JPS6219709B2 - - Google Patents

Info

Publication number
JPS6219709B2
JPS6219709B2 JP53152542A JP15254278A JPS6219709B2 JP S6219709 B2 JPS6219709 B2 JP S6219709B2 JP 53152542 A JP53152542 A JP 53152542A JP 15254278 A JP15254278 A JP 15254278A JP S6219709 B2 JPS6219709 B2 JP S6219709B2
Authority
JP
Japan
Prior art keywords
signal
input
test
circuit
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53152542A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5578263A (en
Inventor
Tsutomu Iima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP15254278A priority Critical patent/JPS5578263A/ja
Publication of JPS5578263A publication Critical patent/JPS5578263A/ja
Publication of JPS6219709B2 publication Critical patent/JPS6219709B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP15254278A 1978-12-08 1978-12-08 Semiconductor integrated circuit Granted JPS5578263A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15254278A JPS5578263A (en) 1978-12-08 1978-12-08 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15254278A JPS5578263A (en) 1978-12-08 1978-12-08 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS5578263A JPS5578263A (en) 1980-06-12
JPS6219709B2 true JPS6219709B2 (enrdf_load_stackoverflow) 1987-04-30

Family

ID=15542723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15254278A Granted JPS5578263A (en) 1978-12-08 1978-12-08 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5578263A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612499A (en) * 1983-11-07 1986-09-16 Texas Instruments Incorporated Test input demultiplexing circuit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5396740A (en) * 1977-02-04 1978-08-24 Hitachi Ltd Test system

Also Published As

Publication number Publication date
JPS5578263A (en) 1980-06-12

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