JPS6176940A - 実装済プリント基板自動検査装置 - Google Patents

実装済プリント基板自動検査装置

Info

Publication number
JPS6176940A
JPS6176940A JP19860384A JP19860384A JPS6176940A JP S6176940 A JPS6176940 A JP S6176940A JP 19860384 A JP19860384 A JP 19860384A JP 19860384 A JP19860384 A JP 19860384A JP S6176940 A JPS6176940 A JP S6176940A
Authority
JP
Japan
Prior art keywords
printed circuit
beam spot
circuit board
bridge
absence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19860384A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0571902B2 (https=
Inventor
Hisashi Hirano
恒 平野
Kenjiyu Muraoka
村岡　建樹
Masahiko Ikeguchi
雅彦 池口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nagoya Electric Works Co Ltd
Original Assignee
Nagoya Electric Works Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagoya Electric Works Co Ltd filed Critical Nagoya Electric Works Co Ltd
Priority to JP19860384A priority Critical patent/JPS6176940A/ja
Publication of JPS6176940A publication Critical patent/JPS6176940A/ja
Publication of JPH0571902B2 publication Critical patent/JPH0571902B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
JP19860384A 1984-09-25 1984-09-25 実装済プリント基板自動検査装置 Granted JPS6176940A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19860384A JPS6176940A (ja) 1984-09-25 1984-09-25 実装済プリント基板自動検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19860384A JPS6176940A (ja) 1984-09-25 1984-09-25 実装済プリント基板自動検査装置

Publications (2)

Publication Number Publication Date
JPS6176940A true JPS6176940A (ja) 1986-04-19
JPH0571902B2 JPH0571902B2 (https=) 1993-10-08

Family

ID=16393939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19860384A Granted JPS6176940A (ja) 1984-09-25 1984-09-25 実装済プリント基板自動検査装置

Country Status (1)

Country Link
JP (1) JPS6176940A (https=)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6379624U (https=) * 1986-11-13 1988-05-26
JPS63177044A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置におけるブリツジ検出方式
JPS63177042A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置における半田フヌレ検出方式
JPS63177041A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置における基準穴位置検出方式
JPS63113946U (https=) * 1987-01-19 1988-07-22
JPH0434345A (ja) * 1990-05-30 1992-02-05 Dainippon Screen Mfg Co Ltd プリント基板検査装置のためのイメージ読取りシステム
JPH085572A (ja) * 1995-05-26 1996-01-12 Matsushita Electric Ind Co Ltd 電子部品の外観検査方法
CN112188743A (zh) * 2020-10-27 2021-01-05 惠州市特创电子科技有限公司 多层电路板及其铆钉钻除方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53146171A (en) * 1977-05-26 1978-12-19 Fujitsu Ltd Method of inspecting printed board
JPS5416668A (en) * 1977-07-08 1979-02-07 Hitachi Ltd Method of detecting excessivee or lackingg holes in print wire board
JPS5460458A (en) * 1977-10-24 1979-05-15 Hitachi Ltd Device of automatically inspecting pattern of print board conductor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53146171A (en) * 1977-05-26 1978-12-19 Fujitsu Ltd Method of inspecting printed board
JPS5416668A (en) * 1977-07-08 1979-02-07 Hitachi Ltd Method of detecting excessivee or lackingg holes in print wire board
JPS5460458A (en) * 1977-10-24 1979-05-15 Hitachi Ltd Device of automatically inspecting pattern of print board conductor

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6379624U (https=) * 1986-11-13 1988-05-26
JPS63177044A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置におけるブリツジ検出方式
JPS63177042A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置における半田フヌレ検出方式
JPS63177041A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置における基準穴位置検出方式
JPS63113946U (https=) * 1987-01-19 1988-07-22
JPH0434345A (ja) * 1990-05-30 1992-02-05 Dainippon Screen Mfg Co Ltd プリント基板検査装置のためのイメージ読取りシステム
JPH085572A (ja) * 1995-05-26 1996-01-12 Matsushita Electric Ind Co Ltd 電子部品の外観検査方法
CN112188743A (zh) * 2020-10-27 2021-01-05 惠州市特创电子科技有限公司 多层电路板及其铆钉钻除方法

Also Published As

Publication number Publication date
JPH0571902B2 (https=) 1993-10-08

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Legal Events

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