JPS62245951A - デイスク測定装置 - Google Patents

デイスク測定装置

Info

Publication number
JPS62245951A
JPS62245951A JP8944986A JP8944986A JPS62245951A JP S62245951 A JPS62245951 A JP S62245951A JP 8944986 A JP8944986 A JP 8944986A JP 8944986 A JP8944986 A JP 8944986A JP S62245951 A JPS62245951 A JP S62245951A
Authority
JP
Japan
Prior art keywords
light
disk
value
receiving element
beam splitter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8944986A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0569374B2 (enrdf_load_stackoverflow
Inventor
Yoshihiro Uchiumi
喜洋 内海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP8944986A priority Critical patent/JPS62245951A/ja
Publication of JPS62245951A publication Critical patent/JPS62245951A/ja
Publication of JPH0569374B2 publication Critical patent/JPH0569374B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Manufacturing Optical Record Carriers (AREA)
JP8944986A 1986-04-18 1986-04-18 デイスク測定装置 Granted JPS62245951A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8944986A JPS62245951A (ja) 1986-04-18 1986-04-18 デイスク測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8944986A JPS62245951A (ja) 1986-04-18 1986-04-18 デイスク測定装置

Publications (2)

Publication Number Publication Date
JPS62245951A true JPS62245951A (ja) 1987-10-27
JPH0569374B2 JPH0569374B2 (enrdf_load_stackoverflow) 1993-09-30

Family

ID=13970994

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8944986A Granted JPS62245951A (ja) 1986-04-18 1986-04-18 デイスク測定装置

Country Status (1)

Country Link
JP (1) JPS62245951A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01216235A (ja) * 1988-02-25 1989-08-30 Orc Mfg Co Ltd 複屈折の測定方法
JPH04335145A (ja) * 1991-05-13 1992-11-24 Idec Izumi Corp 織物欠陥穴検出器
JP2015225081A (ja) * 2014-05-28 2015-12-14 天津先陽科技発展有限公司 拡散スペクトルデータの処理方法及び処理装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5788347A (en) * 1980-10-29 1982-06-02 Zeiss Jena Veb Carl Polarization path difference measuring apparatus
JPS60250229A (ja) * 1984-05-28 1985-12-10 Nec Corp プラスチツク基板検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5788347A (en) * 1980-10-29 1982-06-02 Zeiss Jena Veb Carl Polarization path difference measuring apparatus
JPS60250229A (ja) * 1984-05-28 1985-12-10 Nec Corp プラスチツク基板検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01216235A (ja) * 1988-02-25 1989-08-30 Orc Mfg Co Ltd 複屈折の測定方法
JPH04335145A (ja) * 1991-05-13 1992-11-24 Idec Izumi Corp 織物欠陥穴検出器
JP2015225081A (ja) * 2014-05-28 2015-12-14 天津先陽科技発展有限公司 拡散スペクトルデータの処理方法及び処理装置
JP2020038225A (ja) * 2014-05-28 2020-03-12 天津先陽科技発展有限公司 多位置拡散スペクトルデータの処理、モデリング、予測方法および処理装置

Also Published As

Publication number Publication date
JPH0569374B2 (enrdf_load_stackoverflow) 1993-09-30

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