JPS63265180A - Inspection jig of printed circuit board - Google Patents

Inspection jig of printed circuit board

Info

Publication number
JPS63265180A
JPS63265180A JP62100752A JP10075287A JPS63265180A JP S63265180 A JPS63265180 A JP S63265180A JP 62100752 A JP62100752 A JP 62100752A JP 10075287 A JP10075287 A JP 10075287A JP S63265180 A JPS63265180 A JP S63265180A
Authority
JP
Japan
Prior art keywords
printed circuit
circuit board
pitch
board
pins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62100752A
Other languages
Japanese (ja)
Other versions
JP2759451B2 (en
Inventor
Jun Goto
潤 後藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP62100752A priority Critical patent/JP2759451B2/en
Publication of JPS63265180A publication Critical patent/JPS63265180A/en
Application granted granted Critical
Publication of JP2759451B2 publication Critical patent/JP2759451B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To test and measure even a printed circuit board having contacts at a pitch smaller than a reference pitch, by inserting an adapter pin in the through-hole of a top board from below and connecting a flexible conductor to the lower part of said pin. CONSTITUTION:Adaptor pins 16 are inserted in the through-holes 13a of a top board 13 from below to be engaged therewith. One ends of flexible conductors 18 are connected to the lower parts of the adaptor pins 16 and a connector 17 is connected to the other ends of the flexible conductors 18. The connector 17 is engaged with the pins 11b of a bottom board 11. In this state, a printed circuit board 30 is arranged on the adaptor pins 16 and the adaptor pins 16 are brought into contact with the contacts 31 while the contacts 31 are electrically connected to probe pins 21.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野、) 本発明は、検査装置のプローブピンと基板接点との電気
的接続を行うプリント基板検査治具に係わり、特に検査
装置と、所定ピッチ以外のピッチで配列された接点を有
するプリント基板との電気的接続に好適なプリント基板
検査治具に関する。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention relates to a printed circuit board inspection jig that electrically connects the probe pins of an inspection device and a board contact, and is particularly applicable to an inspection device and , relates to a printed circuit board inspection jig suitable for electrical connection with a printed circuit board having contacts arranged at a pitch other than a predetermined pitch.

(従来の技術) 従来、例えばIC等の接点は、0.1インチ(2,54
11n+)の所定のピッチで形成されるよう規格化され
ており、プリント基板の試験測定を行うプリント基板検
査装置には、この所定ピッチで多数の10−ブピンが配
列されている。
(Prior art) Conventionally, for example, the contact points of ICs, etc. have a diameter of 0.1 inch (2,54
The 10-pins are standardized to be formed at a predetermined pitch of 11n+), and a large number of 10-pins are arranged at this predetermined pitch in a printed circuit board inspection apparatus that tests and measures printed circuit boards.

そして、このような所定ピッチ以外のピッチで接点を形
成されたプリント基板の試験測定を行う場合は、例えば
第3図に示すようなプリント基板検査治具を用いて試験
測定を行っている。
When testing and measuring a printed circuit board in which contacts are formed at a pitch other than the predetermined pitch, for example, a printed circuit board inspection jig as shown in FIG. 3 is used to perform the test and measurement.

すなわち、0.1インチの所定ピッチで多数配列された
プローブピン21を備えた検査装置20上に載置される
ボトムボード1は、材質例えばアクリル、ポリカーボネ
ート等から構成されており、上記プローブピン21と同
ピツチで多数の透孔1aが形成されている。
That is, the bottom board 1 placed on the inspection device 20 is equipped with a large number of probe pins 21 arranged at a predetermined pitch of 0.1 inch, and is made of a material such as acrylic or polycarbonate. A large number of through holes 1a are formed at the same pitch.

ボトムボード1の上部には、複数の支柱2によって支持
されたトップボード3が配置されている。
A top board 3 supported by a plurality of pillars 2 is arranged above the bottom board 1.

このトップボード3は、材質例えばアクリル、ポリカー
ボネート等から構成されており、プリント基板30に形
成された接点31の位置に対応して、複数の透孔3aが
形成されている。
The top board 3 is made of a material such as acrylic or polycarbonate, and has a plurality of through holes 3a formed therein corresponding to the positions of the contacts 31 formed on the printed circuit board 30.

