JPH0322579B2 - - Google Patents

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Publication number
JPH0322579B2
JPH0322579B2 JP58020903A JP2090383A JPH0322579B2 JP H0322579 B2 JPH0322579 B2 JP H0322579B2 JP 58020903 A JP58020903 A JP 58020903A JP 2090383 A JP2090383 A JP 2090383A JP H0322579 B2 JPH0322579 B2 JP H0322579B2
Authority
JP
Japan
Prior art keywords
temperature
gas supply
humidity
gas
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58020903A
Other languages
Japanese (ja)
Other versions
JPS59145949A (en
Inventor
Shozo Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kusumoto Chemicals Ltd
Original Assignee
Kusumoto Chemicals Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kusumoto Chemicals Ltd filed Critical Kusumoto Chemicals Ltd
Priority to JP58020903A priority Critical patent/JPS59145949A/en
Publication of JPS59145949A publication Critical patent/JPS59145949A/en
Publication of JPH0322579B2 publication Critical patent/JPH0322579B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00Investigating resistance of materials to the weather, to corrosion, or to light

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  • Life Sciences & Earth Sciences (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Ecology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Environmental Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Air-Conditioning Room Units, And Self-Contained Units In General (AREA)
  • Central Air Conditioning (AREA)

Description

【発明の詳細な説明】 本発明は小型精密機器やその機器部品、或いは
IC、LSI等の電子部品などの恒温試験、耐寒試
験、耐湿試験や温度サイクル試験等の熱雰囲気、
或いは湿度雰囲気に対する耐久性、強土等の試験
を、試験室内にて高温域から極低温域或いは恒温
域までの範囲に切換えて実施できるようにした熱
雰囲気試験装置に関するものである。
[Detailed Description of the Invention] The present invention relates to small precision equipment, equipment parts thereof, or
Heat atmosphere for constant temperature tests, cold resistance tests, moisture resistance tests, temperature cycle tests, etc. of electronic components such as ICs and LSIs,
Alternatively, the present invention relates to a thermal atmosphere testing device that allows testing of durability against a humid atmosphere, strong soil, etc. in a test chamber by switching the range from a high temperature range to an extremely low temperature range or a constant temperature range.

従来、精密機器や電子部品等についての熱雰囲
気試験、或いは湿度雰囲気試験を行なう装置にあ
つては、試験室内に設置の空調部冷却器内を流れ
る冷媒が約150℃付近で分解するため、その温度
近くが限界高温域とされていた。従つて極低温か
ら高温までの温度サイクル試験、或は耐湿試験で
は150℃を越える条件となる場合別に高温用試験
機を使用して行なつている。そのために連続自動
試験等を行うには二槽を必要とし、熱衝撃試験機
等によつて温度サイクル試験を行つているが、耐
湿試験を併用する場合には自動サイクル試験を行
うことは困難である。
Conventionally, in equipment that conducts thermal atmosphere tests or humidity atmosphere tests on precision instruments and electronic components, the refrigerant flowing through the air conditioning cooler installed in the test room decomposes at around 150°C. The area near the temperature was considered to be the critical high temperature range. Therefore, temperature cycle tests from extremely low temperatures to high temperatures or humidity tests are conducted using a high temperature testing machine, depending on the conditions where the temperature exceeds 150°C. For this purpose, two tanks are required to perform continuous automatic tests, and temperature cycle tests are performed using thermal shock testers, etc. However, it is difficult to perform automatic cycle tests when humidity tests are also used. be.

そこで、従来、例えば特公昭36−14442号公報
のように扉状をピストンとダンパの組合せを用い
て加熱室と冷却室との気体の流れを切り換える構
成や、実開昭54−121659号公報及び特開昭58−
58437号公報等のようにダンパを用いて切り換え
る構成が知られている。
Therefore, conventionally, for example, Japanese Patent Publication No. 36-14442 discloses a structure in which the gas flow between the heating chamber and the cooling chamber is switched using a combination of a piston and a damper in the shape of a door, and Japanese Utility Model Publication No. 54-121659 and Unexamined Japanese Patent Publication 1983-
A configuration in which switching is performed using a damper is known, such as in Japanese Patent No. 58437.

