JPS5849817B2 - Thermal atmosphere test equipment - Google Patents

Thermal atmosphere test equipment

Info

Publication number
JPS5849817B2
JPS5849817B2 JP14129081A JP14129081A JPS5849817B2 JP S5849817 B2 JPS5849817 B2 JP S5849817B2 JP 14129081 A JP14129081 A JP 14129081A JP 14129081 A JP14129081 A JP 14129081A JP S5849817 B2 JPS5849817 B2 JP S5849817B2
Authority
JP
Japan
Prior art keywords
temperature
chamber
test chamber
sample
outlet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14129081A
Other languages
Japanese (ja)
Other versions
JPS5842952A (en
Inventor
昭三 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON SAAMITSUKU KK
Original Assignee
NIPPON SAAMITSUKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
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Application filed by NIPPON SAAMITSUKU KK filed Critical NIPPON SAAMITSUKU KK
Priority to JP14129081A priority Critical patent/JPS5849817B2/en
Publication of JPS5842952A publication Critical patent/JPS5842952A/en
Publication of JPS5849817B2 publication Critical patent/JPS5849817B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/60Investigating resistance of materials, e.g. refractory materials, to rapid heat changes

Description

【発明の詳細な説明】 本発明は小型精密機器やその機器部品、或いは電子部品
等の熱的衝撃や温度サイクル等熱雰囲気に対する耐久性
、強度等の試験を、試験室内にて試料の移動を行なうこ
となしに、高温域から低温域までの範囲に切換えて実施
できるようにした熱雰囲気試験装置に関するものである
[Detailed Description of the Invention] The present invention tests the durability and strength of small precision equipment, their equipment parts, electronic parts, etc. against thermal atmospheres such as thermal shock and temperature cycles by moving the sample within the test chamber. The present invention relates to a thermal atmosphere test device that allows testing to be performed by switching from a high temperature range to a low temperature range without having to perform a test.

従来、精密機器など並びにその部品等について、熱衝撃
試験や温度サイクル試験を行なうには、目的の試料をそ
の形状等に応じて試料支持枠または?ゴに入れて、これ
を試験内容に応じ高温に保ったチャンバーから低温に保
ったチャンバーへ、或いはその逆にと、試料を移動させ
る方式、または試料を収めたものを固定して高温チャン
バーや低温チャンバーを移動させる方式の試験装置が採
用されている。
Conventionally, in order to perform thermal shock tests and temperature cycle tests on precision instruments and their parts, the target sample has been placed in a sample support frame or a sample support frame depending on its shape. Depending on the test content, the sample is moved from a high-temperature chamber to a low-temperature chamber, or vice versa. A testing device that moves the chamber is used.

しかし乍ら、従来の方式によれば試料をカコ、又は支持
枠内に収納するため、試験中に試料がはみ出したり、特
に小型の部品などの試料の場合落ちこぼれなどが生ずる
However, according to the conventional method, the sample is stored in a cage or a support frame, which causes the sample to protrude during the test, and especially when the sample is a small part, the sample may fall off.

更に試料移動方式のものでは試料が移動するために、試
料の測定、通電(機器類で通電状態で試験をするような
場合)がやりにくく、かつ試料に震動を与えることにな
るので正常なデータが得られにくい。
Furthermore, with the sample moving method, since the sample moves, it is difficult to measure the sample and energize it (when testing with equipment in the energized state), and it also causes vibrations to the sample, making it difficult to obtain normal data. is difficult to obtain.

その上支持枠を移動させるのでその機構が複雑になって
高価なものとなり、取扱いも不便である。
Moreover, since the support frame is moved, the mechanism becomes complicated and expensive, and handling is also inconvenient.

また試料固定方式のものでは、試料の測定、通電などは
容易となり、震動も少なくなるが、高温、低温の各チャ
ンバーを移動させることにな石ので構造並びに機構が大
型化して、これも高価につき取扱いも不便である。
In addition, with the sample fixation method, it is easier to measure the sample, apply electricity, etc., and there is less vibration, but the structure and mechanism become larger because of the need to move the high temperature and low temperature chambers, which is also expensive. It is also inconvenient to handle.

