JPS6167578U - - Google Patents

Info

Publication number
JPS6167578U
JPS6167578U JP15229484U JP15229484U JPS6167578U JP S6167578 U JPS6167578 U JP S6167578U JP 15229484 U JP15229484 U JP 15229484U JP 15229484 U JP15229484 U JP 15229484U JP S6167578 U JPS6167578 U JP S6167578U
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
conduction
heat dissipation
testing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15229484U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15229484U priority Critical patent/JPS6167578U/ja
Publication of JPS6167578U publication Critical patent/JPS6167578U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示す概略断面図
、第2図は従来の半導体集積回路の通電テスト装
置を示す概略断面図である。 3…半導体集積回路、5…ラバー(弾性体)、
7…放熱用フイン。なお、各図中、同一符号は同
一又は相当部分を示す。
FIG. 1 is a schematic sectional view showing an embodiment of this invention, and FIG. 2 is a schematic sectional view showing a conventional conduction test device for semiconductor integrated circuits. 3...Semiconductor integrated circuit, 5...Rubber (elastic body),
7... Fin for heat radiation. In each figure, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体集積回路の通電テスト時に発生する熱を
放出する放熱手段を備えた半導体集積回路の通電
テスト装置において、半導体集積回路の表面に載
置され、放熱用フインが表面に設けられている熱
良導性・絶縁性のものよりなる弾性体を備えてな
ることを特徴とする半導体集積回路の通電テスト
装置。
In a semiconductor integrated circuit conduction testing device that is equipped with a heat dissipation means for dissipating heat generated during a conduction test of a semiconductor integrated circuit, the thermal conductivity test device is placed on the surface of the semiconductor integrated circuit and has heat dissipation fins on the surface. 1. A conduction testing device for semiconductor integrated circuits, characterized in that the device comprises an elastic body made of a material having properties and insulating properties.
JP15229484U 1984-10-11 1984-10-11 Pending JPS6167578U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15229484U JPS6167578U (en) 1984-10-11 1984-10-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15229484U JPS6167578U (en) 1984-10-11 1984-10-11

Publications (1)

Publication Number Publication Date
JPS6167578U true JPS6167578U (en) 1986-05-09

Family

ID=30710363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15229484U Pending JPS6167578U (en) 1984-10-11 1984-10-11

Country Status (1)

Country Link
JP (1) JPS6167578U (en)

Similar Documents

Publication Publication Date Title
JPS6167578U (en)
JPS59103496U (en) heat dissipation device
JPS58175641U (en) Semiconductor component mounting equipment
JPS61119396U (en)
JPS58116245U (en) Mounting structure of semiconductor image sensor
JPS6042742U (en) semiconductor equipment
JPS6260042U (en)
JPS5857030U (en) Heat conductive insulation sheet
JPS62174341U (en)
JPH0179846U (en)
JPS62182553U (en)
JPS6081657U (en) Heat sink for semiconductor devices
JPS6252992U (en)
JPS61162058U (en)
JPS63100845U (en)
JPS5920639U (en) Heatsink for semiconductor devices
JPS63100894U (en)
JPS6447096U (en)
JPS648796U (en)
JPS61168640U (en)
JPH01110490U (en)
JPS58189593U (en) circuit element assembly
JPS63187344U (en)
JPH0359645U (en)
JPS60109329U (en) Power semiconductor devices