しかし、前者の構成では測定室を中央とし、そ
の両側に冷却室と加熱室とを配置したので装置自
体が大型化すると共に、ピストンで気体を測定す
る側に押し流す必要があり構造が複雑化する欠点
がある。
However, in the former configuration, the measurement chamber is placed in the center, and the cooling chamber and heating chamber are arranged on both sides, which increases the size of the device itself, and requires a piston to push the gas toward the side to be measured, making the structure complicated. There are drawbacks.

また後二者の構造では、小型化は可能である
が、ダンパで閉止した際に各室内で気体を循環す
ることができない欠点があり、温湿度の変化を効
率的に行えない欠点があつた。
In addition, although the latter two structures allow for miniaturization, they have the disadvantage that gas cannot be circulated within each room when the chamber is closed with a damper, and temperature and humidity changes cannot be made efficiently. .

この発明は上記事情に鑑みて創案されたもので
あつて、その主たる課題は、低温・調湿気体供給
室と、加熱手段を備えた高温気体供給室とを試験
室の一方に並べて一つの断熱構造にてなる試験室
内に配置して小型化を図ると共に、各室内にフア
ンと仕切体とを設けて、断熱扉の開閉にかかわら
ず気体を上記各室内で循環させて気体の温湿度が
不均一とならないようにして温湿度の維持及び変
化の効率を高めることにある。
This invention was devised in view of the above circumstances, and its main problem is to arrange a low temperature/humidity controlled gas supply chamber and a high temperature gas supply chamber equipped with a heating means on one side of a test chamber into a single insulation chamber. In addition, each chamber is equipped with a fan and a partition to circulate the gas in each chamber regardless of whether the insulating door is opened or closed, thereby maintaining the temperature and humidity of the gas. The purpose is to improve the efficiency of maintaining and changing temperature and humidity by preventing them from becoming uniform.

上記課題を達成するために、この発明では、 冷却手段及び調湿手段を備えた低温・調湿気体
供給室と、加熱手段を備えた高温気体供給室とを
試験室を循環する気体の吹出口および吸込口を共
通とするように試験室の一方に並べて一つの断熱
構造にてなる試験室内に配置し、両気体供給室の
それぞれの吸気口及び送気口に、外部からの制御
でいずれか一方の気体供給室側を閉じるように仕
換えられる断熱扉をそれぞれ設けた広域温湿度雰
囲気試験装置において、 (a) 低温・調湿気体供給室内に、冷却手段によつ
て冷却された低温気体または調湿手段により調
湿された気体を移動させるフアンを設ける、 (b) 断熱扉で低温・調湿気体供給室が密閉された
際に上記気体を該室内で循環させる第1仕切体
を設ける、 (c) 高温気体供給室内に加熱手段によつて加熱さ
れた高温気体を移動させるフアンを設ける、 (d) 断熱扉で高温気体供給室が密閉された際に上
記気体を該室内で循環させる第2仕切体を設け
る、という技術的手段を講じている。
In order to achieve the above object, the present invention provides a low-temperature/humidity-controlled gas supply chamber equipped with a cooling means and a humidity control means, and a high-temperature gas supply chamber equipped with a heating means. The two gas supply chambers are lined up on one side of the test chamber and have a single insulating structure so that the air inlets are common, and both gas supply chambers are connected to each other via external control. In a wide-area temperature/humidity atmosphere testing device each equipped with an insulated door that can be changed to close one side of the gas supply chamber, (a) low-temperature gas cooled by a cooling means or (b) providing a fan for moving the gas whose humidity has been controlled by the humidity control means; (b) providing a first partition that circulates the gas within the room when the low temperature/humidity controlled gas supply chamber is sealed with an insulating door; (c) A fan is provided in the high-temperature gas supply chamber to move the high-temperature gas heated by the heating means; (d) A fan is provided in the high-temperature gas supply chamber to circulate the gas within the chamber when the high-temperature gas supply chamber is sealed with an insulating door. A technical measure has been taken to provide two partitions.