このように従来採用されている試験装置においては種々
の問題点を有し、実用上精度の高いテストが行ない難い
As described above, the conventionally employed test apparatuses have various problems, and it is difficult to perform highly accurate tests in practice.

本発明は従来の問題点を解決して、試料を試験室内に定
置した状態で、該試験室に対して高温又は低温のいずれ
か並びに室温の各雰囲気となるよう、加熱源又は冷却源
からの気流を切換えて、これら操作を外部からの指令に
より所要の設定条件に基づき容易に実施できるようにし
たものである。
The present invention solves the conventional problems, and when a sample is placed in a test chamber, it is possible to provide a high or low temperature or a room temperature atmosphere to the test chamber from a heating source or a cooling source. By switching the airflow, these operations can be easily performed based on required setting conditions by external commands.

本発明は冷却手段及びこの冷却手段により冷却された低
温の気体を移動させるファンを備えた低温気体供給室と
、加熱手段及びこの加熱手段により加熱された高温の気
体を移動させるファンを備えた高温気体供給室と、前記
高温並び低温両気体供給室とに個々に開閉できる遮蔽を
介して繋がる試験室と、所要時外気が試験室に送り込ま
れるようにした外気との連通手段とを、試験室に対して
それぞれ断熱壁体で仕切り所要配置にて1個の箱体内に
組合せ、試験室に対する各気体供給室はそれぞれ試験室
の両端部にて入口と出口とを開口し、この各開口部には
低温側、高温側共に箱体外部から出口と入口とを同時に
開閉操作される断熱扉を付設し、試験室の前記気体出口
、入口位置の内側位置には整流板を配設し、試験室に対
する外気導入部はスクリーンの外側位置で開閉自在な小
扉を介して、或いは外気導入ファンによって行なわれる
ようにし、斯かる試験室の前面に試料の出入口扉を設け
たものである。
The present invention includes a low-temperature gas supply chamber equipped with a cooling means and a fan for moving the low-temperature gas cooled by the cooling means, and a high-temperature gas supply chamber equipped with a heating means and a fan for moving the high-temperature gas heated by the heating means. A test chamber that is connected to the gas supply chamber and both the high temperature and low temperature gas supply chambers through shields that can be opened and closed individually, and a means for communicating with outside air that allows outside air to be sent into the test chamber when necessary. Each gas supply chamber for the test chamber is partitioned with an insulating wall and assembled in a single box in the required arrangement, and each gas supply chamber for the test chamber has an inlet and an outlet at both ends of the test chamber. The test chamber is equipped with an insulating door that opens and closes the outlet and inlet simultaneously from the outside of the box on both the low-temperature and high-temperature sides, and a rectifier plate is installed inside the gas outlet and inlet positions of the test chamber. The outside air is introduced through a small door that can be opened and closed outside the screen or by an outside air introduction fan, and a sample entrance/exit door is provided at the front of the test chamber.

本発明にては試験室内の雰囲気を低温から高温又はその
逆の状態、或いは中間で室温にするなどの制御を、各扉
の開閉操作機構を予め設定した制御機構によって所定の
順序で開閉操作し、試験室内に入れた試料に対して所望
の温度を加えてテストが行なえるようにしたのである。
In the present invention, the opening/closing mechanism of each door is opened/closed in a predetermined order by a preset control mechanism to control the atmosphere in the test chamber from low temperature to high temperature or vice versa, or to room temperature in the middle. This made it possible to perform tests by applying the desired temperature to samples placed in the test chamber.

また本発明にては試料を試験室内に定置して高温又は低
温の気体を循環供給して所要の温度雰囲気中でテストで
きるようにし、高温又は低温にはその所要温度の気体供
給室出口入口の扉を外部からの操作で切換え開閉するこ
とで、試験室と各気体供給室とが直ちに断熱開閉できる
ように構成したのである。
In addition, in the present invention, the sample is placed in the test chamber, and high or low temperature gas is circulated and tested in an atmosphere at a desired temperature. By opening and closing the door by external operation, the test chamber and each gas supply chamber can be immediately opened and closed in adiabatic manner.

以下本発明装置について実施例を図面により詳述すれば
次の通りである。
Embodiments of the apparatus of the present invention will be described in detail below with reference to the drawings.

