。上記説明の従来のプリント基
板検査治具では、プリント基板検査治具用ピンの基板側
の端部に、基板側接触部および基板側板状部材に対する
係止機構を兼ねた大径の基板側接続部が形成されている
ため、隣接するこれらの基板側接続部が接触し、所定の
基準ピンチより小さなピンチで接点を形成された基板の
測定に限界が生じ、例えばピン本体および基板側接続部
を小径化しても、1.27m1程度のピッチまでしか測
定することができないという問題がある。
(Problems to be Solved by the Invention) However, in recent years, due to higher integration, the pitch of contacts formed on a substrate is often smaller than a predetermined reference pitch. In the conventional printed circuit board inspection jig described above, the board side end of the pin for the printed circuit board inspection jig has a large-diameter board side connection portion that also serves as a board side contact portion and a locking mechanism for the board side plate member. Because these adjacent board-side connections come into contact, there is a limit to the measurement of boards where contacts are formed with a pinch smaller than the predetermined reference pinch.For example, if the pin body and board-side connection parts are However, there is a problem in that it is only possible to measure pitches up to about 1.27 m1.

本発明は、かかる従来の事情に対処してなされたもので
、例えば1.2711n未満の小さなピッチで接点を形
成された基板でも、試験測定を行なうことのできるプリ
ント基板検査治具を提供しようとするものである。
The present invention has been made in response to such conventional circumstances, and it is an object of the present invention to provide a printed circuit board inspection jig that can perform test measurements even on a board in which contacts are formed at a pitch as small as, for example, less than 1.2711 nm. It is something to do.

[発明の構成] (問題点を解決するための手段) すなわち本発明は、検査装置に所定ピッチで格子状に配
列された測定ピンと基板接点との電気的接続を行なうプ
リント基板検査治具において、前記測定ピンのピッチで
配列された多数の透孔を有する測定ピン側板状部材と、
基板の接点位置に対応して配列された透孔を有する基板
側板状部材と、前記基板側を小径部とされ前記測定ピン
側を大径部とされたピン本体および該ピン本体を前記ピ
ン側板状部材に着脱自在に係止する係止機構を有するプ
リント基板検査治具用ピンとを備えたことを特徴とする
[Structure of the Invention] (Means for Solving the Problems) That is, the present invention provides a printed circuit board inspection jig that electrically connects measurement pins arranged in a lattice shape at a predetermined pitch on an inspection device and circuit board contacts. a measuring pin side plate member having a large number of through holes arranged at the pitch of the measuring pins;
A board-side plate-like member having through holes arranged corresponding to the contact positions of the board, a pin body having a small diameter part on the board side and a large diameter part on the measurement pin side, and the pin body being connected to the pin side plate. The present invention is characterized by comprising a pin for a printed circuit board inspection jig having a locking mechanism that is detachably locked to the shaped member.

(作 用) 本発明のプリント基板検査治具では、プリント基板検査
治具用ピン本体の基板側が小径部とされ、大径な部位が
ないので、例えば、1.2711F未溝の小ピツチで接
点を形成された基板でも、隣接するプリント基板検査治
具用ピンが接触することがなく、試験測定を行なうこと
ができる。
(Function) In the printed circuit board inspection jig of the present invention, the substrate side of the pin body for the printed circuit board inspection jig has a small diameter portion, and there is no large diameter portion, so for example, the contact can be made with a small pitch of 1.2711F ungrooved. Tests and measurements can be carried out even on boards formed with the above-mentioned method, without the pins for adjacent printed circuit board inspection jigs coming into contact with each other.

(実施例) 以下本発明のプリント基板検査用治具を図面を参照して
一実施例について説明する。
(Example) An example of the printed circuit board inspection jig of the present invention will be described below with reference to the drawings.

第2図に示すプリント基板検査治具用ピン10は、例え
ばBeCu等からなり、表面に例えばNi、 Rh等の
メッキ処理が施されたピン本体11と、このピン本体1
1かられずかに突出する係止a楕12とから構成されて
いる。
The printed circuit board inspection jig pin 10 shown in FIG.
It consists of a locking a and an oval 12 that slightly protrude from the holder 1.