従つて、試験室に供給される気体は断熱壁の開
閉制御によつて行なわれるが、該断熱扉の開閉に
関係なく、高温気体供給室及び低温・調湿気体供
給室は、それぞれの室内が仕切体により環状の気
体循環路が形成されているので室内の温湿度を均
一とすることができ試験室の雰囲気を迅速にむら
なく設定した温湿度に変更し、維持することがで
きる。
Therefore, gas is supplied to the test chamber by controlling the opening and closing of the insulating wall, but regardless of whether the insulating door is opened or closed, the high-temperature gas supply chamber and the low-temperature/humidity-controlled gas supply chamber are Since the annular gas circulation path is formed by the partition, the temperature and humidity in the room can be made uniform, and the atmosphere in the test room can be quickly and evenly changed to and maintained at the set temperature and humidity.

以下本発明装置について実施例を図面により詳
述すれば次の通りである。
Embodiments of the apparatus of the present invention will be described in detail below with reference to the drawings.

第1図乃至第3図に示すものは本発明装置の代
表的な一具体例であつで、主要部を断熱壁体2に
より囲繞して所要寸法の箱形躯体に形成した本体
1の内部は、前位置に所要容積の試験室3を設
け、この試験室3の後方には断熱仕切壁4によつ
て仕切られた高温気体供給室5と、更にその後部
に断熱仕切壁6でもつて仕切つた低温気体及び恒
湿気体供給室7を配してあり、試験室1の正面に
は試料の出し入れ口8を大きく設けて、ここに断
熱性を有する扉9が取付けてある。この試験室1
の内部には試料出し入れ口とほぼ同幅の寸法の
縦、横に交叉した整流板11を取付けた吹出口1
0を上部に、同様な横水平板を付けた吸込口12
を下部に取付けて後部の風洞部13,13′と仕
切つてある。
What is shown in FIGS. 1 to 3 is a typical specific example of the device of the present invention. A test chamber 3 with a required volume is provided in the front position, and a high temperature gas supply chamber 5 is partitioned at the rear of the test chamber 3 by a heat insulating partition wall 4, and further partitioned by a heat insulating partition wall 6 at the rear thereof. A low-temperature gas and constant-humidity gas supply chamber 7 is arranged, and a large sample entrance 8 is provided at the front of the test chamber 1, to which a door 9 having heat insulation properties is attached. This test room 1
Inside there is an air outlet 1 equipped with rectifier plates 11 that are vertically and horizontally crossed and have approximately the same width as the sample inlet/outlet.
Suction port 12 with 0 on the top and a similar horizontal horizontal plate
is attached to the lower part to separate it from the wind tunnel sections 13 and 13' at the rear.

試験室1の背後位置の高温気体供給室5の内部
にはヒーター14とフアン15とが配置されてお
り、フアン吐出口15′を上側風洞部13に向け
位置するように配してある。
A heater 14 and a fan 15 are arranged inside the high-temperature gas supply chamber 5 at the back of the test chamber 1, with the fan discharge port 15' facing the upper wind tunnel section 13.

上記フアン15の吐出口15′に対してと断熱
仕切壁4内面とフアン15及びヒータ14配置部
との間には適当な間隔をおいて高温気体循環路2
4が形成されるように仕切板24Aが設けられて
いる。
A high-temperature gas circulation path 2 is provided with an appropriate interval between the discharge port 15' of the fan 15, the inner surface of the heat insulating partition wall 4, and the fan 15 and heater 14 arrangement section.
24A of partition plates are provided so that 4 is formed.

