JPS616824A - 半導体基板目合せ法 - Google Patents
半導体基板目合せ法Info
- Publication number
- JPS616824A JPS616824A JP59126785A JP12678584A JPS616824A JP S616824 A JPS616824 A JP S616824A JP 59126785 A JP59126785 A JP 59126785A JP 12678584 A JP12678584 A JP 12678584A JP S616824 A JPS616824 A JP S616824A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- alignment
- cutting
- patterns
- delta
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 18
- 239000000758 substrate Substances 0.000 title claims description 16
- 238000000034 method Methods 0.000 claims abstract description 18
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000006866 deterioration Effects 0.000 abstract description 2
- 238000005520 cutting process Methods 0.000 abstract 5
- 238000000227 grinding Methods 0.000 description 14
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 8
- 238000002955 isolation Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- 238000005530 etching Methods 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 210000000744 eyelid Anatomy 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 235000014121 butter Nutrition 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59126785A JPS616824A (ja) | 1984-06-20 | 1984-06-20 | 半導体基板目合せ法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59126785A JPS616824A (ja) | 1984-06-20 | 1984-06-20 | 半導体基板目合せ法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS616824A true JPS616824A (ja) | 1986-01-13 |
| JPH0347570B2 JPH0347570B2 (enrdf_load_stackoverflow) | 1991-07-19 |
Family
ID=14943874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59126785A Granted JPS616824A (ja) | 1984-06-20 | 1984-06-20 | 半導体基板目合せ法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS616824A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007273727A (ja) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | アライメントマーク及びその形成方法、半導体装置及びその製造方法 |
| US11322627B2 (en) | 2018-09-19 | 2022-05-03 | Kabushiki Kaisha Toshiba | Solar cell, multi-junction solar cell, solar cell module, and solar power generation system |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5340285A (en) * | 1976-09-25 | 1978-04-12 | Fujitsu Ltd | Detection method for position-matching error |
| JPS53114675A (en) * | 1977-03-17 | 1978-10-06 | Toshiba Corp | Mark for mask alignment |
| JPS5418677A (en) * | 1977-07-12 | 1979-02-10 | Matsushita Electric Ind Co Ltd | Positioning mark for photo etching |
| JPS55158633A (en) * | 1979-05-29 | 1980-12-10 | Hitachi Ltd | Dielectric insulation isolating wafer with reference pattern |
| JPS5748234A (en) * | 1980-09-08 | 1982-03-19 | Fujitsu Ltd | Position adjusting method of semiconductor device |
| JPS5963728A (ja) * | 1982-10-04 | 1984-04-11 | Matsushita Electronics Corp | 半導体装置の製造方法 |
-
1984
- 1984-06-20 JP JP59126785A patent/JPS616824A/ja active Granted
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5340285A (en) * | 1976-09-25 | 1978-04-12 | Fujitsu Ltd | Detection method for position-matching error |
| JPS53114675A (en) * | 1977-03-17 | 1978-10-06 | Toshiba Corp | Mark for mask alignment |
| JPS5418677A (en) * | 1977-07-12 | 1979-02-10 | Matsushita Electric Ind Co Ltd | Positioning mark for photo etching |
| JPS55158633A (en) * | 1979-05-29 | 1980-12-10 | Hitachi Ltd | Dielectric insulation isolating wafer with reference pattern |
| JPS5748234A (en) * | 1980-09-08 | 1982-03-19 | Fujitsu Ltd | Position adjusting method of semiconductor device |
| JPS5963728A (ja) * | 1982-10-04 | 1984-04-11 | Matsushita Electronics Corp | 半導体装置の製造方法 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007273727A (ja) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | アライメントマーク及びその形成方法、半導体装置及びその製造方法 |
| US11322627B2 (en) | 2018-09-19 | 2022-05-03 | Kabushiki Kaisha Toshiba | Solar cell, multi-junction solar cell, solar cell module, and solar power generation system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0347570B2 (enrdf_load_stackoverflow) | 1991-07-19 |
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