JPH0571902B2 - - Google Patents

Info

Publication number
JPH0571902B2
JPH0571902B2 JP59198603A JP19860384A JPH0571902B2 JP H0571902 B2 JPH0571902 B2 JP H0571902B2 JP 59198603 A JP59198603 A JP 59198603A JP 19860384 A JP19860384 A JP 19860384A JP H0571902 B2 JPH0571902 B2 JP H0571902B2
Authority
JP
Japan
Prior art keywords
printed circuit
circuit board
component
bridge
sweep
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59198603A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6176940A (ja
Inventor
Hisashi Hirano
Kenju Muraoka
Masahiko Ikeguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nagoya Electric Works Co Ltd
Original Assignee
Nagoya Electric Works Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagoya Electric Works Co Ltd filed Critical Nagoya Electric Works Co Ltd
Priority to JP19860384A priority Critical patent/JPS6176940A/ja
Publication of JPS6176940A publication Critical patent/JPS6176940A/ja
Publication of JPH0571902B2 publication Critical patent/JPH0571902B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
JP19860384A 1984-09-25 1984-09-25 実装済プリント基板自動検査装置 Granted JPS6176940A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19860384A JPS6176940A (ja) 1984-09-25 1984-09-25 実装済プリント基板自動検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19860384A JPS6176940A (ja) 1984-09-25 1984-09-25 実装済プリント基板自動検査装置

Publications (2)

Publication Number Publication Date
JPS6176940A JPS6176940A (ja) 1986-04-19
JPH0571902B2 true JPH0571902B2 (https=) 1993-10-08

Family

ID=16393939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19860384A Granted JPS6176940A (ja) 1984-09-25 1984-09-25 実装済プリント基板自動検査装置

Country Status (1)

Country Link
JP (1) JPS6176940A (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6379624U (https=) * 1986-11-13 1988-05-26
JPS63177041A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置における基準穴位置検出方式
JPH0729483Y2 (ja) * 1987-01-19 1995-07-05 名古屋電機工業株式会社 実装済プリント基板自動検査装置
JPS63177044A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置におけるブリツジ検出方式
JPS63177042A (ja) * 1987-01-19 1988-07-21 Nagoya Denki Kogyo Kk 実装済プリント基板自動検査装置における半田フヌレ検出方式
JPH0434345A (ja) * 1990-05-30 1992-02-05 Dainippon Screen Mfg Co Ltd プリント基板検査装置のためのイメージ読取りシステム
JPH085572A (ja) * 1995-05-26 1996-01-12 Matsushita Electric Ind Co Ltd 電子部品の外観検査方法
CN112188743B (zh) * 2020-10-27 2021-12-07 惠州市特创电子科技股份有限公司 多层电路板及其铆钉钻除方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53146171A (en) * 1977-05-26 1978-12-19 Fujitsu Ltd Method of inspecting printed board
JPS5416668A (en) * 1977-07-08 1979-02-07 Hitachi Ltd Method of detecting excessivee or lackingg holes in print wire board
JPS5460458A (en) * 1977-10-24 1979-05-15 Hitachi Ltd Device of automatically inspecting pattern of print board conductor

Also Published As

Publication number Publication date
JPS6176940A (ja) 1986-04-19

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term