更に該高温気体供給室5の後方に位置する低温
気体及び恒湿気体供給室7の内部には冷却機の蒸
発器(冷却用蒸発器16と調湿用蒸発器16′)
と、温度制御用ヒーター17及び調湿用加湿器1
8とが配置され、フアン19は吐出口19′を上
部出口7′に向けて配してあり、該フアン19の
吸込口19″に対してと、断熱仕切壁6内面と蒸
発器16,16′やヒーター17設置部との間に
は適当な間隔をおいて冷気循環路20が形成され
るように仕切板21が設けてある。更にフアン1
9の吐出口19′近くには温度検出端22と湿度
検出端23とを配し、遮断扉の開閉にかかわりな
く低温・恒湿気体供給室7内を常に一定の温・湿
度に保つように配慮してある。
Further, inside the low temperature gas and constant humidity gas supply chamber 7 located behind the high temperature gas supply chamber 5, there are evaporators of a cooler (a cooling evaporator 16 and a humidity control evaporator 16').
, a temperature control heater 17 and a humidity control humidifier 1
8 are arranged, and the fan 19 is arranged with the discharge port 19' facing the upper outlet 7', and the fan 19 has a suction port 19'' facing the inner surface of the heat insulating partition wall 6 and the evaporators 16, 16. A partition plate 21 is provided at an appropriate interval between the fan 1 and the heater 17 installation part so that a cold air circulation path 20 is formed.
A temperature detection end 22 and a humidity detection end 23 are arranged near the discharge port 19' of 9, so that the inside of the low temperature and constant humidity gas supply chamber 7 is always maintained at a constant temperature and humidity regardless of whether the shutoff door is opened or closed. It has been taken into consideration.

而して断熱仕切壁体6の上部送気口7′及び下
部吸気口7″には、高温気体供給室5と低温(恒
湿)気体供給室7とを切換えることができる断熱
構造をもつた遮断扉25,25′が設けてあり、
これら遮断25,25′は操作軸26,26′にそ
れぞれ基端を固着し、一端を断熱壁体外に突出さ
せて、これを本体1外側に配設した往復直線駆動
体(たとえばエアシリンダー)27,27′とリ
ンク機構28,28′とで各々繋ぎ、それぞれ90°
回動させて扉25,26′が切換えられて開閉す
るようになされている。これら各遮断扉25,2
5′は第3図に示す如く試験室1の風洞部断熱仕
切壁6側で回動するようになされており、シール
パツキン29を断熱仕切壁6面に当接して気密を
保つようになつている(高温域操作の場合)。従
つて、高温での運転を行つた場合でも、低温・恒
湿気体供給体7内は設定温度を保つていることが
できる。
The upper air supply port 7' and the lower air intake port 7'' of the heat insulating partition wall 6 have a heat insulating structure capable of switching between the high temperature gas supply chamber 5 and the low temperature (constant humidity) gas supply chamber 7. A blocking door 25, 25' is provided,
These shields 25, 25' have their base ends fixed to operating shafts 26, 26', respectively, and have one end protruding outside the heat insulating wall, and are connected to a reciprocating linear drive body (for example, an air cylinder) 27 disposed outside the main body 1. , 27' and link mechanisms 28, 28', each connected at 90°.
By rotating the door 25, 26', the doors 25, 26' can be opened and closed. Each of these blocking doors 25, 2
5' is designed to rotate on the side of the heat insulating partition wall 6 of the wind tunnel section of the test chamber 1, as shown in FIG. (for high-temperature operation). Therefore, even when operating at a high temperature, the temperature inside the low-temperature/constant-humidity gas supply body 7 can be maintained at the set temperature.

なお、本体1の下部は断熱壁体で仕切られて機
械室30とし、ここに前記低温・恒湿気体供給室
7の冷却機動力部やその凝縮器などが収納され、
本体側部には制御用電気機器などが配設されて試
験室内の各種機器や各機器などと繋いで操作でき
るようにしてある。
The lower part of the main body 1 is partitioned by a heat insulating wall to form a machine room 30, in which the cooling motor unit of the low-temperature/constant-humidity gas supply chamber 7, its condenser, etc. are housed.
Control electrical equipment is installed on the side of the main body so that it can be connected to and operated with various devices in the test room.

