JPS61137324A - パタ−ン形成方法 - Google Patents
パタ−ン形成方法Info
- Publication number
- JPS61137324A JPS61137324A JP59259537A JP25953784A JPS61137324A JP S61137324 A JPS61137324 A JP S61137324A JP 59259537 A JP59259537 A JP 59259537A JP 25953784 A JP25953784 A JP 25953784A JP S61137324 A JPS61137324 A JP S61137324A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- pmma
- organic resin
- far ultraviolet
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
- G03F7/70875—Temperature, e.g. temperature control of masks or workpieces via control of stage temperature
-
- H10P95/00—
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59259537A JPS61137324A (ja) | 1984-12-07 | 1984-12-07 | パタ−ン形成方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59259537A JPS61137324A (ja) | 1984-12-07 | 1984-12-07 | パタ−ン形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61137324A true JPS61137324A (ja) | 1986-06-25 |
| JPH0235449B2 JPH0235449B2 (enExample) | 1990-08-10 |
Family
ID=17335483
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59259537A Granted JPS61137324A (ja) | 1984-12-07 | 1984-12-07 | パタ−ン形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61137324A (enExample) |
-
1984
- 1984-12-07 JP JP59259537A patent/JPS61137324A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0235449B2 (enExample) | 1990-08-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2565119B2 (ja) | パターン形成方法 | |
| DE3784541D1 (de) | Verfahren zur herstellung einer niedergeschlagenen schicht. | |
| JPS62115166A (ja) | 光マスクとその製造方法 | |
| JPS61137324A (ja) | パタ−ン形成方法 | |
| US5104481A (en) | Method for fabricating laser generated I.C. masks | |
| JPS6351641A (ja) | 単結晶または多結晶Si膜の微細パタ−ン形成方法 | |
| JPH03129349A (ja) | フォトマスクの製法 | |
| JPS6049630A (ja) | 半導体装置の製造方法 | |
| US5260235A (en) | Method of making laser generated I. C. pattern for masking | |
| JP2942825B1 (ja) | 面外分岐ミラーを有する光集積回路の製造方法 | |
| JP2004272049A (ja) | Si−O−Si結合を含む固体化合物膜の形成方法、固体化合物膜の酸化ケイ素への改質方法、パターン形成方法及びリソグラフイー用レジスト | |
| JPS61204933A (ja) | 半導体装置の製造方法 | |
| JPS56140345A (en) | Formation of pattern | |
| JPS63237527A (ja) | レジスト剥離方法 | |
| JPS6116521A (ja) | レジスト膜除去方法 | |
| JPS6029921B2 (ja) | 回折格子作製方法 | |
| JP2617923B2 (ja) | パターン形成方法 | |
| JPS5898922A (ja) | パタ−ン形成方法 | |
| JPS6097625A (ja) | パタ−ン形成方法 | |
| EP0627123A4 (en) | LASER SHAPED INTEGRATED CIRCUIT MASK. | |
| JPH02140748A (ja) | レジストパターン形成方法 | |
| JPS60217630A (ja) | 遠紫外光用レジスト露光方法 | |
| JPH0685070B2 (ja) | レジストパターンの現像方法 | |
| JPS59201417A (ja) | 乾式リソグラフイ・パタ−ン製法 | |
| JPH02114531A (ja) | 半導体装置の製造方法 |