JPS61190867U - - Google Patents
Info
- Publication number
- JPS61190867U JPS61190867U JP7462585U JP7462585U JPS61190867U JP S61190867 U JPS61190867 U JP S61190867U JP 7462585 U JP7462585 U JP 7462585U JP 7462585 U JP7462585 U JP 7462585U JP S61190867 U JPS61190867 U JP S61190867U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- printed circuit
- conductive material
- circuit board
- probe according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 11
- 239000004020 conductor Substances 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 1
- 238000009413 insulation Methods 0.000 claims 1
- 229910000679 solder Inorganic materials 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第1図は、本考案のプローブの一実施例を示す
正面図であり、第2図は、本考案のプローブの他
の実施例を示す正面図であり、第3図は、本考案
のプローブの使用形態の一例を示す説明図であり
、第4図は、従来のプローブの欠点を示す説明図
である。
1……平頭プローブ、4……針型プローブ、5
,8……先端部、6,7……軟質の導電物質、9
……オフグリツド基板。
FIG. 1 is a front view showing one embodiment of the probe of the present invention, FIG. 2 is a front view showing another embodiment of the probe of the present invention, and FIG. 3 is a front view of the probe of the present invention. FIG. 4 is an explanatory diagram showing an example of how the probe is used, and FIG. 4 is an explanatory diagram showing the drawbacks of the conventional probe. 1...Flat head probe, 4...Needle probe, 5
, 8...Tip, 6, 7...Soft conductive material, 9
...Off-grid board.
Claims (1)
縁状態を検査する布線検査機用プローブであつて
、先端接触部分に軟質の導電性材料を被覆したこ
とを特徴とするプローブ。 (2) 印刷回路板がオフグリツド基板である実用
新案登録請求の範囲第1項記載のプローブ。 (3) 軟質の導電性材料が、半田または導電性ゴ
ムである実用新案登録請求の範囲第1項記載のプ
ローブ。[Claims for Utility Model Registration] (1) A probe for a wiring inspection machine that inspects the electrical continuity and insulation state of the wiring layer of a printed circuit board, the tip contact portion of which is coated with a soft conductive material. A probe featuring: (2) The probe according to claim 1, wherein the printed circuit board is an off-grid board. (3) The probe according to claim 1, wherein the soft conductive material is solder or conductive rubber.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7462585U JPS61190867U (en) | 1985-05-20 | 1985-05-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7462585U JPS61190867U (en) | 1985-05-20 | 1985-05-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61190867U true JPS61190867U (en) | 1986-11-27 |
Family
ID=30615096
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7462585U Pending JPS61190867U (en) | 1985-05-20 | 1985-05-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61190867U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6388765U (en) * | 1986-11-29 | 1988-06-09 | ||
JPS63154971A (en) * | 1986-12-19 | 1988-06-28 | Tokyo Electron Ltd | Printed circuit board inspection jig |
-
1985
- 1985-05-20 JP JP7462585U patent/JPS61190867U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6388765U (en) * | 1986-11-29 | 1988-06-09 | ||
JPS63154971A (en) * | 1986-12-19 | 1988-06-28 | Tokyo Electron Ltd | Printed circuit board inspection jig |
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