斯くの如く構成された本発明装置によれば、試
験室3の前面の扉9を開いてその内部に試料とな
る品物を入れ、その試料のテスト要件に従ちてそ
のまゝ静置し、または機器において外部から電動
部に通電(予め試験室の適所に通電用コンセント
(耐熱・耐湿のもの)を設けるか、リード線を外
部に出してリード線挿通孔をシールする)して、
熱雰囲気試験、耐湿試験、温度サイクル試験を行
うのであり、たとえば温度サイクル試験を行うに
ついては試料を試験室3に入れた後、先づ高温
(たとえば350℃)に曝すには高温気体供給室5と
低温・恒湿気体供給室7と遮断するため、遮断扉
25,25′を外部の往復直線駆動体27,2
7′による操作で起立状態にし、ヒーター14に
より加熱された高温気体がフアン15により風洞
部を通じ吹出口10より整流板11にて整流され
て試験室3内に吹き込まれ、試験室3の下部吸気
口12から吸込まれ、再び高温供給室5に入り加
熱される流れを形成し、この熱風の循環を所要時
間継続することによつて試料を設定の温度雰囲気
に保つのである。この際低温・恒温気体供給室7
は遮断扉25,25′によつてその出口及び入口
が閉じられているのでその室内は冷却機の駆動に
よる低温状態に保たれて、高温気流の流入による
影響を受けることはない。
According to the apparatus of the present invention configured as described above, the front door 9 of the test chamber 3 is opened, a sample is placed inside the door, and the sample is allowed to stand still in accordance with the test requirements for the sample. Alternatively, energize the motorized parts of the equipment from the outside (by providing a power outlet (heat-resistant and moisture-resistant) in an appropriate place in the test room in advance, or by extending the lead wires to the outside and sealing the lead wire insertion holes).
A thermal atmosphere test, a moisture resistance test, and a temperature cycle test are performed. For example, to perform a temperature cycle test, the sample is placed in the test chamber 3, and then to be exposed to a high temperature (for example, 350°C), it is placed in the high temperature gas supply chamber 5. In order to isolate the low temperature and constant humidity gas supply chamber 7 from the
7', the high temperature gas heated by the heater 14 is blown into the test chamber 3 through the wind tunnel section by the fan 15, rectified by the rectifier plate 11 from the outlet 10, and is blown into the test chamber 3. The hot air is sucked in from the port 12 and enters the high temperature supply chamber 5 again to form a heated flow, and by continuing this circulation for a required period of time, the sample is maintained at a set temperature atmosphere. At this time, low temperature/constant temperature gas supply chamber 7
Since the outlet and inlet of the chamber are closed by the shutoff doors 25, 25', the interior of the chamber is kept at a low temperature by the drive of the cooler and is not affected by the inflow of high-temperature air.

而して高温域での設定時間経過後直ちに低温
(たとえば−70℃)域に試料を曝すには、先づ高
温気体供給室5との連通を断つため、その出口
5′、入口5″を各遮断扉25,25′を外部から
の操作で(往復直線駆動体27,27′による前
記高温操作時と逆の作動により)閉鎖し、低温・
恒湿気体供給室7の出口7′と入口7″とを開き、
既に冷却機の運転により所要温度となつている低
温気体を試験室3内にフアン19により送気し、
吸気口12から吸引して高温気体の場合と同様循
環させ、所要時間継続することにより試料を設定
温度の低温雰囲気に保ち、所要のテストを行なう
ことができる。
Therefore, in order to expose the sample to a low temperature range (for example, -70°C) immediately after the set time in the high temperature range has elapsed, first, in order to cut off the communication with the high temperature gas supply chamber 5, the outlet 5' and the inlet 5'' are closed. Each cutoff door 25, 25' is closed by external operation (by the reciprocating linear drive body 27, 27' in the opposite operation to the high temperature operation), and the low temperature
Open the outlet 7′ and inlet 7″ of the constant humidity gas supply chamber 7,
The low-temperature gas, which has already reached the required temperature by operating the cooler, is sent into the test chamber 3 by the fan 19,
By suctioning through the suction port 12 and circulating it as in the case of high-temperature gas for a required period of time, it is possible to maintain the sample in a low-temperature atmosphere at the set temperature and perform the required test.

同様にして耐湿試験を行うには低温・恒湿気体
供給室7内を恒温恒湿状態に設定し(この場合主
として冷却用蒸発器16の作動を止めておき、加
湿器18及び調温ヒーター17を作動させる)、
遮断扉25,25′は高温気体供給室7の出口及
び入口を閉じた状態で気流を循環させれば、試料
を設定の雰囲気に保つてテストすることができる
のである。
Similarly, to conduct a humidity test, the inside of the low-temperature and constant-humidity gas supply chamber 7 is set to a constant temperature and humidity state (in this case, the operation of the cooling evaporator 16 is primarily stopped, and the humidifier 18 and temperature control heater 17 are ),
If the shutoff doors 25 and 25' are used to circulate the air flow with the outlet and inlet of the high temperature gas supply chamber 7 closed, the sample can be maintained in a predetermined atmosphere for testing.

これらのテストを行なつている間の各種データ
は試料に直接接続した測定機器のリード線や装置
に設けてある計器によつて測定し、また温度差等
によつて生ずる試料の外的結果を確認することが
でかきる。
Various data during these tests are measured using the lead wires of the measuring equipment directly connected to the sample and instruments installed in the equipment, and external results of the sample caused by temperature differences, etc. are also measured. You can check it out.

なお、温度サイクル試験を行うには予め設定し
たプログラムにより各温度雰囲気設定のためのヒ
ータや冷却機などの駆動を行なうと共に、遮断扉
の切換操作を行うようにすることで、冷気が高温
気体供給室に流入したり、或いは高温気流が低
温・恒湿気体供給室に流入して蒸発器を加熱し冷
媒を分解するようなことがなく、それぞれ気体供
給源に障害を起させることなく、従つて温度条件
の交換も容易に行ない得ることになつたのであ
る。勿論両気体供給室間は断熱仕切壁体及び遮断
扉による断熱効果によつてそれぞれへ熱移動が防
止でき、殊に試験室と高温気体供給室及び高低両
気体供給室とはそれぞれの仕切壁に沿つてそれぞ
れの供給室内での循環用空間部20又は24によ
り気体断熱層を形成し、熱移動の防止に役立ち得
ることになり、確実な操作が行えることになるの
である。
In addition, in order to perform a temperature cycle test, a preset program is used to drive the heaters and coolers for each temperature and atmosphere setting, and to switch the shutoff door so that cold air is supplied with high-temperature gas. or hot air flow into the cold, constant humidity gas supply chamber to heat the evaporator and decompose the refrigerant, respectively, without causing disturbance to the gas supply source; This also made it easier to exchange temperature conditions. Of course, heat transfer between the two gas supply chambers can be prevented by the heat insulating effect of the insulating partition wall and the shutoff door. In addition, the circulation space 20 or 24 in each supply chamber forms a gas insulation layer, which can help prevent heat transfer and ensure reliable operation.