そして、トップボード3の透孔3aと、ボトムボード1
の透孔1aとの間には、コンタクトビン4が配置され、
検査装rIt20のプローブビン21と、プリント基板
30の接点31との電気的接続を行い測定を行う。
Then, the through hole 3a of the top board 3 and the bottom board 1
A contact bottle 4 is arranged between the through hole 1a and the through hole 1a.
The probe bin 21 of the inspection device rIt20 and the contact point 31 of the printed circuit board 30 are electrically connected to perform measurement.

上記構成のプリント基板検査治具では、プローブビン2
1のピッチと、接点31のピッチとが異なる場合でも、
プローブビン21と接点31との間にコンタクトビン4
が斜めに配置されることにより、プローブピン21と接
点31との電気的接続を行い、測定可能とするものであ
る。また、コンタクトピン4は、容易に脱着が可能とさ
れ、種類の異なるプリント基板30の測定を行なう場合
は、接点31に対応した透孔3aを備えたトップボード
3のみを交換することによって測定することができるよ
う構成されている。
In the printed circuit board inspection jig with the above configuration, the probe bin 2
Even if the pitch of 1 and the pitch of contact 31 are different,
A contact bin 4 is installed between the probe bin 21 and the contact 31.
By arranging them diagonally, the probe pins 21 and the contacts 31 are electrically connected to enable measurement. Further, the contact pins 4 can be easily attached and detached, and when measuring a different type of printed circuit board 30, the measurement can be made by replacing only the top board 3, which is provided with the through holes 3a corresponding to the contacts 31. It is configured so that it can be done.

(発明が解決しようとする問題点) しかしながら近年は、高集積化のため、基板に形成され
る接点のピッチは、所定の基準ピッチより小さなピッチ
で形成される場合が多い、上記説明の従来のプリント基
板検査治具では、所定の基準ピッチと異なるピッチ、例
えば所定の基準ピッチより小さなピッチで多数の接点を
連続して形成された基板等の場合、コンタクトピンを配
置することが困難となり、測定を行うことができないと
いう問題がある。
(Problem to be Solved by the Invention) However, in recent years, due to high integration, the pitch of contacts formed on a substrate is often smaller than a predetermined standard pitch. When using printed circuit board inspection jigs, it becomes difficult to place contact pins in the case of a board on which a large number of contacts are successively formed at a pitch different from a predetermined standard pitch, for example, a pitch smaller than the predetermined standard pitch, making it difficult to measure. The problem is that it cannot be done.

本発明は、かかる従来の事情に対処してなされたもので
、所定の基準ピッチと興なるピッチ、例えば所定の基準
ピッチより小さなピッチで多数の接点を連続して形成さ
れた基板等でも、試験測定を行うことができ、かつ、ト
ップボードのみを交換することによって多種類のプリン
ト基板の測定を行うことのできるプリント基板検査治具
を提供しようとするものである。
The present invention has been made in response to such conventional circumstances, and it is possible to conduct tests even on a board, etc., in which a large number of contacts are successively formed at a pitch different from a predetermined reference pitch, for example, a pitch smaller than a predetermined reference pitch. It is an object of the present invention to provide a printed circuit board inspection jig that can perform measurements and that can measure many types of printed circuit boards by replacing only the top board.

[発明の構成コ (問題点を解決するための手段) すなわち本発明は、検査装置のプローブピンのピッチで
配列された多数の透孔を有するボトムボードと、プリン
ト基板の接点位置に対応して配列された透孔を有するト
ップボードとを備え、前記検査装置のプローブビンとプ
リント基板接点との電気的接続を行うプリント基板検査
治具において、前記トップボードの透孔に下方から挿入
され該トップボードの上部に突出した状態で係止される
アダプタピンおよびこのアダプタピンの下部に接続され
たフレキシブル導体を介して、少なくとも一部の前記プ
ローブピンとプリント基板接点とを電気的に接続したこ
とを特徴とする。
[Configuration of the Invention (Means for Solving Problems) In other words, the present invention has a bottom board having a large number of through holes arranged at the pitch of probe pins of an inspection device, and a bottom board that corresponds to the contact positions of a printed circuit board. A printed circuit board inspection jig comprising a top board having arranged through holes and electrically connecting probe bins of the inspection device and printed circuit board contacts, the top board being inserted into the through holes of the top board from below. At least some of the probe pins and printed circuit board contacts are electrically connected via an adapter pin that is protruded from the top of the board and a flexible conductor that is connected to the bottom of the adapter pin. shall be.

