JPS63133048A - 表面検査装置の処理回路 - Google Patents

表面検査装置の処理回路

Info

Publication number
JPS63133048A
JPS63133048A JP27881686A JP27881686A JPS63133048A JP S63133048 A JPS63133048 A JP S63133048A JP 27881686 A JP27881686 A JP 27881686A JP 27881686 A JP27881686 A JP 27881686A JP S63133048 A JPS63133048 A JP S63133048A
Authority
JP
Japan
Prior art keywords
signal
binary
lane
circuit
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP27881686A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0562942B2 (enrdf_load_stackoverflow
Inventor
Norihiro Nakai
中井 教尋
Ippei Takahashi
一平 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP27881686A priority Critical patent/JPS63133048A/ja
Publication of JPS63133048A publication Critical patent/JPS63133048A/ja
Publication of JPH0562942B2 publication Critical patent/JPH0562942B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP27881686A 1986-11-25 1986-11-25 表面検査装置の処理回路 Granted JPS63133048A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27881686A JPS63133048A (ja) 1986-11-25 1986-11-25 表面検査装置の処理回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27881686A JPS63133048A (ja) 1986-11-25 1986-11-25 表面検査装置の処理回路

Publications (2)

Publication Number Publication Date
JPS63133048A true JPS63133048A (ja) 1988-06-04
JPH0562942B2 JPH0562942B2 (enrdf_load_stackoverflow) 1993-09-09

Family

ID=17602553

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27881686A Granted JPS63133048A (ja) 1986-11-25 1986-11-25 表面検査装置の処理回路

Country Status (1)

Country Link
JP (1) JPS63133048A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005290623A (ja) * 2004-03-31 2005-10-20 Arisawa Mfg Co Ltd 開口率測定装置
KR101294218B1 (ko) * 2010-05-10 2013-08-07 동우 화인켐 주식회사 편광 필름 원반의 품질 판정 시스템 및 방법

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005290623A (ja) * 2004-03-31 2005-10-20 Arisawa Mfg Co Ltd 開口率測定装置
KR101294218B1 (ko) * 2010-05-10 2013-08-07 동우 화인켐 주식회사 편광 필름 원반의 품질 판정 시스템 및 방법

Also Published As

Publication number Publication date
JPH0562942B2 (enrdf_load_stackoverflow) 1993-09-09

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