ピン本体11は、全長例えば82゜5111とされ、上
端から例えば42.51Il程度が直径例えば0.77
nrxの小径部11aとされ、下端から例えば21.5
mmが直径例えば1.55n+nの大径部11bとされ
、この間で小径部11aから大径部11bへ向けて徐々
に大径とされている。また、小径部11aの先端には、
例えば90度等のテーバ状に突出する基板側接続部11
cが形成されており、反対側の大径部11bの先端には
、外周部直径が例えば1.8II11とされ、内側に例
えば直径1.4ni、90度等のテーバ状に凹陥された
測定ピン側接続部lidが形成されている。
The pin body 11 has a total length of, for example, 82°5111, and a diameter of about 42.51Il from the upper end, for example, 0.77.
The small diameter portion 11a of the nrx is, for example, 21.5 mm from the lower end.
The large diameter portion 11b has a diameter of, for example, 1.55n+n, and the diameter gradually increases from the small diameter portion 11a to the large diameter portion 11b. Moreover, at the tip of the small diameter portion 11a,
For example, the board side connection part 11 protrudes in a tapered shape such as 90 degrees.
c is formed, and at the tip of the large diameter portion 11b on the opposite side, there is a measuring pin having an outer peripheral diameter of, for example, 1.8II11, and a measuring pin having a diameter of, for example, 1.4ni and a tapered recess of 90 degrees on the inside. A side connection portion lid is formed.

また、係止ta構12は、ピン本体11下端から例えば
10111の位置に幅3mlに渡って例えばローレット
加工によって形成された突出部から構成され、その外周
直径は、例えば1.771n程度とされている。
Further, the locking ta structure 12 is composed of a protrusion formed by knurling, for example, over a width of 3 ml at a position 10111 from the lower end of the pin body 11, and the outer diameter thereof is, for example, about 1.771n. There is.

上記構成のプリント基板検査治具用ピン10は、第1図
に示すプリント基板検査治具15に配置される。
The printed circuit board inspection jig pin 10 having the above configuration is placed in a printed circuit board inspection jig 15 shown in FIG.

プリント基板検査治具15は、板検査装置に0看インチ
の所定ピッチで多数配列された測定用ピン16のピッチ
で配列された多数の透孔17aを有し、例えばアクリル
、ポリカーボネート等がら構成されるピン側板部材17
と、ピン側板部材17の上方に配置され、プリント基板
18に形成された接点18aの位置に対応して形成され
た透孔19aを備え、例えばアクリル、ポリカーボネー
ト等から構成される基板側板部材19を備えている。な
お、透孔17aは一様に直径1.751nとされており
、透孔19aの直径は接点18aのピッチにより異なり
、少なくとも、プリント基板検査治具用ピン10が配置
される部分の透孔19aは、直径0.97inとされて
いる。
The printed circuit board inspection jig 15 has a large number of through holes 17a arranged at the pitch of the measuring pins 16 arranged at a predetermined pitch of 0 cm in the board inspection device, and is made of, for example, acrylic, polycarbonate, etc. Pin side plate member 17
The board side board member 19 is disposed above the pin side board member 17 and has a through hole 19a formed corresponding to the position of the contact point 18a formed on the printed circuit board 18, and is made of, for example, acrylic, polycarbonate, etc. We are prepared. The diameter of the through holes 17a is uniformly 1.751n, and the diameter of the through holes 19a varies depending on the pitch of the contacts 18a. has a diameter of 0.97 inches.

