JPS61129814A - Manufacturing apparatus for semiconductor - Google Patents
Manufacturing apparatus for semiconductorInfo
- Publication number
- JPS61129814A JPS61129814A JP25106984A JP25106984A JPS61129814A JP S61129814 A JPS61129814 A JP S61129814A JP 25106984 A JP25106984 A JP 25106984A JP 25106984 A JP25106984 A JP 25106984A JP S61129814 A JPS61129814 A JP S61129814A
- Authority
- JP
- Japan
- Prior art keywords
- reaction
- substrate
- linear
- lamp
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/482—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using incoherent light, UV to IR, e.g. lamps
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Recrystallisation Techniques (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体製造装置に関し、特に光励起CV
D (photo chemical vapour
deposition)法によりWIIIIを形成する
装置に関するものである。[Detailed Description of the Invention] [Industrial Field of Application] The present invention relates to semiconductor manufacturing equipment, and in particular to optically pumped CV
D (photo chemical vapor
The present invention relates to an apparatus for forming WIII by a deposition method.
CVD法は集積回路装置における薄膜形成等において重
要な技術であるが、従来のCVD法は、主として反応ガ
スを加熱して化学反応を起こさせるようにしており、こ
のため反応温度が高温となり、これにより形成されるM
HIはダメージを受けやすいものである。The CVD method is an important technology for forming thin films in integrated circuit devices, but in the conventional CVD method, the reaction gas is mainly heated to cause a chemical reaction, which results in a high reaction temperature. M formed by
HI is susceptible to damage.
そこで最近、低温CVD技術として光励起CVD法が注
目されている。この光励起CVD法は、CVDのエネル
ギー源として光を用いるものであり、これによれば、従
来の熱励起CVD法、プラズマCVD法等に比較して反
応温度を低温にでき、薄膜へのダメージも少なくするこ
とができる。Therefore, recently, a photo-excited CVD method has been attracting attention as a low-temperature CVD technique. This photo-excited CVD method uses light as an energy source for CVD. According to this method, the reaction temperature can be lowered compared to conventional thermally-excited CVD methods, plasma CVD methods, etc., and there is no damage to thin films. It can be reduced.
また、一般的に光励起CVD法では、光の強度が薄膜の
形成速度に大きな影響を与えることが知られており、基
板温度1反応ガスの組成比、圧力を一定に保った条件下
では、薄膜の形成速度は光の照射強度に比例して速くな
ることが知られている。In general, in the photo-excited CVD method, it is known that the intensity of light has a large effect on the rate of thin film formation. It is known that the formation speed of is increased in proportion to the intensity of light irradiation.
第5図はこのような光励起CVD法による従来の薄膜形
成装置の基本的な構成を示し、図において、1は膜形成
時にその中が高真空状態に減圧される反応室、2は線状
ランプからなる光源、3は基板加熱用ヒータ、4はシラ
ン等の反応ガス、5は薄膜が形成される基板、6は光透
過材からなる光入射窓、7は反応ガス供給口、8は反応
後のガス4aを排出するためのガス排出口、9は基板5
を載せる固定台である。Figure 5 shows the basic configuration of a conventional thin film forming apparatus using such a photo-excited CVD method. In the figure, 1 is a reaction chamber whose inside is reduced to a high vacuum state during film formation, and 2 is a linear lamp. 3 is a heater for heating the substrate; 4 is a reactive gas such as silane; 5 is a substrate on which a thin film is formed; 6 is a light incident window made of a light-transmitting material; 7 is a reactive gas supply port; 8 is a post-reaction 9 is a gas discharge port for discharging the gas 4a of the substrate 5;
It is a fixed stand on which to place.
この従来装置では、反応ガス4が供給ロアから反応室1
に導入されると、該反応ガス4は入射窓6から投射され
た光線により励起分解される。そしてこれにより生じた
反応生成物がヒータ3によって低温加熱された基板5上
に堆積し、該基板5上に薄膜が形成される0反応後のガ
ス4aは排出口8から排出される。In this conventional device, the reaction gas 4 is supplied from the supply lower to the reaction chamber 1.
When introduced into the reactor gas 4, the reaction gas 4 is excited and decomposed by the light beam projected from the entrance window 6. The resulting reaction products are deposited on the substrate 5 heated at a low temperature by the heater 3, and the gas 4a after the zero reaction in which a thin film is formed on the substrate 5 is discharged from the exhaust port 8.
〔発明が解決しようとする問題点〕
ところでこの従来装置では光源2として単一の線状ラン
プを用いているが、この線状ランプからの光の基板5上
での照度は、そのランプ軸と直角方向外方ほどランプか
ら遠くなるため弱く、そのためこの従来装置では、基板
5のランプ軸と直角方向両端部の膜形成速度が中央部分
より遅くなってその厚さが薄くなり、形成されるIEJ
IjIの膜厚が不均一になるという問題があった。[Problems to be Solved by the Invention] By the way, in this conventional device, a single linear lamp is used as the light source 2, but the illuminance of the light from this linear lamp on the substrate 5 is different from the axis of the lamp. The further outward in the perpendicular direction, the further away from the lamp it is, the weaker it becomes.Therefore, in this conventional device, the film formation rate at both ends of the substrate 5 in the direction perpendicular to the lamp axis is slower than in the central part, and the thickness is thinner, resulting in the IEJ being formed.
