JPS6125171B2 - - Google Patents

Info

Publication number
JPS6125171B2
JPS6125171B2 JP55133788A JP13378880A JPS6125171B2 JP S6125171 B2 JPS6125171 B2 JP S6125171B2 JP 55133788 A JP55133788 A JP 55133788A JP 13378880 A JP13378880 A JP 13378880A JP S6125171 B2 JPS6125171 B2 JP S6125171B2
Authority
JP
Japan
Prior art keywords
air
under test
device under
temperature
exhaust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55133788A
Other languages
Japanese (ja)
Other versions
JPS5759256A (en
Inventor
Kunihiro Ueshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55133788A priority Critical patent/JPS5759256A/en
Publication of JPS5759256A publication Critical patent/JPS5759256A/en
Publication of JPS6125171B2 publication Critical patent/JPS6125171B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Description

【発明の詳細な説明】 本発明は内部に発熱体を有する装置、特に大型
電子計算機等の温度試験を簡便に行なうことを目
的とし、被試験装置自体の発熱を有効に利用して
均一な高温度を得るものである。
DETAILED DESCRIPTION OF THE INVENTION The purpose of the present invention is to easily perform temperature tests on devices that have internal heating elements, especially large electronic computers, etc., and to test devices with a uniform temperature by effectively utilizing the heat generated by the device under test itself. It is used to obtain temperature.

電子計算機等の大型電子装置は内部の電子回路
における発熱を逃がすため、冷却空気を吸気口か
ら吸込み、暖まつた空気を排気口から排出する手
段が設けられている。このような装置に対して高
温試験を行なう場合、従来は装置全体を恒温槽に
入れるか、装置の吸気口にヒータを挿入する等の
方法が有するが、前者は大型の恒温槽は非常に高
価であり、後者は装置と床面との間にヒータを挿
入することが寸法上困難であること、さらに装置
の自己発熱を有効に利用していない等の欠点があ
つた。また装置の自己発熱を利用する方法として
は、強制空冷方式の場合には装置内の送風フアン
を停止することも考えられるが、その場合装置の
上部と下部とで温度差を生じる欠点がある。
2. Description of the Related Art In order to release heat generated from internal electronic circuits, large electronic devices such as computers are provided with means for sucking in cooling air through an intake port and discharging warm air through an exhaust port. When performing high-temperature tests on such devices, conventional methods include placing the entire device in a thermostatic chamber or inserting a heater into the inlet of the device, but the former requires a large thermostatic chamber that is extremely expensive. However, the latter has drawbacks such as the difficulty in inserting a heater between the device and the floor due to its dimensions, and the fact that the self-heating of the device is not effectively utilized. In addition, as a method of utilizing the self-heating of the device, in the case of a forced air cooling method, it is possible to stop the blower fan inside the device, but this has the drawback of creating a temperature difference between the upper and lower portions of the device.

本発明は以上の如き問題点を解決することを目
的とし、以下図面により詳細説明する。
The present invention aims to solve the above-mentioned problems, and will be explained in detail below with reference to the drawings.

第1図は本発明の一実施例を示す縦断面図であ
る。図中1は被試験装置であり、発熱部である電
子回路11、送風フアン12、吸気口13、排気
口14を有する。また2は本発明による空気循環
装置であり、被試験装置1の排気口14近傍に位
置する循環吸気口21、被試験装置1の吸気口1
3近傍に位置する循環排気口22、送風フアン2
3、ヒータ24、ダンパ25,26、排気フアン
27、吸気口28を有する。また3は循環効率を
上げるための天板である。
FIG. 1 is a longitudinal sectional view showing one embodiment of the present invention. In the figure, reference numeral 1 denotes a device under test, which has an electronic circuit 11 as a heat generating section, a blower fan 12, an air intake port 13, and an exhaust port 14. Reference numeral 2 designates an air circulation device according to the present invention, including a circulation intake port 21 located near the exhaust port 14 of the device under test 1;
Circulation exhaust port 22 and ventilation fan 2 located near 3
3, a heater 24, dampers 25, 26, an exhaust fan 27, and an intake port 28. Also, 3 is a top plate to increase circulation efficiency.

被試験装置1の通常動作時には、室内の空気又
は床下からの冷却空気をフアン12で吸込み、排
気口14から室内又は排気ダクトに放出する。
During normal operation of the device under test 1, indoor air or cooling air from under the floor is sucked in by the fan 12 and discharged from the exhaust port 14 into the room or into the exhaust duct.

高温試験時には図示の如くに空気循環装置を位
置せしめ、矢印の如く空気を循環することにより
温度上昇を行わせる。温度上昇を早めるためにヒ
ータ24を併用してもよい。
During a high temperature test, an air circulation device is positioned as shown in the figure, and the temperature is raised by circulating air as shown by the arrow. A heater 24 may also be used to speed up the temperature rise.

また温度が上昇しすぎた場合、若しくは室温試
験を行なう場合には第2図の如く、ダンパ25に
より循環路を塞ぎ、排気フアン27により排気を
行ない、ダンパ26を開いて室内の空気を吸入す
る。
In addition, if the temperature rises too much or if a room temperature test is to be performed, the circulation path is blocked by the damper 25, exhaust is performed by the exhaust fan 27, and the damper 26 is opened to suck in room air, as shown in Figure 2. .