そして、プリント基板検査治具用ピン10は、ピン側板
部材17の下方から透孔17a内に挿入され、透孔17
aに対応する透孔19aに挿入される。この時、係止機
構12は、透孔17aよりわずかに突出しているため、
プリント基板検査治具用ピン10の下部を押圧すること
により透孔17aを貫通するように挿入され、挿入後は
、ピン側板部材17の上面に係止されて、プリント基板
検査治具用ピン1oのプリント基板検査治具15からの
脱落を防止する。また、同様にして上部から押圧するこ
とによって、プリント基板検査治具15から取り外すこ
とができる。
Then, the pin 10 for the printed circuit board inspection jig is inserted into the through hole 17a from below the pin side plate member 17.
It is inserted into the through hole 19a corresponding to a. At this time, since the locking mechanism 12 slightly protrudes from the through hole 17a,
By pressing the lower part of the printed circuit board inspection jig pin 10, it is inserted through the through hole 17a, and after insertion, it is locked on the upper surface of the pin side plate member 17 and the printed circuit board inspection jig pin 10 is inserted. from falling off from the printed circuit board inspection jig 15. Further, it can be removed from the printed circuit board inspection jig 15 by pressing from above in the same manner.

こうして、プリント基板検査治具15に配置されたプリ
ント基板検査治具用ピン10は、透孔17aと透孔19
aとの間に斜めに配置されるとともに、主に小径部11
aの部分で撓み、測定用ピン16と接点18aとの電気
的接続を行い、基板18の試験測定が行なわれる。
In this way, the printed circuit board inspection jig pins 10 arranged on the printed circuit board inspection jig 15 are connected to the through hole 17a and the through hole 19.
a, and mainly the small diameter portion 11.
The portion a is bent to establish electrical connection between the measurement pin 16 and the contact 18a, and test and measurement of the board 18 is performed.

上記構成のこの実施例のプリント基板検査治具15では
、基板側接続部に大径な部位がないため、例えば1.2
7nn未溝の少ピンチで接点18aを形成された基板1
8でも、隣接するプリント基板検査治具用ピン10が接
触することがなく、試験測定を行なうことができる。
In the printed circuit board inspection jig 15 of this embodiment having the above configuration, since there is no large diameter part in the board side connection part, for example, 1.2
Substrate 1 on which contacts 18a are formed with a small pinch without a 7nn groove
8, test measurements can be performed without the adjacent printed circuit board inspection jig pins 10 coming into contact with each other.

なお、第3図ないし第4図に示すように、測定ピン側接
続部lidを、外側部が先端部へ向けて小径とされ、内
側部がテーバ状に凹陥された形状とすることにより、測
定装置の測定ピン先端が、突出した形状とされたもので
も、凹陥された形状とされたものでも、どちらの形状の
ものにでも使。
As shown in Figs. 3 and 4, the measurement pin side connection part lid has a shape in which the outer part has a smaller diameter toward the tip and the inner part has a tapered recess. It can be used with both types of equipment, whether the measuring pin tip is protruding or recessed.

用することができる。また係止部12は、ローレット加
工により形成したが、例えばピン本体に清を形成し、こ
の溝にOリング等を配置して構成してもよい。
can be used. Further, although the locking portion 12 is formed by knurling, it may also be formed by forming a hole in the pin body and placing an O-ring or the like in this groove, for example.

