JPS6114543A - 粒径測定装置 - Google Patents

粒径測定装置

Info

Publication number
JPS6114543A
JPS6114543A JP59135978A JP13597884A JPS6114543A JP S6114543 A JPS6114543 A JP S6114543A JP 59135978 A JP59135978 A JP 59135978A JP 13597884 A JP13597884 A JP 13597884A JP S6114543 A JPS6114543 A JP S6114543A
Authority
JP
Japan
Prior art keywords
particle size
scattered light
light intensity
intensity distribution
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59135978A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0263181B2 (enExample
Inventor
Kyoichi Tatsuno
恭市 辰野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59135978A priority Critical patent/JPS6114543A/ja
Priority to EP85303816A priority patent/EP0167272B1/en
Priority to US06/739,283 priority patent/US4801205A/en
Priority to DE8585303816T priority patent/DE3581325D1/de
Publication of JPS6114543A publication Critical patent/JPS6114543A/ja
Publication of JPH0263181B2 publication Critical patent/JPH0263181B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP59135978A 1984-06-30 1984-06-30 粒径測定装置 Granted JPS6114543A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP59135978A JPS6114543A (ja) 1984-06-30 1984-06-30 粒径測定装置
EP85303816A EP0167272B1 (en) 1984-06-30 1985-05-30 Particle size measuring apparatus
US06/739,283 US4801205A (en) 1984-06-30 1985-05-30 Particle size measuring apparatus
DE8585303816T DE3581325D1 (de) 1984-06-30 1985-05-30 Apparat zur messung der abmessungen von teilchen.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59135978A JPS6114543A (ja) 1984-06-30 1984-06-30 粒径測定装置

Publications (2)

Publication Number Publication Date
JPS6114543A true JPS6114543A (ja) 1986-01-22
JPH0263181B2 JPH0263181B2 (enExample) 1990-12-27

Family

ID=15164322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59135978A Granted JPS6114543A (ja) 1984-06-30 1984-06-30 粒径測定装置

Country Status (1)

Country Link
JP (1) JPS6114543A (enExample)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62222144A (ja) * 1986-03-25 1987-09-30 Toshiba Corp 粒径測定装置
JPH0264435A (ja) * 1988-08-31 1990-03-05 Y D K:Kk 粒度測定装置
JPH03115950A (ja) * 1989-09-29 1991-05-16 Shimadzu Corp 粒度分布測定装置
JP2000046719A (ja) * 1998-07-29 2000-02-18 Shimadzu Corp 粒子個数計測方法および粒子計測装置
JP2002243624A (ja) * 2001-02-20 2002-08-28 Horiba Ltd 粒径分布測定装置
JP2003149123A (ja) * 2001-11-09 2003-05-21 Horiba Ltd 粒径分布測定装置
JP2004294294A (ja) * 2003-03-27 2004-10-21 Daicel Chem Ind Ltd マイクロカプセルの壁膜の厚み算出装置
JP2005513476A (ja) * 2001-12-12 2005-05-12 プロイミュン リミテッド 液状懸濁液または溶液中の分析物測定機器とその方法
JP2005221310A (ja) * 2004-02-04 2005-08-18 Toto Ltd エアロゾル粒子径測定方法、装置およびそれを備える複合構造物作製装置
JP2005536740A (ja) * 2002-08-23 2005-12-02 コールター インターナショナル コーポレイション 血液細胞及びこれに類するものを分化するために光散乱を検出するための光ファイバ装置
WO2016067793A1 (ja) * 2014-10-29 2016-05-06 富士電機株式会社 粒子分析装置
US9857282B2 (en) 2016-01-27 2018-01-02 Fuji Electric Co., Ltd. Particle analyzing apparatus
JP2019148585A (ja) * 2018-01-31 2019-09-05 ジック エンジニアリング ゲーエムベーハーＳＩＣＫ Ｅｎｇｉｎｅｅｒｉｎｇ ＧｍｂＨ 粒子状物質の測定を行うための分析装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102353337B (zh) * 2011-09-19 2013-05-08 南京信息工程大学 一种大气黑碳气溶胶粒子直径检测方法及检测装置
WO2022270204A1 (ja) 2021-06-21 2022-12-29 富士フイルム株式会社 粒子の測定装置及び粒子の測定方法

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62222144A (ja) * 1986-03-25 1987-09-30 Toshiba Corp 粒径測定装置
JPH0264435A (ja) * 1988-08-31 1990-03-05 Y D K:Kk 粒度測定装置
JPH03115950A (ja) * 1989-09-29 1991-05-16 Shimadzu Corp 粒度分布測定装置
JP2000046719A (ja) * 1998-07-29 2000-02-18 Shimadzu Corp 粒子個数計測方法および粒子計測装置
JP2002243624A (ja) * 2001-02-20 2002-08-28 Horiba Ltd 粒径分布測定装置
JP2003149123A (ja) * 2001-11-09 2003-05-21 Horiba Ltd 粒径分布測定装置
US7084975B2 (en) 2001-11-09 2006-08-01 Horiba, Ltd. Particle diameter distribution measurement apparatus and method of calibration
JP2005513476A (ja) * 2001-12-12 2005-05-12 プロイミュン リミテッド 液状懸濁液または溶液中の分析物測定機器とその方法
JP2005536740A (ja) * 2002-08-23 2005-12-02 コールター インターナショナル コーポレイション 血液細胞及びこれに類するものを分化するために光散乱を検出するための光ファイバ装置
JP2010060569A (ja) * 2002-08-23 2010-03-18 Coulter Internatl Corp 血液細胞及びこれに類するものを分化するために光散乱を検出するための光ファイバ装置
JP2004294294A (ja) * 2003-03-27 2004-10-21 Daicel Chem Ind Ltd マイクロカプセルの壁膜の厚み算出装置
JP2005221310A (ja) * 2004-02-04 2005-08-18 Toto Ltd エアロゾル粒子径測定方法、装置およびそれを備える複合構造物作製装置
WO2016067793A1 (ja) * 2014-10-29 2016-05-06 富士電機株式会社 粒子分析装置
US9857282B2 (en) 2016-01-27 2018-01-02 Fuji Electric Co., Ltd. Particle analyzing apparatus
JP2019148585A (ja) * 2018-01-31 2019-09-05 ジック エンジニアリング ゲーエムベーハーＳＩＣＫ Ｅｎｇｉｎｅｅｒｉｎｇ ＧｍｂＨ 粒子状物質の測定を行うための分析装置

Also Published As

Publication number Publication date
JPH0263181B2 (enExample) 1990-12-27

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