第3図は上記実施例の上面図であり、空気循環
装置2は被試験装置の長手方向に沿つて複数のユ
ニツト2a,2b,2c……2d,2e,2f…
…に分かれていて、その内の1つ(例えば2a)
がマスタユニツト、他がスレーブユニツトとな
る。マスタユニツトには温度異常検出系等、また
外部装置とのインタフエースが集中管理され、ス
レーブユニツトは単にマスタユニツトにコードを
差し込むのみで何台でも接続できる。従つて被試
験装置1の長さに応じて必要な台数のスレーブユ
ニツトを連結して試験することができる。
FIG. 3 is a top view of the above embodiment, and the air circulation device 2 has a plurality of units 2a, 2b, 2c, . . . 2d, 2e, 2f, . . . along the longitudinal direction of the device under test.
It is divided into ..., and one of them (for example, 2a)
becomes the master unit, and the others become slave units. The master unit centrally controls the temperature abnormality detection system and interfaces with external devices, and any number of slave units can be connected by simply inserting a cord into the master unit. Therefore, depending on the length of the device under test 1, a necessary number of slave units can be connected and tested.

また電子計算機全体を動作させ、一部の装置の
みを高温にして試験することもできる。
It is also possible to operate the entire computer and test only some devices at high temperatures.

また構造が簡単なため分解、組立も容易であ
り、装置の納入先においても試験を行なうことが
できる。
Furthermore, since the structure is simple, it is easy to disassemble and assemble, and testing can be performed even at the destination where the device is delivered.

また床下空調方式の場合には床穴を塞いだ方が
本方式に効率は良くなるが、被試験装置1と空気
循環装置2との間の気密がある程度以上保たれれ
ば特に床穴を塞がずとも冷気の混入は無視でき
る。
In addition, in the case of an under-floor air conditioning system, the efficiency of this system will be better if the floor holes are blocked, but if the airtightness between the device under test 1 and the air circulation device 2 is maintained above a certain level, the floor holes should be blocked. Naturally, the intrusion of cold air can be ignored.

以上の如く本発明では装置自身の発熱を利用す
るため、省エネルギーで高温試験が行なえ、また
上述の如く融通性のある使用方法がとれるという
大きな効果を有する。
As described above, the present invention utilizes the heat generated by the device itself, so it has the great effect of being able to perform high-temperature tests with energy savings, and also allowing for flexible usage as described above.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明の一実施例であり、第1図は循環中
の断面図、第2図は開放中の断面図、第3図は上
面図である。 図中1は被試験装置、2は空気循環装置であ
る。
The figures show one embodiment of the present invention, with FIG. 1 being a sectional view during circulation, FIG. 2 being a sectional view during opening, and FIG. 3 being a top view. In the figure, 1 is the device under test, and 2 is the air circulation device.

Claims (1)

【特許請求の範囲】[Claims] 1 内部に発熱部品を有し、外部から与えられる
冷却空気を吸気口から取り入れ、排気口から排出
して内部を冷却する如く構成された被試験装置の
温度試験方式において、上記被試験装置に空気の
循環装置を取付け、該空気循環装置は上記被試験
装置の排気口からの排気を上記吸気口へ循環させ
る送風手段を有し、もつて上記被試験装置自体の
発熱を利用して高温を得ることを特徴とする温度
試験方式。
1. In a temperature test method for a device under test that has heat-generating parts inside and is configured such that cooling air supplied from the outside is taken in from the intake port and exhausted from the exhaust port to cool the inside, air is supplied to the device under test. A circulation device is installed, and the air circulation device has a blowing means for circulating the exhaust air from the exhaust port of the device under test to the intake port, thereby obtaining a high temperature by utilizing the heat generated by the device under test itself. A temperature test method characterized by:
JP55133788A 1980-09-26 1980-09-26 Temperature test system Granted JPS5759256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55133788A JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55133788A JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Publications (2)

Publication Number Publication Date
JPS5759256A JPS5759256A (en) 1982-04-09
JPS6125171B2 true JPS6125171B2 (en) 1986-06-14

Family

ID=15113015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55133788A Granted JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Country Status (1)

Country Link
JP (1) JPS5759256A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2536518B1 (en) * 1982-11-19 1987-06-05 Thomson Csf Mat Tel HEATING ENCLOSURE FOR TEST OF TEMPERATURE TERMINALS
JPS59206208A (en) * 1983-05-09 1984-11-22 Bridgestone Corp Pneumatic tire suitable for ice-snow road
JPS61165649A (en) * 1984-12-11 1986-07-26 Fujitsu Ltd Temperature testing apparatus
JP2511205Y2 (en) * 1989-06-16 1996-09-25 株式会社藤田製作所 Burn-in processing device
CN113514969B (en) * 2021-07-07 2023-09-15 福建省德盈电子有限公司 Aging test device for manufacturing liquid crystal display module and application method thereof

Also Published As

Publication number Publication date
JPS5759256A (en) 1982-04-09

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