叙上の如く本発明によれば、試料を試験室内に
定置して、この試験室に対し熱風を送り込んで循
環させることで高温に、また冷気を送り込むこと
で低温に、更に湿気を帯びた気体を送り込むこと
で恒湿状態に、それぞれ曝して試験することがで
き、それらはそれぞれの雰囲気に保つため気体供
給室がその出口及び入口を遮断扉を切換え開閉す
ることで直ちに所望の気体を試験室に供給循環で
き、その場合必ず不使用側の熱源が使用側の温度
雰囲気の影響を受けないようになるので、速やか
に設定温度に到達できると共に、殊に低温側の機
器に障害を起させることがないので、350℃程度
の高温域まで一基の試験装置でテストすることが
可能になり、従つて各種条件のテストプログラム
を組んでテストが行えるようになつたものであ
り、プログラム設定器或いはコンピユーターから
の入力にて自動制御ができる等多くの利点を具備
したものとなし得たものである。
As described above, according to the present invention, a sample is placed in a test chamber, hot air is sent into the test chamber and circulated to raise the temperature, cold air is sent into the test chamber to lower the temperature, and a humid gas is heated. Tests can be carried out by exposing each to a constant humidity condition, and in order to keep them in their respective atmospheres, the gas supply chamber shuts off the outlet and inlet, and by opening and closing the door, the desired gas is immediately released into the test chamber. In this case, the heat source on the unused side is always unaffected by the temperature atmosphere on the used side, so the set temperature can be quickly reached, and there is no possibility of causing trouble, especially to equipment on the low temperature side. This makes it possible to test up to a high temperature range of around 350°C with a single test device, and it has become possible to perform tests by creating test programs for various conditions, without using a program setting device or This system has many advantages such as automatic control based on input from a computer.

ちなみにプログラム制御では入力信号に応じて
高温、低温切換用遮断扉を高温側、低温側と切換
えられ、プログラムの温度勾配に応じて冷・熱風
を交互に試験室に送り込み所要のプログラムに従
つた運転もできるのである。なお手動による定値
制御も行い得ることは勿論である。
By the way, in program control, the high temperature/low temperature switching shutoff door can be switched between the high temperature side and the low temperature side according to the input signal, and cold and hot air are alternately sent into the test chamber according to the temperature gradient of the program, allowing operation according to the required program. You can also do it. It goes without saying that manual fixed value control can also be performed.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明装置の一実施例を示すものであつ
て、第1図は機械収容部を除く縦断面図、第2図
は外側面図、第3図は要部の拡大断面図である。 1……本体、2……断熱壁体、3……試験室、
4,6……断熱仕切壁、5……高温気体供給室、
7……低温・恒湿気体供給室、9……扉、10…
…吹出口、12……吸込口、14……ヒーター、
15,19……フアン、16……冷却用蒸発器、
16′……調湿用蒸発器、17……温度制御用ヒ
ーター、18……調湿用加湿器、20……冷気循
環路、24……高温気体循環路、25,25′…
…遮断扉、27,27′……扉操作用の往復直線
駆動体、28,28′……リンク機構。
The drawings show an embodiment of the apparatus of the present invention, in which FIG. 1 is a longitudinal cross-sectional view excluding the machine storage section, FIG. 2 is an external side view, and FIG. 3 is an enlarged cross-sectional view of the main parts. 1...Main body, 2...Insulating wall, 3...Test chamber,
4, 6...Insulating partition wall, 5...High temperature gas supply chamber,
7...Low temperature/constant humidity gas supply room, 9...Door, 10...
...Air outlet, 12...Suction port, 14...Heater,
15, 19...fan, 16...cooling evaporator,
16'... Evaporator for humidity control, 17... Heater for temperature control, 18... Humidifier for humidity control, 20... Cold air circulation path, 24... High temperature gas circulation path, 25, 25'...
...Block door, 27, 27'... Reciprocating linear drive body for door operation, 28, 28'... Link mechanism.

Claims (1)

