JPS6050938A - 半導体集積回路 - Google Patents
半導体集積回路Info
- Publication number
- JPS6050938A JPS6050938A JP58160685A JP16068583A JPS6050938A JP S6050938 A JPS6050938 A JP S6050938A JP 58160685 A JP58160685 A JP 58160685A JP 16068583 A JP16068583 A JP 16068583A JP S6050938 A JPS6050938 A JP S6050938A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- circuit
- power supply
- supply voltage
- functional block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P74/00—
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58160685A JPS6050938A (ja) | 1983-08-30 | 1983-08-30 | 半導体集積回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58160685A JPS6050938A (ja) | 1983-08-30 | 1983-08-30 | 半導体集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6050938A true JPS6050938A (ja) | 1985-03-22 |
| JPS6339100B2 JPS6339100B2 (enExample) | 1988-08-03 |
Family
ID=15720250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58160685A Granted JPS6050938A (ja) | 1983-08-30 | 1983-08-30 | 半導体集積回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6050938A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6340404U (enExample) * | 1986-09-01 | 1988-03-16 |
-
1983
- 1983-08-30 JP JP58160685A patent/JPS6050938A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6340404U (enExample) * | 1986-09-01 | 1988-03-16 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6339100B2 (enExample) | 1988-08-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW560038B (en) | Electrostatic discharge protection circuit using whole chip trigger technique | |
| US6181173B1 (en) | Power-on reset circuit | |
| US7742265B2 (en) | High voltage power supply clamp circuitry for electrostatic discharge (ESD) protection | |
| JPH0832434A (ja) | 出力回路 | |
| TWI895325B (zh) | 電壓追蹤裝置、電路及方法 | |
| WO2006093729A1 (en) | Method and resistive bridge circuit for the detection of solder-joint failures in a digital electronic package | |
| CN114465616A (zh) | 具有esd保护的电平移位器 | |
| CN104242280A (zh) | 静电防护电路 | |
| JPS6050938A (ja) | 半導体集積回路 | |
| JP2004247523A (ja) | 半導体装置 | |
| JP2010266254A (ja) | 半導体装置のオープンテスト回路、オープンテスト回路を備えた半導体チップ及び半導体装置 | |
| JP2006129073A (ja) | ヒステリシスコンパレータ及びそれを用いたリセット信号発生回路 | |
| KR100210553B1 (ko) | 반도체 집적 회로 | |
| US7262646B2 (en) | Power-on reset circuit | |
| CN112350290B (zh) | 操作电路 | |
| KR100487195B1 (ko) | 프로세서의 누설 전류 감소 회로 | |
| JPH0563943B2 (enExample) | ||
| TWI804449B (zh) | 具有電源毛刺檢測功能之芯片 | |
| JPS61154157A (ja) | 半導体集積回路 | |
| JPH01111365A (ja) | 半導体集積回路 | |
| KR100575888B1 (ko) | 패드의 용도 변경이 가능한 반도체 장치 | |
| CN103531244B (zh) | 熔丝电路 | |
| TWI701443B (zh) | 可偵測不同電壓之電壓偵測電路架構 | |
| Kishita et al. | Investigation of the Time-Dependent BTI-induced Degradation Distribution for Ring Oscillators in Ultra-Long-Term Stress Conditions | |
| JPH04145721A (ja) | 半導体集積回路装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |