JPS6079740U - Contact pins for integrated circuit devices - Google Patents
Contact pins for integrated circuit devicesInfo
- Publication number
- JPS6079740U JPS6079740U JP17255683U JP17255683U JPS6079740U JP S6079740 U JPS6079740 U JP S6079740U JP 17255683 U JP17255683 U JP 17255683U JP 17255683 U JP17255683 U JP 17255683U JP S6079740 U JPS6079740 U JP S6079740U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- contact pins
- circuit devices
- contact pin
- circuit device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001816 cooling Methods 0.000 claims description 2
- 230000017525 heat dissipation Effects 0.000 claims 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のコンタクトビレでテープキャ“リア方式
集積回路装置の電極と導通をとっている状態を示す。第
２図は本考案の一実施例の一電極部の拡大図である。
なお、図において、１．１’・・・・・・コンタクトピ
ンの接触ピン部、２，２′・・・・・・コンタクトピン
の金属筒部、３，３′・・・・・・電気的テスト用電極
、４．４′・・・・・・リード、５・・・・・・テープ
、６，６’・・・・・・グイ、７．７’、？“、７″′
・・・・・・コンタクトピンの冷却用フィン、である。Fig. 1 shows a state in which a conventional contact fin is connected to an electrode of a tape carrier type integrated circuit device. Fig. 2 is an enlarged view of one electrode portion of an embodiment of the present invention. In the figure, 1.1'...Contact pin part of contact pin, 2,2'...Metal cylinder part of contact pin, 3,3'...Electrical test Electrode, 4.4'...Lead, 5...Tape, 6,6'...Gui, 7.7', ?", 7"'
...A cooling fin for contact pins.
Claims (1)
おいて、放熱効果を目的とした冷却フィンを設けたこと
を特徴とする集積回路装置用コンタクトピン。A contact pin for an integrated circuit device, characterized in that the contact pin is used for electrical testing of the integrated circuit device and is provided with cooling fins for the purpose of heat dissipation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17255683U JPS6079740U (en) | 1983-11-08 | 1983-11-08 | Contact pins for integrated circuit devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17255683U JPS6079740U (en) | 1983-11-08 | 1983-11-08 | Contact pins for integrated circuit devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6079740U true JPS6079740U (en) | 1985-06-03 |
Family
ID=30376117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17255683U Pending JPS6079740U (en) | 1983-11-08 | 1983-11-08 | Contact pins for integrated circuit devices |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6079740U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013250235A (en) * | 2012-06-04 | 2013-12-12 | Mitsubishi Electric Corp | Inspection apparatus and inspection method |
| JP2014016276A (en) * | 2012-07-10 | 2014-01-30 | Mitsubishi Electric Corp | Inspection device |
| JP2017037064A (en) * | 2015-08-14 | 2017-02-16 | 致茂電子股▲分▼有限公司Ｃｈｒｏｍａ Ａｔｅ Ｉｎｃ． | probe |
-
1983
- 1983-11-08 JP JP17255683U patent/JPS6079740U/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013250235A (en) * | 2012-06-04 | 2013-12-12 | Mitsubishi Electric Corp | Inspection apparatus and inspection method |
| CN103454460A (en) * | 2012-06-04 | 2013-12-18 | 三菱电机株式会社 | Inspection apparatus and inspection method |
| US8981805B2 (en) | 2012-06-04 | 2015-03-17 | Mitsubishi Electric Corporation | Inspection apparatus and inspection method |
| JP2014016276A (en) * | 2012-07-10 | 2014-01-30 | Mitsubishi Electric Corp | Inspection device |
| US9207257B2 (en) | 2012-07-10 | 2015-12-08 | Mitsubishi Electric Corporation | Inspection apparatus |
| JP2017037064A (en) * | 2015-08-14 | 2017-02-16 | 致茂電子股▲分▼有限公司Ｃｈｒｏｍａ Ａｔｅ Ｉｎｃ． | probe |
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