(作 用) 本発明のプリント基板検査治具では、所定の基準ピッチ
と異なるピッチ、例えば所定の基準ピッチより小さなピ
ッチで多数連続して形成された接点等は、上記アダプタ
ピンおよびフレキシブル導体を介して電気的に接続し、
試験測定を行うことができる。また、従来と同様にトッ
プボードのみを交換することによって多種類のプリント
基板の測定も行うことができる。
(Function) In the printed circuit board inspection jig of the present invention, a large number of consecutively formed contacts at a pitch different from a predetermined reference pitch, for example, a pitch smaller than a predetermined reference pitch, are connected via the adapter pin and flexible conductor. electrically connect,
Test measurements can be taken. Furthermore, as in the past, by replacing only the top board, it is possible to measure many types of printed circuit boards.

(実施例) 以下本発明のプリント基板検査治具を、第1図および第
2図を参照して実施例について説明する。
(Example) Hereinafter, an example of the printed circuit board inspection jig of the present invention will be described with reference to FIGS. 1 and 2.

0.1インチの所定ピッチで多数配列されたプローブビ
ン21を備えた検査装置20上に載置されるボトムボー
ド11は、材質例えばアクリル、ボ′リカーボネート等
から構成されており、上記プローブピン21と同ピツチ
で多数の透孔11aが形成されている。また、例えばボ
トムボード11の上面端部には、下端が上記プローブピ
ン21に接触される複数のピンllbが植設されている
The bottom board 11 placed on the inspection device 20 is equipped with a large number of probe bins 21 arranged at a predetermined pitch of 0.1 inch, and is made of a material such as acrylic or polycarbonate. A large number of through holes 11a are formed at the same pitch as 21. Further, for example, a plurality of pins llb are implanted at the upper end of the bottom board 11, the lower ends of which are in contact with the probe pins 21.

ボトムボード11の上部には、複数の支柱12によって
支持されたトップボード13が配置されている。このト
ップボード13は、材質例えばアクリル、ポリカーボネ
ート等から構成されており、プリント基板30に形成さ
れた接点31の位置に対応して、複数の透孔13aが形
成されている。
A top board 13 supported by a plurality of pillars 12 is arranged above the bottom board 11. The top board 13 is made of a material such as acrylic or polycarbonate, and has a plurality of through holes 13a formed in correspondence with the positions of the contacts 31 formed on the printed circuit board 30.

トップボード13の透孔13aが、0.1インチの所定
ピッチで配列された部位には、前述の従来のプリント基
板検査治具と同様にコンタクトピン14が配置されてい
る。
Contact pins 14 are arranged in the areas where the through holes 13a of the top board 13 are arranged at a predetermined pitch of 0.1 inch, as in the conventional printed circuit board inspection jig described above.

そして、トップボード13の透孔13aが、0.1イン
チの所定ピッチより小ピツチで配列された部位には、ア
ダプタ15のアダプタピン16が挿入されている。
Adapter pins 16 of the adapter 15 are inserted into areas where the through holes 13a of the top board 13 are arranged at a pitch smaller than a predetermined pitch of 0.1 inch.

このアダプタ15は、複数のアダプタピン16と、コネ
クタ17と、このコネクタ17と複数のアダプタピン1
6とをそれぞれ電気的に接続する複数のフレキシブル導
体18とから構成されている。なお、コネクタ17は、
ボトムボード11のビンllb上部に嵌合され、フレキ
シブル導体18とビンllbとをそれぞれ電気的に接続
する。
This adapter 15 includes a plurality of adapter pins 16 , a connector 17 , and a plurality of adapter pins 1 and 1 .
6 and a plurality of flexible conductors 18 that electrically connect the conductors 6 and 6, respectively. Note that the connector 17 is
The flexible conductor 18 is fitted onto the upper part of the bottle Ilb of the bottom board 11, and electrically connects the flexible conductor 18 and the bottle Ilb.

