JPS6118339B2 - - Google Patents
Info
- Publication number
- JPS6118339B2 JPS6118339B2 JP17850580A JP17850580A JPS6118339B2 JP S6118339 B2 JPS6118339 B2 JP S6118339B2 JP 17850580 A JP17850580 A JP 17850580A JP 17850580 A JP17850580 A JP 17850580A JP S6118339 B2 JPS6118339 B2 JP S6118339B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- semiconductor devices
- resin
- semiconductor
- rods
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 44
- 238000012360 testing method Methods 0.000 claims description 15
- 239000011347 resin Substances 0.000 claims description 7
- 229920005989 resin Polymers 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 6
- 239000003566 sealing material Substances 0.000 claims 1
- 238000007789 sealing Methods 0.000 description 7
- 239000011810 insulating material Substances 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 238000004040 coloring Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17850580A JPS57102039A (en) | 1980-12-17 | 1980-12-17 | Inspection of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17850580A JPS57102039A (en) | 1980-12-17 | 1980-12-17 | Inspection of semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57102039A JPS57102039A (en) | 1982-06-24 |
| JPS6118339B2 true JPS6118339B2 (enrdf_load_stackoverflow) | 1986-05-12 |
Family
ID=16049630
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17850580A Granted JPS57102039A (en) | 1980-12-17 | 1980-12-17 | Inspection of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57102039A (enrdf_load_stackoverflow) |
-
1980
- 1980-12-17 JP JP17850580A patent/JPS57102039A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57102039A (en) | 1982-06-24 |
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