第1図乃至第5図に示すものは本発明装置の代表的な一
具体例であって、主要部を断熱壁体2により囲繞して所
要寸法の箱形躯体に形威した本体1の内部は、上部前位
置に所要容積の試験室10を設け、この試験室10の後
方には比較的容積の大きい低温気体供給室20を配し、
また試験室10の下部には高温気体供給室30を配して
あり、試験室10の正面には試料の出し入れ目11を大
きく設けて、ここに断熱性を有する扉12を取付けてあ
る。
What is shown in FIGS. 1 to 5 is a typical specific example of the device of the present invention, in which the main part is surrounded by a heat insulating wall 2 and the inside of a main body 1 is shaped into a box-shaped frame of required dimensions. A test chamber 10 with a required volume is provided in the upper front position, and a low-temperature gas supply chamber 20 with a relatively large volume is arranged at the rear of this test chamber 10.
A high-temperature gas supply chamber 30 is arranged in the lower part of the test chamber 10, and a large sample opening 11 is provided at the front of the test chamber 10, to which a door 12 having heat insulation properties is attached.

この試験室10の内部にはその試料出し入れ口11の横
幅とほぼ同程度の寸法で両側にパンチングメタルなどで
形成した整流板13を取付けて、試験室10の両端延長
部に形成した風洞部1 4 , 1 4’と仕切ってあ
る。
Inside the test chamber 10, rectifier plates 13 made of punched metal or the like are attached on both sides with dimensions approximately the same as the width of the sample inlet/outlet 11, and a wind tunnel section 1 is formed at both ends of the test chamber 10. It is divided into 4 and 1 4'.

斯かる試験室10の背後位置には低温チャンバー20が
形成されており、この低温チャンバー20内には冷却機
の蒸発器21と低温域の温度制御用ヒータ22とファン
23とが配設されており、試験室10に対しては仕切断
熱壁体2を貫通して風洞部1 4 , 1 4’にそれ
ぞれ開口する冷気人口24と冷気出口24′とが設けて
あり、前記のファン23の吐出口を冷気人口24に向け
位置するよう配してある。
A low-temperature chamber 20 is formed at the rear of the test chamber 10, and an evaporator 21 of a cooler, a heater 22 for temperature control in the low-temperature range, and a fan 23 are arranged in the low-temperature chamber 20. The test chamber 10 is provided with a cold air outlet 24 and a cold air outlet 24' which penetrate through the partitioning thermal wall 2 and open into the wind tunnel sections 14 and 14', respectively. The outlet is positioned so as to face the cold air population 24.

なお、ファン23の吸込口に対してと、仕切断熱壁体2
′内面と蒸発器21やヒータ22設置部との間には適当
な間隔をおいて冷気循環路が形成されるよう仕切板29
が設けてある。
In addition, with respect to the suction port of the fan 23 and with respect to the partitioning thermal wall body 2
'A partition plate 29 is provided between the inner surface and the evaporator 21 and the heater 22 installation part so that a cold air circulation path is formed with an appropriate interval.
is provided.

また試験室10の下側位置には前記低温チャンバー20
及び試験室10とそれぞれ断熱仕切壁体2′,2“にて
仕切られて高温チャンバー30が形成してあり、この高
温チャンバー30内にはヒータ31とファン32、及び
該ファン32の吸込口にヒータ31を通過した熱風が送
り込まれるよう、かつ該高温チャンバー30閉鎖時の循
環通路形成のための仕切板33とが設けてあり、試験室
10に対しては前記低温チャンバー30同様風洞部1
4 , 1 4’に対して熱風人口34及び熱風出口3
4′とを設け、該熱風人口34に対してファン32の吐
出口が対向するようになされている。
Further, the low temperature chamber 20 is located below the test chamber 10.
A high-temperature chamber 30 is formed by being partitioned from the test chamber 10 and the test chamber 10 by heat-insulating partition walls 2' and 2'', respectively. Inside this high-temperature chamber 30, there is a heater 31, a fan 32, and a suction port of the fan 32. A partition plate 33 is provided to allow the hot air that has passed through the heater 31 to be sent in and to form a circulation path when the high temperature chamber 30 is closed.
4, 14', hot air population 34 and hot air outlet 3
4', and the outlet of the fan 32 faces the hot air flow 34.

なお各ファン23,32の駆動モータ2 3’, 3
2’はいずれもチャンバー外に設置されている。
Note that the drive motors 2 3', 3 of each fan 23, 32
2' are both installed outside the chamber.

而して前記した低温チャンバー20と試験室10とを繋
ぐ冷気の入口24、出口24′、及び高温チャンバー3
0と試験室10とを繋ぐ、熱風の入口34、出口34′
にはそれぞれ断熱構造をもった遮断扉25,25’、及
び35,35’が付設してあり、これら遮断扉は冷気側
の遮断扉25,25’は1本の中実軸26に基端を固着
し、熱風側の遮断扉35,35’は該中実軸26に被嵌
する中空軸36に基端を固着して、この両軸26,36
を同一軸芯上で断熱壁体外に配した往復直線駆動体(例
えばエアシリンダー)27,37とリンク機構2 7’
, 3 7’とで各々繋ぎ、個々に900回動して扉
を開閉することができるようになっている。
The cold air inlet 24 and outlet 24' connecting the low temperature chamber 20 and the test chamber 10 described above, and the high temperature chamber 3
0 and the test chamber 10, an inlet 34 and an outlet 34' of hot air
are equipped with cut-off doors 25, 25' and 35, 35' each having a heat insulating structure. The hot air side blocking doors 35, 35' are fixed at their base ends to the hollow shaft 36 that fits into the solid shaft 26.
A reciprocating linear drive body (for example, an air cylinder) 27, 37 and a link mechanism 27' arranged on the same axis outside the heat insulating wall body.
, 3 and 7', and each can be rotated 900 times to open and close the door.

これらの各遮断扉25,25’又は35,35’は第5
図に示す如く試験室10隣接の風洞部14(又は14つ
側で回動するようになされており、シールパッキン4を
断熱壁面3に当接して気密を保つようにし、併せて低温
チャンバー20又は高温チャンバー30側との断熱仕切
壁体2′,2“の厚みに応じてチャンバー側との間に適
当な断熱空間部5又は5′を形成する仕切扉28又は3
8を下側基部で壁体に蝶着付設し、これら各遮断扉25
.25’(又は35,35つと仕切扉28(又は38)
とはそれぞれの対向する面の適所で連結棒39により可
動的に連結したのである。
Each of these blocking doors 25, 25' or 35, 35' is the fifth
As shown in the figure, the wind tunnel section 14 (or 14) adjacent to the test chamber 10 is configured to rotate, and the seal packing 4 is brought into contact with the heat insulating wall surface 3 to maintain airtightness. A partition door 28 or 3 that forms an appropriate heat insulating space 5 or 5' between the high temperature chamber 30 side and the chamber side depending on the thickness of the heat insulating partition wall 2', 2''.
8 is hinged to the wall at the lower base, and each of these shutoff doors 25
.. 25' (or 35, 35 and partition door 28 (or 38)
and are movably connected by connecting rods 39 at appropriate positions on their respective opposing surfaces.

また、試験室10の両側風洞部14,14’の前側位置
には該試験室10の運転中において室温状態にするため
の外気出入口6とこれを開閉する扉7とをそれぞれ設け
、この扉7はいずれも下端を本体1の一部に枢着して上
部で往復直線駆動体8により傾斜開閉する構或となって
いる。
Furthermore, at the front positions of both wind tunnel sections 14 and 14' of the test chamber 10, there are provided an outside air inlet/outlet 6 for bringing the test chamber 10 into a room temperature state during operation, and a door 7 for opening and closing it. Both have a structure in which the lower end is pivotally connected to a part of the main body 1, and the upper part is opened and closed at an angle by a reciprocating linear drive body 8.

そして一方の外気出入口6に対しては本体1外側上部に
付設した室温送入用ファン40の吐出側と連結するよう
通路が連絡してある。
A passage is connected to one outside air inlet/outlet 6 so as to be connected to the discharge side of a fan 40 for introducing room temperature attached to the outside upper part of the main body 1.

而して本体1の下部は断熱壁体で仕切られて機械室9と
し、ここに前記低温チャンバー20の冷却機動力部やそ
の凝縮器などが収納され、本体側部には制御用電気機器
などが収容されていて、遮断扉25,25’ ,35,
35’や室温導入用の扉7を操作する各機器、これに連
動する計器類等は制御機器と電気的に接続し、また計測
機器とも連動するようにしたものである。
The lower part of the main body 1 is partitioned by a heat insulating wall to form a machine room 9, in which the cooling motor part of the low temperature chamber 20, its condenser, etc. are housed, and the side of the main body contains control electrical equipment, etc. are accommodated, and the blocking doors 25, 25', 35,
35', each device that operates the door 7 for introducing room temperature, and instruments that operate in conjunction with these devices are electrically connected to the control device and are also interlocked with the measuring device.

なお、試験室10と高温チャンバー30や低温チャンバ
ー20との仕切壁体2′,2“には温度差に充分対応で
きて伝熱抵抗の大なる構成にした断熱材を使用し、室内
の条件が特定に保たれるようなされている。
The partition walls 2' and 2'' between the test chamber 10 and the high-temperature chamber 30 and low-temperature chamber 20 are made of heat insulating material that can sufficiently cope with temperature differences and has a large heat transfer resistance. has been kept specific.

また、本発明装置の各部の配置については上記の具体例
が最もコンパクトにまとめられて好適な構成であるが、
これに限定されるものではなく、必要に応じて他の状態
に組合せて構成することも任意なし得る。
Furthermore, regarding the arrangement of each part of the device of the present invention, the above specific example is the most compact and preferable configuration;
The present invention is not limited to this, and may be configured in combination with other states as necessary.

斯くの如く構成された本発明装置によれば、試験室10
の前面の扉12を開いてその内部に試料となる物品を入
れ、その試料のテスト要件に従ってそのまま静置し、ま
たは機器において外部から電動部に通電して(予め扉1
2若しくは試験室の適所に通電用のコンセント(耐熱、
耐寒性を有するもの)を設けておくか、シールできる構
造を付して外部にリード線を引出せるようにしておく)
、熱雰囲気試験を行なうのであり、たとえば熱衝撃試験
を行なうについては試料を試験室10に入れた後、先づ
高温(例えば200℃)に曝らすには高温チャンバー3
0との出口34′人口34の遮断扉35.35’を外部
からの操作(往復直線駆動体37による作動)で開き、
高温チャンバー30を試験室10に連通させ、ファン3
2により該チャ?バー30内にて予め加熱されている熱
風を入口34から風洞部14内に送り込み、整流板13
を通し整流して試験室10の反対側整流板13から風洞
部14′を経て出口34′より再び高温チャンパー30
に入る流れを造り、この熱風の循環を所要時間続けるこ
とによって試料を設定の温度雰囲気に保つ。
According to the apparatus of the present invention configured as described above, the test chamber 10
Open the front door 12 of the device, place the sample inside, and leave it as it is according to the test requirements for the sample, or energize the motorized part from the outside of the device (preliminarily close the door 12).
2 or a power outlet (heat resistant,
(cold resistant) or have a sealable structure so that the lead wires can be pulled out to the outside)
For example, when performing a thermal shock test, the sample is placed in the test chamber 10 and then exposed to a high temperature (for example, 200°C) in the high temperature chamber 3.
0 and the exit 34' are opened by external operation (operation by the reciprocating linear drive body 37),
The high temperature chamber 30 is communicated with the test chamber 10, and the fan 3
2, the corresponding cha? Hot air preheated inside the bar 30 is sent into the wind tunnel section 14 from the inlet 34, and the current plate 13
The flow is rectified through the rectifying plate 13 on the opposite side of the test chamber 10, passes through the wind tunnel section 14', and returns to the high temperature chamber 30 from the outlet 34'.
The sample is maintained at a set temperature atmosphere by creating a flow that enters the sample and continuing this circulation of hot air for the required time.

この際低温チャンバー20側はその遮断2 5 , 2
5’により入口出口が閉じられているよう制御する。
At this time, the low temperature chamber 20 side is blocked 2 5 , 2
5' controls the inlet and outlet to be closed.

この高温域での設定時間経過後直ちに低温(例えば−6
5℃)に曝すには、先づ高温チャンパー30との連通を
断つため、その出口34′、入口34を各遮断扉3 5
, 3 5’にて閉鎖し、次いで低温チャンバー20
と試験室10とを連通させるためその人口24出口24
′の遮断扉25,25’を外部からの操作で(高温側と
同様に往復直線駆動体27による作動で)開き、低温チ
ャンバー20を試験室10に連通させ、ファン23によ
り入口24から出口24′を介して低温チャンバー20
と試験室10との間に冷風を循環させ、所要時間続ける
ことによって試料を設定の温度雰囲気に保ち、この間の
温度変化による試料に対しての所要データを測定し、ま
た温度差によって生ずる試料の外的結果を確認すること
ができるのである。
Immediately after the set time in this high temperature range has elapsed,
5°C), first close the outlet 34' and inlet 34 of the high-temperature chamber 30 to cut off the communication with the high-temperature chamber 30 through the respective shut-off doors 3-5.
, 3 5', and then the cold chamber 20
In order to communicate the test room 10 with the population 24 exit 24
The cut-off doors 25, 25' are opened by external operation (by the reciprocating linear drive unit 27 in the same way as for the high-temperature side), the low-temperature chamber 20 is communicated with the test chamber 10, and the fan 23 connects the inlet 24 to the outlet 24. ’ through the cold chamber 20
By circulating cold air between the test chamber 10 and the test chamber 10, the sample is maintained at a set temperature atmosphere for a required period of time, and the necessary data for the sample due to temperature changes during this period is measured, and the required data for the sample due to temperature differences is measured. You can check the external results.

また温度サイクル試験などを行なうにはたとえば室温か
ら所要の時間で次第に高温に、そして所要時間高温を維
持した後所要の時間で次第に室温に下げ、その後低温に
、そして所要時間低温を維持して室温に戻す等の操作を
行なうに際して、高温及び低温にするには前記と同要領
にて行ない、室温にするには風洞部1 4 , 1 4
’前壁部に設けられた扉7,7を開くと共に室温送入用
ファン40を駆動して試験室10内に外気を流動させ、
試料を室温に曝してテストすることになるのである。
In addition, to perform a temperature cycle test, for example, the temperature is gradually increased from room temperature to a high temperature for the required time, then the high temperature is maintained for the required time, and then the temperature is gradually lowered to the room temperature for the required time, then the temperature is lowered to a low temperature, and the low temperature is maintained for the required time and the temperature is lowered to the room temperature. When performing operations such as returning to room temperature, use the same procedure as above to bring the temperature to high and low temperatures, and use the wind tunnel sections 14, 14 to bring the temperature to room temperature.
'Open the doors 7, 7 provided on the front wall and drive the room temperature supply fan 40 to flow outside air into the test chamber 10,
The test involves exposing the sample to room temperature.

なお、高温、並びに低温における温度調節についてはヒ
ータ22,31の放熱量を加減することにより温度設定
が正確に行なえる。
Note that temperature adjustment at high and low temperatures can be accurately set by adjusting the amount of heat released by the heaters 22 and 31.

従って上記したように高温、或いは低温、又は室温と所
定のテストの条件に合せて制御するのに電気的制御機構
を用いて試験室10に対する各部の扉の開閉を予め設定
したプログラムに応じ順次作動するようにし、これに熱
源の制御や計測機器を接続連動させることで種々の雰囲
気試験が行なえるようになったのである。
Therefore, as mentioned above, an electrical control mechanism is used to control the high temperature, low temperature, or room temperature according to the predetermined test conditions, and the doors of each part of the test chamber 10 are sequentially opened and closed according to a preset program. By connecting and interlocking heat source control and measuring equipment to this, it became possible to perform various atmospheric tests.