There was a problem that the film thickness of IjI became non-uniform.
この発明は、かかる従来の問題点に鑑みてなされたもの
で、基板上での照度差をなくして均一な膜厚の薄膜を形
成できる半導体製造装置を提供することを目的としてい
る。The present invention has been made in view of these conventional problems, and an object of the present invention is to provide a semiconductor manufacturing apparatus that can eliminate differences in illuminance on a substrate and form a thin film with a uniform thickness.
この発明に係る半導体製造装置は、相互に平行な複数の
線状部分を有する1本の線状ランプを光源として用いた
ものである。A semiconductor manufacturing apparatus according to the present invention uses a single linear lamp having a plurality of mutually parallel linear portions as a light source.
この発明においては、複数の線状部分により基板全体に
均一に光が照射され、該基板上での照度差がなくなる。In this invention, the plurality of linear portions uniformly irradiates the entire substrate with light, eliminating differences in illuminance on the substrate.
以下、本発明の実施例を図について説明する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.
第1図及び第2図は本発明の一実施例にょる半導体製造
装置を示し、図において、1は反応室、3は基板加熱用
ヒータ、4は反応ガス、5は基板、6は光透過材からな
る光入射窓、7,8はそれぞれ反応ガス供給口、排出口
、9は基板積載用の固定台である。1 and 2 show a semiconductor manufacturing apparatus according to an embodiment of the present invention, in which 1 is a reaction chamber, 3 is a heater for heating a substrate, 4 is a reaction gas, 5 is a substrate, and 6 is a light transmitting device. 7 and 8 are a reaction gas supply port and a discharge port, respectively, and 9 is a fixing table for loading a substrate.
12は反応室1の光入射窓6上方に配設された線状ラン
プであり、該線状ランプ12の照射部12aは6つの線
状部分12bが相互に平行で、かほど広くしたのは、基
板5上での照度は上記各線状部分12bからの光の重な
りにより中央ほど強くなるから、この強くなった照度を
中央部の間隔を広くすることにより補正し、もって基板
5全面の照度を均一にするためである。従って上記線状
部分12b間の間隔は基板5上での照度分布が均一にな
るよう適宜選択されるものである。また上記照射部12
aの両端には2つの連結部12cが一体形成され、該再
連結部12cの上端には上記照射部12aに電源を供給
するための1つの電極部12dが形成されている。Reference numeral 12 denotes a linear lamp disposed above the light entrance window 6 of the reaction chamber 1. The irradiation part 12a of the linear lamp 12 has six linear parts 12b that are parallel to each other, and the reason why it is so wide is that Since the illuminance on the substrate 5 becomes stronger toward the center due to the overlap of the light from each of the linear portions 12b, this increased illuminance is corrected by widening the interval at the center, thereby reducing the illuminance over the entire surface of the substrate 5. This is to make it uniform. Therefore, the distance between the linear portions 12b is appropriately selected so that the illuminance distribution on the substrate 5 is uniform. In addition, the irradiation section 12
Two connecting parts 12c are integrally formed at both ends of the reconnecting part 12c, and one electrode part 12d for supplying power to the irradiating part 12a is formed at the upper end of the reconnecting part 12c.
次に作用効果について説明する。Next, the effects will be explained.
本実施例装置においても上記従来装置と同様に、反応室
1内に導入された反応ガス4が線状ランプ12からの光
によって光化学反応を生じ、これによる反応生成物がヒ
ータ3にて加熱された基板5上に堆積し、該基板5上に
薄膜が形成される。In the apparatus of this embodiment, as in the conventional apparatus described above, the reaction gas 4 introduced into the reaction chamber 1 causes a photochemical reaction by the light from the linear lamp 12, and the resulting reaction product is heated by the heater 3. A thin film is formed on the substrate 5.
この際、上記従来例では線状ランプ2の軸直角方向にお
いて基板5上の光の照度分布が不均一になるという問題
があったが、本実施例では6本の線状部分12bが相互
に平行に設けられ、しかもその間隔が中央ほど広(なっ
ているので、上記光の照度分布は均一になり、これによ
り基板5上の反応ガスは均一に励起され、従って本実施
例では均一な厚さの薄膜を基板5上に形成できる。At this time, in the conventional example described above, there was a problem that the illuminance distribution of the light on the substrate 5 was uneven in the direction perpendicular to the axis of the linear lamp 2, but in this embodiment, the six linear parts 12b are They are provided in parallel, and the distance between them is wider towards the center, so the illuminance distribution of the light becomes uniform, and thereby the reactive gas on the substrate 5 is excited uniformly. Therefore, in this embodiment, the thickness is uniform. A similar thin film can be formed on the substrate 5.