[発明の効果コ 上述のように、本発明のプリント基板検査治具では、例
えば1.27iI1未満の小さなピッチで接点を形成さ
れた基板でも、試験測定を行なうことができる。
[Effects of the Invention] As described above, with the printed circuit board inspection jig of the present invention, it is possible to test and measure even a board in which contacts are formed at a pitch as small as, for example, less than 1.27iI1.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のプリント基板検査治具を示
す縦断面図、第2図はプリント基板検査治具用ピンを示
す側面図、第3図ないし第4図は第2図に示すプリント
基板検査治具用ピンの変型例の要部を示す側面図、第5
図は従来のプリント基板検査治具を示す縦断面図である
。 10・・・・・・プリント基板検査治具用ピン、11・
・・・・・ピン本体、lla・・・・・・小径部、ll
b・・・・・・大径部、12・・・・・・係止機構、1
う・・・・・・プリント基板検査治具、16・・・・・
・測定ピン、17・・・・・・ピン側板部材、17a・
・・・・・透孔、18・・・・・・プリント基板、18
a・・・・・・接点、19・・・・・・基板側板部材、
19a・・・・・・透孔。 出願人  東京エレクトロン株式会社 代理人 弁理士  須 山 佐 − 第1図 第□2図 菓5図 手続補正@(自発) 昭和 6゛咋11 1、事件の表示    メンーEo2フfr昭和61年
12月19日付差出の特許層(2)事件との関係・特許
出願人 東京エレクトロン株式会社 4、代理人 〒101 東京都千代田区神田多町2丁目1番地 5、補正の対象 明細書の発明の詳細な説明の欄および図面。 ′6.補正の内容 (1)明細書筒7頁20行目「形成された突出部から構
成され、」を[形成され、6本〜10本程度の縦方向の
溝を有する突出部から構成され、」と補正する。 (2)図面の第2図を別紙の通り補正する。 以上 1b 1C 」1 L・
FIG. 1 is a longitudinal sectional view showing a printed circuit board inspection jig according to an embodiment of the present invention, FIG. 2 is a side view showing pins for the printed circuit board inspection jig, and FIGS. 3 and 4 are as shown in FIG. 5 is a side view showing main parts of the modified example of the pin for the printed circuit board inspection jig shown in FIG.
The figure is a vertical cross-sectional view showing a conventional printed circuit board inspection jig. 10...Pin for printed circuit board inspection jig, 11.
...Pin body, lla...Small diameter part, ll
b... Large diameter part, 12... Locking mechanism, 1
U...Printed circuit board inspection jig, 16...
・Measuring pin, 17...Pin side plate member, 17a・
...Through hole, 18...Printed circuit board, 18
a...Contact, 19...Board side plate member,
19a...Through hole. Applicant Tokyo Electron Co., Ltd. Agent Patent Attorney Satoshi Suyama - Figure 1 Figure □ 2 Figure 5 Procedure amendment @ (voluntary) Showa 6, 11 1. Indication of the case Men - Eo 2 fr December 19, 1985 Patent layer of date submission (2) Relationship with the case Patent applicant Tokyo Electron Ltd. 4, Agent 2-1-5 Kanda Tamachi, Chiyoda-ku, Tokyo 101 Detailed explanation of the invention in the specification subject to amendment columns and drawings. '6. Contents of the amendment (1) On page 7, line 20 of the specification cylinder, "consisting of a formed protrusion" was changed to "consisting of a protrusion formed and having about 6 to 10 vertical grooves" and correct it. (2) Figure 2 of the drawings shall be corrected as shown in the attached sheet. Above 1b 1C” 1 L・

Claims (3)

【特許請求の範囲】[Claims] (1)検査装置に所定ピッチで格子状に配列された測定
ピンと基板接点との電気的接続を行なうプリント基板検
査治具において、前記測定ピンのピッチで配列された多
数の透孔を有する測定ピン側板状部材と、基板の接点位
置に対応して配列された透孔を有する基板側板状部材と
、前記基板側を小径部とされ前記測定ピン側を大径部と
されたピン本体および該ピン本体を前記ピン側板状部材
に着脱自在に係止する係止機構を有するプリント基板検
査治具用ピンとを備えたことを特徴とするプリント基板
検査治具。
(1) In a printed circuit board inspection jig that electrically connects measurement pins arranged in a lattice pattern at a predetermined pitch to a board contact in an inspection device, the measurement pin has a large number of through holes arranged at the pitch of the measurement pins. a side plate-like member; a board-side plate-like member having through holes arranged corresponding to contact positions on the board; a pin body having a small diameter portion on the board side and a large diameter portion on the measurement pin side; and the pin. A printed circuit board inspection jig comprising: a pin for a printed circuit board inspection jig having a locking mechanism for removably locking the main body to the pin-side plate member.
(2)ピン本体は、小径部から大径部へ向けて徐々に大
径とされた特許請求の範囲第1項記載のプリント基板検
査治具。
(2) The printed circuit board inspection jig according to claim 1, wherein the pin body has a diameter that gradually increases from the small diameter portion to the large diameter portion.
(3)大径部先端は、外側部が先端部へ向けて小径とさ
れ、内側部がテーパ状に凹陥された形状である特許請求
の範囲第1項記載のプリント基板検査治具。
(3) The printed circuit board inspection jig according to claim 1, wherein the tip of the large diameter portion has a shape in which the outside portion becomes smaller in diameter toward the tip, and the inside portion is concave in a tapered shape.
JP61302944A 1986-12-19 1986-12-19 Inspection equipment Expired - Lifetime JPH0656401B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61302944A JPH0656401B2 (en) 1986-12-19 1986-12-19 Inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61302944A JPH0656401B2 (en) 1986-12-19 1986-12-19 Inspection equipment

