JPS6160159B2 - - Google Patents

Info

Publication number
JPS6160159B2
JPS6160159B2 JP52070234A JP7023477A JPS6160159B2 JP S6160159 B2 JPS6160159 B2 JP S6160159B2 JP 52070234 A JP52070234 A JP 52070234A JP 7023477 A JP7023477 A JP 7023477A JP S6160159 B2 JPS6160159 B2 JP S6160159B2
Authority
JP
Japan
Prior art keywords
plated
plating
detector
feed rate
guide stand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52070234A
Other languages
English (en)
Japanese (ja)
Other versions
JPS544828A (en
Inventor
Megumi Suda
Osamu Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON EREKUTOROPUREITEINGU ENJINYAAZU KK
Original Assignee
NIPPON EREKUTOROPUREITEINGU ENJINYAAZU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON EREKUTOROPUREITEINGU ENJINYAAZU KK filed Critical NIPPON EREKUTOROPUREITEINGU ENJINYAAZU KK
Priority to JP7023477A priority Critical patent/JPS544828A/ja
Publication of JPS544828A publication Critical patent/JPS544828A/ja
Publication of JPS6160159B2 publication Critical patent/JPS6160159B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP7023477A 1977-06-14 1977-06-14 Method of adjusting plating thickness in automatic continuous plating and measuring device therefor Granted JPS544828A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7023477A JPS544828A (en) 1977-06-14 1977-06-14 Method of adjusting plating thickness in automatic continuous plating and measuring device therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7023477A JPS544828A (en) 1977-06-14 1977-06-14 Method of adjusting plating thickness in automatic continuous plating and measuring device therefor

Publications (2)

Publication Number Publication Date
JPS544828A JPS544828A (en) 1979-01-13
JPS6160159B2 true JPS6160159B2 (enrdf_load_stackoverflow) 1986-12-19

Family

ID=13425663

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7023477A Granted JPS544828A (en) 1977-06-14 1977-06-14 Method of adjusting plating thickness in automatic continuous plating and measuring device therefor

Country Status (1)

Country Link
JP (1) JPS544828A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199552A (en) * 1981-06-03 1982-12-07 Nippon Chem Ind Co Ltd:The Mold additive for casting and production thereof
JPS58100916U (ja) * 1981-12-28 1983-07-09 株式会社　インタツク 積雪防止装置
JPS61250192A (ja) * 1985-04-25 1986-11-07 Kanai Hiroyuki ヒ−ドワイヤ製造方法
JPH07173700A (ja) * 1993-12-17 1995-07-11 Nec Corp 分割アノードめっき装置および電流値決定方法
WO2011010430A1 (ja) 2009-07-24 2011-01-27 パナソニック株式会社 堆積量測定装置、堆積量測定方法及び電気化学素子用電極の製造方法
CN108680127B (zh) * 2018-05-21 2020-11-27 北京核夕菁科技有限公司 镀层测量方法和装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS502020U (enrdf_load_stackoverflow) * 1973-05-07 1975-01-10
JPS5625893B2 (enrdf_load_stackoverflow) * 1973-06-04 1981-06-15
JPS5412079B2 (enrdf_load_stackoverflow) * 1973-06-20 1979-05-19

Also Published As

Publication number Publication date
JPS544828A (en) 1979-01-13

Similar Documents

Publication Publication Date Title
US4652742A (en) Arrangement for and method of determining two or more superimposed film sheets
JPS6160159B2 (enrdf_load_stackoverflow)
US3087058A (en) Method and apparatus for radiographic inspection
JPS59123647A (ja) コ−テイングシ−トの端部切断装置
US2943554A (en) Film printing machine
US4777610A (en) Thickness monitor
US3998547A (en) Process and apparatus for automatically changing the illumination intensity of the light source in a copying apparatus
US4656857A (en) Method for cutting uncoiled web
CN216574227U (zh) 极片边缘平直度检测设备及电芯卷绕生产线
CN214276698U (zh) 一种高精度卷尺检定装置
JPS61162413A (ja) はんだ槽用キヤリアレスコンベアシステム
JPH0714098B2 (ja) レ−ザ出力制御装置
TW201341099A (zh) 雷射光照射系統、雷射光照射方法及記錄媒體
JPH06267349A (ja) 平型多芯電線製造装置におけるテープ貼り位置制御方法およびテープ貼り位置制御装置
JPS58109227A (ja) ワイヤカツト放電加工機
CN218200537U (zh) 一种检测设备的翻转装置
JPS62187058A (ja) プリンタの紙端センサ取付位置補正装置
JP2782110B2 (ja) プラスチックフイルムの巻芯への巻き付き検出装置
JPS6254626A (ja) ワイヤ放電加工機の集中放電検出装置
JP2700456B2 (ja) Ｘ線速写駆動制御装置
JPH0696423B2 (ja) ループ量制御装置
US3525157A (en) Apparatus for measuring lengths
US3798518A (en) Variable duration braking circuit for a momentary intermittently driven web transporting mechanism
JPS61285376A (ja) マイクロ波加熱乾燥装置
JPS61133477A (ja) 情報検索装置