JPS6231440B2 - - Google Patents
Info
- Publication number
- JPS6231440B2 JPS6231440B2 JP57222231A JP22223182A JPS6231440B2 JP S6231440 B2 JPS6231440 B2 JP S6231440B2 JP 57222231 A JP57222231 A JP 57222231A JP 22223182 A JP22223182 A JP 22223182A JP S6231440 B2 JPS6231440 B2 JP S6231440B2
- Authority
- JP
- Japan
- Prior art keywords
- address
- memory
- sequence
- addresses
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000015654 memory Effects 0.000 claims description 74
- 238000012360 testing method Methods 0.000 claims description 41
- 230000000873 masking effect Effects 0.000 claims description 16
- 230000007423 decrease Effects 0.000 claims description 7
- 230000003247 decreasing effect Effects 0.000 claims description 7
- 230000004044 response Effects 0.000 claims description 5
- 238000013500 data storage Methods 0.000 claims 1
- 239000011159 matrix material Substances 0.000 description 12
- 230000006870 function Effects 0.000 description 9
- 230000007547 defect Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000000875 corresponding effect Effects 0.000 description 3
- 240000007320 Pinus strobus Species 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229930091051 Arenine Natural products 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000006386 memory function Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000135 prohibitive effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US354971 | 1982-03-05 | ||
| US06/354,971 US4442519A (en) | 1982-03-05 | 1982-03-05 | Memory address sequence generator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58153300A JPS58153300A (ja) | 1983-09-12 |
| JPS6231440B2 true JPS6231440B2 (US20080293856A1-20081127-C00150.png) | 1987-07-08 |
Family
ID=23395685
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57222231A Granted JPS58153300A (ja) | 1982-03-05 | 1982-12-20 | メモリ・アドレス・シ−ケンス発生器 |
Country Status (4)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS633240U (US20080293856A1-20081127-C00150.png) * | 1986-06-25 | 1988-01-11 |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3237365A1 (de) * | 1982-10-08 | 1984-04-12 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur erzeugung von mustern von pruefsignalen bei einem pruefgeraet |
| US4751631A (en) * | 1983-02-04 | 1988-06-14 | Signal Processing Systems, Inc. | Apparatus for fast generation of signal sequences |
| US4715034A (en) * | 1985-03-04 | 1987-12-22 | John Fluke Mfg. Co., Inc. | Method of and system for fast functional testing of random access memories |
| DE3513551A1 (de) * | 1985-04-16 | 1986-10-16 | Wandel & Goltermann Gmbh & Co, 7412 Eningen | Digitaler wortgenerator zur automatischen erzeugung periodischer dauerzeichen aus n-bit-woertern aller wortgewichte und deren permutationen |
| JPS6224500A (ja) * | 1985-07-23 | 1987-02-02 | Yokogawa Electric Corp | 半導体メモリ検査装置 |
| CA1259680A (en) * | 1986-05-06 | 1989-09-19 | Mosaid Technologies Inc. | Digital signal scrambler |
| US4852096A (en) * | 1987-08-14 | 1989-07-25 | International Business Machines Corp. | CN2 test pattern generator |
| US5392302A (en) * | 1991-03-13 | 1995-02-21 | Quantum Corp. | Address error detection technique for increasing the reliability of a storage subsystem |
| EP0573179A3 (en) * | 1992-06-02 | 1996-06-05 | American Telephone & Telegraph | Non-fully-decoded test address generator |
| JPH08305638A (ja) * | 1995-05-01 | 1996-11-22 | Nec Corp | Ｒｏｍデータ検査方法 |
| US6061815A (en) * | 1996-12-09 | 2000-05-09 | Schlumberger Technologies, Inc. | Programming utility register to generate addresses in algorithmic pattern generator |
| JP3235523B2 (ja) * | 1997-08-06 | 2001-12-04 | 日本電気株式会社 | 半導体集積回路 |
| US6073263A (en) * | 1997-10-29 | 2000-06-06 | Credence Systems Corporation | Parallel processing pattern generation system for an integrated circuit tester |
| US6078637A (en) | 1998-06-29 | 2000-06-20 | Cypress Semiconductor Corp. | Address counter test mode for memory device |
| US6934762B1 (en) | 2000-04-27 | 2005-08-23 | Redundant Networks, Inc. | Method and apparatus for providing backup internet access |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3751649A (en) * | 1971-05-17 | 1973-08-07 | Marcrodata Co | Memory system exerciser |
| DE2829709C2 (de) * | 1978-07-06 | 1984-02-23 | Ibm Deutschland Gmbh, 7000 Stuttgart | Verfahren und Anordnung zur Erzeugung zeitlich unmittelbar aufeinanderfolgender Impulszyklen |
| JPS5552581A (en) * | 1978-10-11 | 1980-04-17 | Advantest Corp | Pattern generator |
| JPS6030973B2 (ja) * | 1980-01-18 | 1985-07-19 | 日本電気株式会社 | 高速パタ−ン発生器 |
| US4370746A (en) * | 1980-12-24 | 1983-01-25 | International Business Machines Corporation | Memory address selector |
-
1982
- 1982-03-05 US US06/354,971 patent/US4442519A/en not_active Expired - Lifetime
- 1982-12-20 JP JP57222231A patent/JPS58153300A/ja active Granted
-
1983
- 1983-01-04 DE DE8383100018T patent/DE3380080D1/de not_active Expired
- 1983-01-04 EP EP83100018A patent/EP0088202B1/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS633240U (US20080293856A1-20081127-C00150.png) * | 1986-06-25 | 1988-01-11 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0088202B1 (en) | 1989-06-14 |
| JPS58153300A (ja) | 1983-09-12 |
| US4442519A (en) | 1984-04-10 |
| DE3380080D1 (en) | 1989-07-20 |
| EP0088202A2 (en) | 1983-09-14 |
| EP0088202A3 (en) | 1987-06-03 |
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