Publications (2)

Publication Number Publication Date
JPS63154971A true JPS63154971A (en) 1988-06-28
JPH0656401B2 JPH0656401B2 (en) 1994-07-27

Family

ID=17915019

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61302944A Expired - Lifetime JPH0656401B2 (en) 1986-12-19 1986-12-19 Inspection equipment

Country Status (1)

Country Link
JP (1) JPH0656401B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10260233A (en) * 1997-03-17 1998-09-29 Micronics Japan Co Ltd Head for inspecting flat plate-like body
JP2002090410A (en) * 2000-09-13 2002-03-27 Nidec-Read Corp Checking fixture for board inspection and board inspection apparatus with checking fixture
JP2003507744A (en) * 1999-08-23 2003-02-25 アーテーゲー、テスト、ジステムス、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング、ウント、コンパニー、コマンディット、ゲゼルシャフト Test needle for pattern adapter of circuit board tester
WO2007132739A1 (en) * 2006-05-15 2007-11-22 Nidec-Read Corporation Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6182173A (en) * 1984-06-11 1986-04-25 ト−マス・ジヨンソン・ブラツク Setter of probe for testing printed wiring board
JPS61190867U (en) * 1985-05-20 1986-11-27

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6182173A (en) * 1984-06-11 1986-04-25 ト−マス・ジヨンソン・ブラツク Setter of probe for testing printed wiring board
JPS61190867U (en) * 1985-05-20 1986-11-27

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10260233A (en) * 1997-03-17 1998-09-29 Micronics Japan Co Ltd Head for inspecting flat plate-like body
JP2003507744A (en) * 1999-08-23 2003-02-25 アーテーゲー、テスト、ジステムス、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング、ウント、コンパニー、コマンディット、ゲゼルシャフト Test needle for pattern adapter of circuit board tester
JP2002090410A (en) * 2000-09-13 2002-03-27 Nidec-Read Corp Checking fixture for board inspection and board inspection apparatus with checking fixture
WO2007132739A1 (en) * 2006-05-15 2007-11-22 Nidec-Read Corporation Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig

Also Published As

Publication number Publication date
JPH0656401B2 (en) 1994-07-27

Similar Documents

Publication Publication Date Title
US6160412A (en) Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment
CN110501538B (en) Inspection jig, inspection device, and method for manufacturing probe
JPS63154971A (en) Printed circuit board inspection jig
JPH01143977A (en) Adaptor for electronic inspector of printed circuit board
JP3099873B2 (en) Method of using printed board inspection apparatus and universal type printed board inspection apparatus
JPH05126851A (en) Inspecting apparatus of semiconductor device
JP2585597B2 (en) Circuit board inspection equipment
JPS63243768A (en) Electrical connection apparatus to conductive pattern
JP3042035B2 (en) Circuit board inspection equipment
JPH0729838U (en) Vertical motion probe card with buckling stress reduction mechanism
KR102683853B1 (en) Jig for inspecting socket
JPS63265180A (en) Inspection jig of printed circuit board
JPS6267469A (en) Adaptor for printed wiring board inspecting machine
JPH0361587U (en)
KR20240025311A (en) Jig for inspecting socket
JPS6042661A (en) Positioning device for inspecting printed wiring board
JPH0726715Y2 (en) TAB product selection jig
JPS63265179A (en) Pin for inspection jig of printed circuit board
JPH0340940B2 (en)
JPH04252964A (en) Tester head
JPH054035B2 (en)
JPH08292225A (en) Structure of probe pin connector
KR20120012511A (en) Apparatus for inspecting a hi-fix board
JPH01141093A (en) Mask for printing
JPS59155763A (en) Probe for electronic circuit