JPS6233754B2 - - Google Patents
Info
- Publication number
- JPS6233754B2 JPS6233754B2 JP8139481A JP8139481A JPS6233754B2 JP S6233754 B2 JPS6233754 B2 JP S6233754B2 JP 8139481 A JP8139481 A JP 8139481A JP 8139481 A JP8139481 A JP 8139481A JP S6233754 B2 JPS6233754 B2 JP S6233754B2
- Authority
- JP
- Japan
- Prior art keywords
- umbrella
- gate
- organic compound
- layer
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 22
- 229910052751 metal Inorganic materials 0.000 claims description 14
- 239000002184 metal Substances 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 14
- 150000002894 organic compounds Chemical class 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 6
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 6
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 6
- 229940125810 compound 20 Drugs 0.000 description 6
- 238000005530 etching Methods 0.000 description 4
- 238000005468 ion implantation Methods 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 235000015067 sauces Nutrition 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910017401 Au—Ge Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BYDQGSVXQDOSJJ-UHFFFAOYSA-N [Ge].[Au] Chemical compound [Ge].[Au] BYDQGSVXQDOSJJ-UHFFFAOYSA-N 0.000 description 1
- CTNCAPKYOBYQCX-UHFFFAOYSA-N [P].[As] Chemical compound [P].[As] CTNCAPKYOBYQCX-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Junction Field-Effect Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8139481A JPS57196581A (en) | 1981-05-27 | 1981-05-27 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8139481A JPS57196581A (en) | 1981-05-27 | 1981-05-27 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57196581A JPS57196581A (en) | 1982-12-02 |
JPS6233754B2 true JPS6233754B2 (enrdf_load_stackoverflow) | 1987-07-22 |
Family
ID=13745081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8139481A Granted JPS57196581A (en) | 1981-05-27 | 1981-05-27 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57196581A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59229876A (ja) * | 1983-06-13 | 1984-12-24 | Toshiba Corp | シヨツトキ−ゲ−ト型電界効果トランジスタの製造方法 |
JPS60115268A (ja) * | 1983-11-28 | 1985-06-21 | Fujitsu Ltd | 半導体装置の製造方法 |
-
1981
- 1981-05-27 JP JP8139481A patent/JPS57196581A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS57196581A (en) | 1982-12-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5041393A (en) | Fabrication of GaAs integrated circuits | |
EP0128751B1 (en) | Manufacturing method of schottky gate fet | |
KR920009718B1 (ko) | 화합물반도체장치 및 그 제조방법 | |
JPS5950567A (ja) | 電界効果トランジスタの製造方法 | |
US4956308A (en) | Method of making self-aligned field-effect transistor | |
JPH0748503B2 (ja) | 電界効果トランジスタの製造方法 | |
US4997779A (en) | Method of making asymmetrical gate field effect transistor | |
US4193182A (en) | Passivated V-gate GaAs field-effect transistor and fabrication process therefor | |
JP3075831B2 (ja) | 電界効果型トランジスタ及びその製造方法 | |
US4888626A (en) | Self-aligned gaas fet with low 1/f noise | |
JPH0897236A (ja) | 半導体装置の電極,及びその製造方法 | |
US4350991A (en) | Narrow channel length MOS field effect transistor with field protection region for reduced source-to-substrate capacitance | |
JPS6233754B2 (enrdf_load_stackoverflow) | ||
JPS592385B2 (ja) | メサ型非活性Vゲ−トGaAs電界効果トランジスタとその製造方法 | |
JPH01251668A (ja) | 電界効果トランジスタの製造方法 | |
KR920002517B1 (ko) | 이중측벽 기술에 의한 bpldd 구조의 금속-반도체 전계효과트랜지스터 및 그의 제조방법 | |
JPH01274477A (ja) | 半導体装置の製造方法 | |
JPS6347982A (ja) | 半導体装置 | |
JPS6258154B2 (enrdf_load_stackoverflow) | ||
JPH063814B2 (ja) | 半導体装置の製造方法 | |
JPS6155967A (ja) | 電界効果トランジスタの製造方法 | |
KR940010561B1 (ko) | Mesfet 반도체 장치 제조방법 | |
JPS6216574A (ja) | 電界効果トランジスタの製造方法 | |
JPS62190773A (ja) | 電界効果トランジスタとその製造方法 | |
JPS6298780A (ja) | 自己整列したGaAsデジタル集積回路の製造方法 |