而して試験室10に対して低温、高温の両チャンバー2
0,30との各気体出口、入口は、遮断扉2 5 ,
2 5’又は3 5 , 3 5’にそれぞれ仕切扉2
8又は38が連結棒39を介して連動するよう設けられ
ているので、閉扉時には仕切壁体の厚みの範囲内で遮断
扉と仕切扉との間の空間部5又は5′により気体断熱層
を形成し、試験室1o内に不使用時のチャンバー側との
熱移動を防止し、確実な操作が行なえるのである。
Therefore, both the low temperature and high temperature chambers 2 are connected to the test chamber 10.
Each gas outlet and inlet with 0, 30 is provided with a blocking door 2 5 ,
Partition door 2 at 2 5' or 3 5, 3 5' respectively
8 or 38 are provided so as to be interlocked via the connecting rod 39, so that when the door is closed, a gas insulation layer is formed in the space 5 or 5' between the blocking door and the partition door within the thickness of the partition wall. This prevents heat transfer to and from the chamber side when not in use within the test chamber 1o, allowing reliable operation.

叙上の如く本発明によれば、試料を試験室内に定置して
、この試験室に対して熱風を送り込んで循環させること
で高温に、また冷気を送り込んで循環させることで低温
に、更に外気を送り込むことで室温に、それぞれ曝して
試験することができ、これらは室温を除いて装置内に組
込んだ高温気体供給室又は冷温気体供給室と遮断扉を切
換開閉することで、直ちに所望の気体を試験室内に供給
循環できて温度設定が速やかに行なえ、試料は定置して
テストできるから、試料のハミ出し、落こぼれ、耐震動
性の確保、通電状態でのテストの安定化、測定の容易さ
など、従来の試験器では多くの難点があったものをすべ
て解消し、しかも循環気体は試験室の入口と出口との間
で整流板によって流れの安定性が計られ試料に対する気
体の流れが?定することにより温度精度が著しく向上し
、しかも全体構成が比較的簡素化できて取扱いも容易に
なる等多くの利点を具備したものとなし得たのである。
As described above, according to the present invention, a sample is placed in a test chamber, hot air is sent into the test chamber and circulated to raise the temperature, cold air is sent into the test chamber and circulated to lower the temperature, and the outside air is cooled to a low temperature. Tests can be carried out by exposing the gas to room temperature, and by switching between opening and closing the high-temperature gas supply chamber or cold gas supply chamber built into the device and the shutoff door, the desired temperature can be immediately tested. Gas can be supplied and circulated in the test chamber, temperature can be set quickly, and the sample can be tested in a fixed position, which prevents the sample from sticking out, spilling, ensuring earthquake resistance, stabilizing tests under energized conditions, and making measurements easier. Many of the problems with conventional testers, such as ease of use, have been overcome, and in addition, the stability of the circulating gas flow is measured by a current plate between the inlet and outlet of the test chamber, and the gas flow towards the sample is improved. but? By setting the temperature accuracy, the temperature accuracy is significantly improved, and the overall structure can be relatively simplified and handling becomes easier.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明装置の一実施例を示すものであって、第1
図は機械収容部を除く縦断面図、第2図は平断面図、第
3図は第2図の■−■視縦断面図、第4図は第2図のI
V−IV視縦断面図、第5図は要部拡大断面図である。 1・・・・・・本体、2・・・・・・断熱壁体、2′,
2“・・曲仕切断熱壁体、5 , 5’・・・・・断熱
空間部、6・・・・・・外気出入口、7,12・・・・
・・扉、8,27,37・・曲往復直線駆動体、10・
・・・・・試験室、11・・曲試料出し入れ口、13・
・・・・・整流板、1 4 , 1 4’・・間風洞部
、20・・・・・・低温チャンバー、21・・曲冷却機
の蒸発器、22,31・・・・・・ヒータ、23,32
・・曲ファン、24・・・・・・冷気入口、24′・・
曲冷気出口、2 5 , 2 5’ , 3 5 ,
3 5’・・・・・・遮断、26,36・・・・・・軸
、28,38・・・・・・仕切扉、3o・・・・・・高
温チャンバー、34・・・・・・熱風入口、34′・・
・・・・熱風出口、40・・・・・・室温送入用ファン
The drawings show one embodiment of the device of the present invention.
The figure is a longitudinal cross-sectional view excluding the machine housing part, Figure 2 is a plan cross-sectional view, Figure 3 is a vertical cross-sectional view taken from ■-■ in Figure 2, and Figure 4 is I in Figure 2.
FIG. 5 is an enlarged sectional view of the main part. 1...Main body, 2...Insulating wall, 2',
2"...Curved partition cut thermal wall body, 5, 5'...Insulating space section, 6...Outside air inlet/outlet, 7, 12...
・・Door, 8, 27, 37・・Curved reciprocating linear drive body, 10・
...Testing room, 11... Curved sample inlet/outlet, 13.
・・・・・・straightening plate, 1 4, 1 4'... wind tunnel section, 20... low temperature chamber, 21... evaporator of curved cooler, 22, 31... heater , 23, 32
...Song fan, 24...Cold air inlet, 24'...
Curved cold air outlet, 2 5 , 2 5' , 3 5 ,
3 5'......Block, 26, 36...Shaft, 28, 38...Partition door, 3o...High temperature chamber, 34...・Hot air inlet, 34'...
... Hot air outlet, 40 ... Room temperature supply fan.

