JPS61147542A - 良品ペレツトの判別装置 - Google Patents

良品ペレツトの判別装置

Info

Publication number
JPS61147542A
JPS61147542A JP59268476A JP26847684A JPS61147542A JP S61147542 A JPS61147542 A JP S61147542A JP 59268476 A JP59268476 A JP 59268476A JP 26847684 A JP26847684 A JP 26847684A JP S61147542 A JPS61147542 A JP S61147542A
Authority
JP
Japan
Prior art keywords
pellet
defective
pellets
reflected light
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59268476A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0548622B2 (enExample
Inventor
Makoto Arie
誠 有江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Original Assignee
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Seiki Co Ltd filed Critical Toshiba Seiki Co Ltd
Priority to JP59268476A priority Critical patent/JPS61147542A/ja
Publication of JPS61147542A publication Critical patent/JPS61147542A/ja
Publication of JPH0548622B2 publication Critical patent/JPH0548622B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59268476A 1984-12-21 1984-12-21 良品ペレツトの判別装置 Granted JPS61147542A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59268476A JPS61147542A (ja) 1984-12-21 1984-12-21 良品ペレツトの判別装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59268476A JPS61147542A (ja) 1984-12-21 1984-12-21 良品ペレツトの判別装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2868593A Division JPH0648702B2 (ja) 1993-01-25 1993-01-25 良品ペレットの判別装置

Publications (2)

Publication Number Publication Date
JPS61147542A true JPS61147542A (ja) 1986-07-05
JPH0548622B2 JPH0548622B2 (enExample) 1993-07-22

Family

ID=17459024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59268476A Granted JPS61147542A (ja) 1984-12-21 1984-12-21 良品ペレツトの判別装置

Country Status (1)

Country Link
JP (1) JPS61147542A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5331397A (en) * 1989-11-24 1994-07-19 Kabushiki Kaisha Toshiba Inner lead bonding inspecting method and inspection apparatus therefor

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101616180B1 (ko) * 2014-04-04 2016-04-27 건국대학교 산학협력단 케피어 발효유 감별 및 락토바실러스 케피라노팍시엔스 유산균 특이적인 정량 검출용 조성물 및 그 검출 방법
KR101695059B1 (ko) * 2014-04-07 2017-01-23 건국대학교 산학협력단 케피어 발효유 내 미생물 그룹별 정량적인 실시간 중합효소 연쇄반응 분석용 조성물 및 그 분석방법

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58125837A (ja) * 1982-01-22 1983-07-27 Mitsubishi Electric Corp 自動ダイボンダのペレツト位置決め装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58125837A (ja) * 1982-01-22 1983-07-27 Mitsubishi Electric Corp 自動ダイボンダのペレツト位置決め装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5331397A (en) * 1989-11-24 1994-07-19 Kabushiki Kaisha Toshiba Inner lead bonding inspecting method and inspection apparatus therefor

Also Published As

Publication number Publication date
JPH0548622B2 (enExample) 1993-07-22

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Legal Events

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