【特許請求の範囲】 1 冷却手段及び調湿手段を備えた低温・調湿気
体供給室と、加熱手段を備えた高温気体供給室と
を試験室を循環する気体の吹出口および吸込口を
共通とするように試験室の一方に並べて一つの断
熱構造にてなる試験室内に配置し、両気体供給室
のそれぞれの吸気口及び送気口に、外部からの制
御でいずれか一方の気体供給室側を閉じるように
切換えられる断熱扉をそれぞれ設けた広域温湿度
雰囲気試験装置において、 低温・調湿気体供給室内に、冷却手段によつて
冷却された低温気体または調湿手段により調湿さ
れた気体を移動させるフアンを設けると共に、断
熱扉で低温・調湿気体供給室が密閉された際に上
記気体を該室内で循環させる仕切体を設け、 高温気体供給室内に加熱手段によつて加熱され
た高温気体を移動させるフアンを設けると共に、
断熱扉で高温気体供給室が密閉された際に上記気
体を該室内で循環させる仕切体を設けてなること
を特徴とする広域温湿度雰囲気試験装置。
[Scope of Claims] 1. A low-temperature/humidity-controlled gas supply chamber equipped with a cooling means and a humidity control means and a high-temperature gas supply chamber equipped with a heating means have a common blow-off port and suction port for the gas circulating in the test chamber. The two gas supply chambers are arranged in a test chamber with a single heat insulating structure, and are connected to one of the gas supply chambers under external control at the respective intake ports and air supply ports of both gas supply chambers. In a wide-area temperature/humidity atmosphere testing device each equipped with an insulated door that can be switched to close the side, low-temperature gas cooled by a cooling means or gas whose humidity is controlled by a humidity control means is placed in a low-temperature/humidity-controlled gas supply chamber. In addition to providing a fan to move the gas, a partition body is provided to circulate the above-mentioned gas within the low temperature/humidity controlled gas supply chamber when the chamber is sealed with an insulating door, and the gas heated by the heating means is provided in the high temperature gas supply chamber. In addition to installing a fan to move high-temperature gas,
A wide-area temperature/humidity atmosphere testing device characterized by being provided with a partition that circulates the gas within the high-temperature gas supply chamber when the high-temperature gas supply chamber is sealed with a heat insulating door.
JP58020903A 1983-02-09 1983-02-09 Wide area temperature and humidity atmosphere testing device Granted JPS59145949A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58020903A JPS59145949A (en) 1983-02-09 1983-02-09 Wide area temperature and humidity atmosphere testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58020903A JPS59145949A (en) 1983-02-09 1983-02-09 Wide area temperature and humidity atmosphere testing device

Publications (2)

Publication Number Publication Date
JPS59145949A JPS59145949A (en) 1984-08-21
JPH0322579B2 true JPH0322579B2 (en) 1991-03-27

Family

ID=12040186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58020903A Granted JPS59145949A (en) 1983-02-09 1983-02-09 Wide area temperature and humidity atmosphere testing device

Country Status (1)

Country Link
JP (1) JPS59145949A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014145668A (en) * 2013-01-29 2014-08-14 Toyota Central R&D Labs Inc Cooling/heating device and method for controlling temperature of cooling/heating device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0527013Y2 (en) * 1985-08-07 1993-07-08
JPH0743311B2 (en) * 1986-10-24 1995-05-15 ヤマト科学株式会社 Constant temperature / constant humidity tester
JPS63158472A (en) * 1986-12-23 1988-07-01 Orion Mach Co Ltd Thermal shock tester
JP2511205Y2 (en) * 1989-06-16 1996-09-25 株式会社藤田製作所 Burn-in processing device
JPH0650877A (en) * 1992-07-06 1994-02-25 Orion Mach Co Ltd Environmental test apparatus
JP3580637B2 (en) * 1996-05-29 2004-10-27 東光電気株式会社 Weathering test equipment for power distribution enclosures
CN103528166B (en) * 2013-10-17 2016-06-08 深圳麦克维尔空调有限公司 The testing method of air-conditioning system cold-starting
CN103994967B (en) * 2014-05-15 2016-08-17 东莞市升微机电设备科技有限公司 Ozone-induced cracking aging testing instrument
JP6916345B2 (en) * 2016-09-21 2021-08-11 東洋リビング株式会社 Storehouse

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5858437A (en) * 1981-10-02 1983-04-07 Tabai Seisakusho:Kk Cold and hot cycle apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54121659U (en) * 1978-02-15 1979-08-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5858437A (en) * 1981-10-02 1983-04-07 Tabai Seisakusho:Kk Cold and hot cycle apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014145668A (en) * 2013-01-29 2014-08-14 Toyota Central R&D Labs Inc Cooling/heating device and method for controlling temperature of cooling/heating device

Also Published As

Publication number Publication date
JPS59145949A (en) 1984-08-21

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