Claims (1)

【特許請求の範囲】[Claims] 1 冷却手段及び冷却された低温気体を移動させるファ
ンを備えた低温気体供給室と、加熱手段及び加熱された
高温気体を移動させるファンを備えた高温気体供給室と
、前記両気体供給室に繋がり試料出入口扉を備えた試験
室と、所要時外気が試験室に送り込まれるようにした外
気連通開閉手段とを、試験室に対して各々断熱壁体で仕
切って所要配置で組合せ、試験室に対する各気体供給室
及び外気導入排出部は該試験室の両端部にて各々入口と
出口とを開口し、この各開口部には各温度条件の気体ご
との出口と入口とを同時に外部から開閉操作される断熱
扉を付設し、試験室への気体出入位置より内側には整流
板を両側に設けたことを特徴とする熱雰囲気試験装置。
1. A low-temperature gas supply chamber equipped with a cooling means and a fan for moving the cooled low-temperature gas, a high-temperature gas supply chamber equipped with a heating means and a fan for moving the heated high-temperature gas, and connected to both of the gas supply chambers. A test chamber equipped with a sample entrance/exit door and an outside air communication opening/closing means that allows outside air to be sent into the test chamber when required are separated from each other by an insulating wall and combined in the required arrangement. The gas supply chamber and the outside air introduction/exhaust section each have an inlet and an outlet at both ends of the test chamber, and the outlet and inlet for each gas under each temperature condition are simultaneously opened and closed from the outside at each opening. A thermal atmosphere testing device characterized by being equipped with an insulated door and rectifying plates on both sides inside the position where gas enters and exits the test chamber.
JP14129081A 1981-09-07 1981-09-07 Thermal atmosphere test equipment Expired JPS5849817B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14129081A JPS5849817B2 (en) 1981-09-07 1981-09-07 Thermal atmosphere test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14129081A JPS5849817B2 (en) 1981-09-07 1981-09-07 Thermal atmosphere test equipment

Publications (2)

Publication Number Publication Date
JPS5842952A JPS5842952A (en) 1983-03-12
JPS5849817B2 true JPS5849817B2 (en) 1983-11-07

Family

ID=15288441

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14129081A Expired JPS5849817B2 (en) 1981-09-07 1981-09-07 Thermal atmosphere test equipment

Country Status (1)

Country Link
JP (1) JPS5849817B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012240370A (en) * 2011-05-23 2012-12-10 Sumitomo Metal Mining Co Ltd Apparatus for continuously heating long film
JP2014224690A (en) * 2013-05-15 2014-12-04 エスペック株式会社 Environmental test device
JP2015225067A (en) * 2014-05-30 2015-12-14 エスペック株式会社 Environment test device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60129653A (en) * 1983-12-16 1985-07-10 Nippon Saamic:Kk Thermal immersion test apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012240370A (en) * 2011-05-23 2012-12-10 Sumitomo Metal Mining Co Ltd Apparatus for continuously heating long film
JP2014224690A (en) * 2013-05-15 2014-12-04 エスペック株式会社 Environmental test device
JP2015225067A (en) * 2014-05-30 2015-12-14 エスペック株式会社 Environment test device

Also Published As

Publication number Publication date
JPS5842952A (en) 1983-03-12

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