また、アダプタピン16は、第2図に示すように構成さ
れている。
Further, the adapter pin 16 is configured as shown in FIG.

すなわち、中空円筒状の筒状部材16a内にはコイルス
プリング16bが配置されている。また、筒状部材16
a一端の開口には、ビン本体16cが挿入されている。
That is, a coil spring 16b is arranged within a hollow cylindrical cylindrical member 16a. In addition, the cylindrical member 16
A bottle main body 16c is inserted into the opening at one end of the bottle a.

このビン本体16cは、側面に凸部16dが形成されて
おり、この凸部16dにより開口の端部に係止され、コ
イルスプリング16bによって図示矢印方向に付勢され
ている。
This bottle main body 16c has a protrusion 16d formed on its side surface, is engaged with the end of the opening by the protrusion 16d, and is biased in the direction of the arrow shown in the figure by a coil spring 16b.

そして、筒状部材16aの下側端部には、フレキシブル
導体18の一端が接続され、このフレキシブル導体18
とビン本体16cとは、コイルスプリング16bを介し
て電気的に接続されている。
One end of a flexible conductor 18 is connected to the lower end of the cylindrical member 16a.
and the bottle main body 16c are electrically connected via a coil spring 16b.

また、筒状部材16aには、筒状部材16a側面に突出
する凸部を形成する弾性部材16eが配設されている。
Further, the cylindrical member 16a is provided with an elastic member 16e that forms a convex portion projecting from the side surface of the cylindrical member 16a.

そして、アダプタピン16は、弾性部材16eが変形す
ることにより、トップボード13の透孔13aに下側か
ら押圧挿入、引き抜き可能とされるとともに、弾性部材
16eによって透孔13a内の段差部13b上面に係止
される。
By deforming the elastic member 16e, the adapter pin 16 can be press-inserted into and pulled out from below into the through-hole 13a of the top board 13, and the elastic member 16e allows the upper surface of the stepped portion 13b inside the through-hole 13a to be inserted into and pulled out from below. is locked.

上記構成のこの実施例のプリント基板検査治具では、プ
リント基板30に0.1インチの所定ピッチより小ピツ
チで配列された接点31と、検査装置20のプローブビ
ン21との電気的接続を、アダプタ15によって行う、
すなわち、アダプタピン16をトップボード13の透孔
13aに下方から挿入して係止させ、コネクタ17をボ
トムボード11のピンllbに嵌合させる。この状態で
アダプタピン16上部にプリント基板30を配置し、ア
ダプタピン16と接点31とを接触させ、接点31とプ
ローブビン21とを電気的に接続する。
In the printed circuit board inspection jig of this embodiment with the above configuration, the electrical connection between the contacts 31 arranged on the printed circuit board 30 at a pitch smaller than a predetermined pitch of 0.1 inch and the probe bin 21 of the inspection device 20 is made. performed by the adapter 15,
That is, the adapter pin 16 is inserted into the through hole 13a of the top board 13 from below and locked therein, and the connector 17 is fitted into the pin llb of the bottom board 11. In this state, the printed circuit board 30 is placed above the adapter pin 16, the adapter pin 16 and the contact 31 are brought into contact, and the contact 31 and the probe bin 21 are electrically connected.

したがって、小ピツチで配列された接点31が連続して
多数配置されたプリント基板30でも測定を行うことが
できる。また、アダプタ15のアダプタピン16は、容
易に脱着を行えるので、上述の接点31のピッチおよび
位置が異なる場合でも、トップボード13のみを交換す
るだけで、多種類のプリント基板30の測定を行うこと
ができる。
Therefore, it is possible to perform measurements even on a printed circuit board 30 in which a large number of contacts 31 arranged in small pitches are successively arranged. Furthermore, since the adapter pins 16 of the adapter 15 can be easily attached and detached, even if the pitch and position of the contacts 31 mentioned above are different, it is possible to measure many types of printed circuit boards 30 by simply replacing the top board 13. be able to.