また、本実施例では6つの線状部分12bに1つの電極
部12dにより電源を供給するようにしたので、例えば
6本の線状ランプを並列配置した場合に比べて電極数は
1/6で済み、電源供給部の構造を非常に簡単にできる
。Furthermore, in this embodiment, power is supplied to the six linear parts 12b through one electrode part 12d, so the number of electrodes is 1/6 of that in the case where, for example, six linear lamps are arranged in parallel. This greatly simplifies the structure of the power supply section.
なお、上記実施例では、光源が6つの線状部分12bか
らなる場合について説明したが、この線状部分12bは
6つに限定されるものではなく、薄膜を形成しようとす
る基板5の大きさ等によって適宜選択されるものである
。また上記実施例では線状部分12b間の間隔が中央ほ
ど広(なっている場合について説明したが、本発明では
この間隔は必ずしもこの実施例のようにしなくてもよく
、例えば第3図及び第4図に示すように、全ての線状部
分12bを等間隔にしてもよく、このようにしても1本
の線状ランプを配設した場合に比べて基板5上の光の照
度分布を均一にできる。In the above embodiment, the case where the light source consists of six linear portions 12b has been described, but the number of linear portions 12b is not limited to six, and can vary depending on the size of the substrate 5 on which a thin film is to be formed. It is selected as appropriate based on the following. Furthermore, in the above embodiment, a case was explained in which the spacing between the linear portions 12b is wider toward the center, but in the present invention, this spacing does not necessarily have to be as in this embodiment; for example, as shown in FIGS. As shown in FIG. 4, all the linear portions 12b may be arranged at equal intervals, and even in this case, the illuminance distribution of the light on the substrate 5 can be made more uniform than in the case where one linear lamp is disposed. Can be done.
以上のように、本発明に係る半導体製造装置によれば、
光源として複数の線状部分を有する1本の線状ランプを
設けたので、簡単な構造でもって基板全面にわたって均
一な厚さの薄膜を形成でき、膜質を大きく向上できる効
果がある。As described above, according to the semiconductor manufacturing apparatus according to the present invention,
Since a single linear lamp having a plurality of linear portions is provided as a light source, a thin film having a uniform thickness can be formed over the entire surface of the substrate with a simple structure, and the film quality can be greatly improved.
第1図は本発明の一実施例による半導体製造装置の断面
側面図、第2WJはその平面図、第31!lは上記実施
例の変形例を示す断面側面図、第4図はその平面図、第
5図は従来の半導体製造装置の断面側面図である。
1・・・反応室、4・・・反応ガス、5・・・基板、1
2・・・線状ランプ、12b・・・線状部分。1 is a cross-sectional side view of a semiconductor manufacturing apparatus according to an embodiment of the present invention, 2nd WJ is a plan view thereof, and 31st! 1 is a cross-sectional side view showing a modification of the above embodiment, FIG. 4 is a plan view thereof, and FIG. 5 is a cross-sectional side view of a conventional semiconductor manufacturing apparatus. DESCRIPTION OF SYMBOLS 1...Reaction chamber, 4...Reaction gas, 5...Substrate, 1
2... Linear lamp, 12b... Linear part.
Claims (3)
化学反応を生じさせ該反応ガス中に置かれた基板上に薄
膜を形成させる半導体製造装置において、上記光源が相
互に平行な複数の線状部分を有する1本の線状ランプで
あることを特徴とする半導体製造装置。(1) In a semiconductor manufacturing apparatus that projects light from a light source onto a reaction gas in a reaction chamber to cause a photochemical reaction and form a thin film on a substrate placed in the reaction gas, a plurality of light sources are arranged parallel to each other. 1. A semiconductor manufacturing device characterized in that the lamp is a single linear lamp having a linear portion.
ることを特徴とする特許請求の範囲第1項記載の半導体
製造装置。(2) The semiconductor manufacturing apparatus according to claim 1, wherein the distance between the linear portions is wider toward the center.
れていることを特徴とする特許請求の範囲第1項又は第
2項記載の半導体製造装置。(3) The semiconductor manufacturing apparatus according to claim 1 or 2, wherein the linear portion is arranged in a plane parallel to the substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25106984A JPS61129814A (en) | 1984-11-28 | 1984-11-28 | Manufacturing apparatus for semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25106984A JPS61129814A (en) | 1984-11-28 | 1984-11-28 | Manufacturing apparatus for semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61129814A true JPS61129814A (en) | 1986-06-17 |
Family
ID=17217159
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25106984A Pending JPS61129814A (en) | 1984-11-28 | 1984-11-28 | Manufacturing apparatus for semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61129814A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009200330A (en) * | 2008-02-22 | 2009-09-03 | Denso Corp | Semiconductor manufacturing device |
-
1984
- 1984-11-28 JP JP25106984A patent/JPS61129814A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009200330A (en) * | 2008-02-22 | 2009-09-03 | Denso Corp | Semiconductor manufacturing device |
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