JPS6339100B2 - - Google Patents
Info
- Publication number
- JPS6339100B2 JPS6339100B2 JP58160685A JP16068583A JPS6339100B2 JP S6339100 B2 JPS6339100 B2 JP S6339100B2 JP 58160685 A JP58160685 A JP 58160685A JP 16068583 A JP16068583 A JP 16068583A JP S6339100 B2 JPS6339100 B2 JP S6339100B2
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- supply voltage
- functional block
- detection circuit
- level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P74/00—
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58160685A JPS6050938A (ja) | 1983-08-30 | 1983-08-30 | 半導体集積回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58160685A JPS6050938A (ja) | 1983-08-30 | 1983-08-30 | 半導体集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6050938A JPS6050938A (ja) | 1985-03-22 |
| JPS6339100B2 true JPS6339100B2 (enExample) | 1988-08-03 |
Family
ID=15720250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58160685A Granted JPS6050938A (ja) | 1983-08-30 | 1983-08-30 | 半導体集積回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6050938A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0637145Y2 (ja) * | 1986-09-01 | 1994-09-28 | 日本電信電話株式会社 | 耐火二重天井 |
-
1983
- 1983-08-30 JP JP58160685A patent/JPS6050938A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6050938A (ja) | 1985-03-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6636068B2 (en) | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | |
| US5313158A (en) | Test system integrated on a substrate and a method for using such a test system | |
| EP0202905A2 (en) | Semiconductor integrated circuit (IC) including circuit elements for evaluating the IC and means for testing the circuit elements | |
| KR100228322B1 (ko) | 반도체 집적회로의 검사방법 | |
| US6962827B1 (en) | Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device | |
| EP0473193A2 (en) | Semiconductor device having a temperature detection circuit | |
| CN110888032B (zh) | 晶片级测试方法和系统 | |
| JPS6339100B2 (enExample) | ||
| CN114371385A (zh) | 一种端口复用测试电路设计方法 | |
| KR102590203B1 (ko) | 웨이퍼 레벨 테스트를 위한 방법 및 디바이스 | |
| US20020063251A1 (en) | Semiconductor device and testing method therefor | |
| US7089137B2 (en) | Universal test platform and test method for latch-up | |
| EP0547693B1 (en) | Circuit arrangement comprising an end-of-life detector | |
| JP2894900B2 (ja) | 半導体装置 | |
| JP2000039461A (ja) | 半導体集積回路の接合温度測定方法とその測定方法を用いたdutボード | |
| JPH0658928B2 (ja) | I▲上2▼l集積回路装置のテスト方法 | |
| JPS60177277A (ja) | 集積回路の特性試験方法 | |
| KR100575888B1 (ko) | 패드의 용도 변경이 가능한 반도체 장치 | |
| JPH0784005A (ja) | 簡易スタンバイ状態設定回路 | |
| JPH07128396A (ja) | 半導体集積回路 | |
| JPH11142462A (ja) | オープン検出回路 | |
| JPS63152142A (ja) | 半導体集積回路の良品・不良品判別方法 | |
| JPH0548493B2 (enExample) | ||
| JPH04249782A (ja) | 半導体集積回路の試験回路 | |
| JPH02110389A (ja) | 半導体装置の試験方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |