JPS6125171B2 - - Google Patents

Info

Publication number
JPS6125171B2
JPS6125171B2 JP55133788A JP13378880A JPS6125171B2 JP S6125171 B2 JPS6125171 B2 JP S6125171B2 JP 55133788 A JP55133788 A JP 55133788A JP 13378880 A JP13378880 A JP 13378880A JP S6125171 B2 JPS6125171 B2 JP S6125171B2
Authority
JP
Japan
Prior art keywords
air
under test
device under
temperature
exhaust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55133788A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5759256A (en
Inventor
Kunihiro Ueshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55133788A priority Critical patent/JPS5759256A/ja
Publication of JPS5759256A publication Critical patent/JPS5759256A/ja
Publication of JPS6125171B2 publication Critical patent/JPS6125171B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55133788A 1980-09-26 1980-09-26 Temperature test system Granted JPS5759256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55133788A JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55133788A JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Publications (2)

Publication Number Publication Date
JPS5759256A JPS5759256A (en) 1982-04-09
JPS6125171B2 true JPS6125171B2 (zh) 1986-06-14

Family

ID=15113015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55133788A Granted JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Country Status (1)

Country Link
JP (1) JPS5759256A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2536518B1 (fr) * 1982-11-19 1987-06-05 Thomson Csf Mat Tel Enceinte de chauffage pour test de terminaux en temperature
JPS59206208A (ja) * 1983-05-09 1984-11-22 Bridgestone Corp 雪氷路に好適な空気入りタイヤ
JPS61165649A (ja) * 1984-12-11 1986-07-26 Fujitsu Ltd 温度試験装置
JP2511205Y2 (ja) * 1989-06-16 1996-09-25 株式会社藤田製作所 バ―ンイン処理装置
CN113514969B (zh) * 2021-07-07 2023-09-15 福建省德盈电子有限公司 一种液晶显示模组制造的老化测试装置及其使用方法

Also Published As

Publication number Publication date
JPS5759256A (en) 1982-04-09

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