[発明の効果] 上述のように、本発明のプリント基板検査治具では、所
定の基準ピッチと異なるピッチ、例えば所定の基準ピッ
チより小さなピッチで多数の接点を連続して形成された
基板等でも、試験測定を行うことができ、かつ、トップ
ボードのみを交換することによって多種類のプリント基
板の測定を行うことができる。
[Effects of the Invention] As described above, the printed circuit board inspection jig of the present invention can inspect even substrates in which a large number of contacts are successively formed at a pitch different from a predetermined reference pitch, for example, a pitch smaller than a predetermined reference pitch. , test measurements can be performed, and measurements can be made on many types of printed circuit boards by replacing only the top board.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のプリント基板検査治具を示
す側面図、第2図は第1図の要部を示す側面図、第3図
は従来のプリント基板検査治具を示す側面図である。 11・・・・・・ボトムボード、lla・・・・・・透
孔、13・・・・・・トップボード、13a・旧・・透
孔、14・・・・・・コンタクトビン、16・・・・・
・アダプタピン、17・・・・・・コネクタ、18・・
・・・・フレキシブル導体、2o・旧・・測定装置、2
1・・・・・・プローブビン、30・・・・・・プリン
ト基板、31・・・・・・接点。 出願人  東京エレクトロン株式会社 代理人 弁理士  須 山 佐 − 第1図 第2図
Fig. 1 is a side view showing a printed circuit board inspection jig according to an embodiment of the present invention, Fig. 2 is a side view showing the main parts of Fig. 1, and Fig. 3 is a side view showing a conventional printed circuit board inspection jig. It is a diagram. 11...Bottom board, lla...Through hole, 13...Top board, 13a, old...Through hole, 14...Contact bin, 16...・・・・・・
・Adapter pin, 17...Connector, 18...
...Flexible conductor, 2o, old...Measuring device, 2
1...Probe bin, 30...Printed circuit board, 31...Contact. Applicant Tokyo Electron Co., Ltd. Agent Patent Attorney Sasa Suyama - Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] (1)検査装置のプローブピンのピッチで配列された多
数の透孔を有するボトムボードと、プリント基板の接点
位置に対応して配列された透孔を有するトップボードと
を備え、前記検査装置のプローブピンとプリント基板接
点との電気的接続を行うプリント基板検査治具において
、前記トップボードの透孔に下方から挿入され該トップ
ボードの上部に突出した状態で係止されるアダプタピン
およびこのアダプタピンの下部に接続されたフレキシブ
ル導体を介して、少なくとも一部の前記プローブピンと
プリント基板接点とを電気的に接続したことを特徴とす
るプリント基板検査治具。
(1) The inspection device includes a bottom board having a large number of through holes arranged at the pitch of the probe pins of the inspection device, and a top board having through holes arranged corresponding to the contact positions of the printed circuit board. In a printed circuit board inspection jig that electrically connects probe pins and printed circuit board contacts, an adapter pin that is inserted from below into a through hole of the top board and is locked in a protruding state at the top of the top board, and this adapter pin A printed circuit board inspection jig, characterized in that at least some of the probe pins and printed circuit board contacts are electrically connected via a flexible conductor connected to a lower part of the probe pin.
JP62100752A 1987-04-23 1987-04-23 Printed circuit board inspection jig Expired - Lifetime JP2759451B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62100752A JP2759451B2 (en) 1987-04-23 1987-04-23 Printed circuit board inspection jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62100752A JP2759451B2 (en) 1987-04-23 1987-04-23 Printed circuit board inspection jig

Publications (2)

Publication Number Publication Date
JPS63265180A true JPS63265180A (en) 1988-11-01
JP2759451B2 JP2759451B2 (en) 1998-05-28

Family

ID=14282253

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62100752A Expired - Lifetime JP2759451B2 (en) 1987-04-23 1987-04-23 Printed circuit board inspection jig

Country Status (1)

Country Link
JP (1) JP2759451B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02248876A (en) * 1989-03-23 1990-10-04 Terenikusu:Kk Superadaptor for testing printed board

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6267469A (en) * 1985-09-20 1987-03-27 Kyoei Sangyo Kk Adaptor for printed wiring board inspecting machine

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6267469A (en) * 1985-09-20 1987-03-27 Kyoei Sangyo Kk Adaptor for printed wiring board inspecting machine

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02248876A (en) * 1989-03-23 1990-10-04 Terenikusu:Kk Superadaptor for testing printed board

Also Published As

Publication number Publication date
JP2759451B2 (en) 1998-05-28

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