JPS6031100B2 - 装置の製造方法 - Google Patents

装置の製造方法

Info

Publication number
JPS6031100B2
JPS6031100B2 JP52076682A JP7668277A JPS6031100B2 JP S6031100 B2 JPS6031100 B2 JP S6031100B2 JP 52076682 A JP52076682 A JP 52076682A JP 7668277 A JP7668277 A JP 7668277A JP S6031100 B2 JPS6031100 B2 JP S6031100B2
Authority
JP
Japan
Prior art keywords
etching
mask
etched
manufacturing
plasma
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52076682A
Other languages
English (en)
Japanese (ja)
Other versions
JPS535974A (en
Inventor
ハンス‐ルドルフ・ノイコム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of JPS535974A publication Critical patent/JPS535974A/ja
Publication of JPS6031100B2 publication Critical patent/JPS6031100B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31105—Etching inorganic layers
    • H01L21/31111—Etching inorganic layers by chemical means
    • H01L21/31116—Etching inorganic layers by chemical means by dry-etching
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3163—Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31144—Etching the insulating layers by chemical or physical means using masks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32131—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by physical means only
    • H01L21/32132—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by physical means only of silicon-containing layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP52076682A 1976-07-02 1977-06-29 装置の製造方法 Expired JPS6031100B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL7607298A NL7607298A (nl) 1976-07-02 1976-07-02 Werkwijze voor het vervaardigen van een inrichting en inrichting vervaardigd volgens de werkwijze.
NL7607298 1976-07-02

Publications (2)

Publication Number Publication Date
JPS535974A JPS535974A (en) 1978-01-19
JPS6031100B2 true JPS6031100B2 (ja) 1985-07-20

Family

ID=19826508

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52076682A Expired JPS6031100B2 (ja) 1976-07-02 1977-06-29 装置の製造方法

Country Status (9)

Country Link
US (1) US4293375A (OSRAM)
JP (1) JPS6031100B2 (OSRAM)
CA (1) CA1097434A (OSRAM)
CH (1) CH630961A5 (OSRAM)
DE (1) DE2727788C2 (OSRAM)
FR (1) FR2356739A1 (OSRAM)
GB (1) GB1571034A (OSRAM)
IT (1) IT1081122B (OSRAM)
NL (1) NL7607298A (OSRAM)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4183780A (en) * 1978-08-21 1980-01-15 International Business Machines Corporation Photon enhanced reactive ion etching
JPS5775429A (en) * 1980-10-28 1982-05-12 Toshiba Corp Manufacture of semiconductor device
EP0050973B1 (en) * 1980-10-28 1986-01-22 Kabushiki Kaisha Toshiba Masking process for semiconductor devices using a polymer film
DE3175488D1 (en) * 1981-02-07 1986-11-20 Ibm Deutschland Process for the formation and the filling of holes in a layer applied to a substrate
JPS57170535A (en) * 1981-04-15 1982-10-20 Toshiba Corp Etching method for thin silicon film
DE3215410A1 (de) * 1982-04-24 1983-10-27 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zum herstellen von oeffnungen mit hilfe einer maske in einer auf einer unterlage befindlichen schicht
US4461672A (en) * 1982-11-18 1984-07-24 Texas Instruments, Inc. Process for etching tapered vias in silicon dioxide
US4522681A (en) * 1984-04-23 1985-06-11 General Electric Company Method for tapered dry etching
DE3903699A1 (de) * 1988-02-08 1989-08-17 Ricoh Kk Bildsensor
US4978420A (en) * 1990-01-03 1990-12-18 Hewlett-Packard Company Single chamber via etch through a dual-layer dielectric
JPH0964366A (ja) * 1995-08-23 1997-03-07 Toshiba Corp 薄膜トランジスタ
JP2016219452A (ja) * 2015-05-14 2016-12-22 富士通株式会社 多層基板及び多層基板の製造方法
CN111725063B (zh) * 2020-06-19 2024-05-17 北京北方华创微电子装备有限公司 半导体衬底的刻蚀方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3483108A (en) * 1967-05-29 1969-12-09 Gen Electric Method of chemically etching a non-conductive material using an electrolytically controlled mask
DE2117199C3 (de) * 1971-04-08 1974-08-22 Philips Patentverwaltung Gmbh, 2000 Hamburg Verfahren zur Herstellung geätzter Muster in dünnen Schichten mit definierten Kantenprofilen
US3767490A (en) * 1971-06-29 1973-10-23 Ibm Process for etching organic coating layers
US3795557A (en) * 1972-05-12 1974-03-05 Lfe Corp Process and material for manufacturing semiconductor devices
NL7213625A (OSRAM) * 1972-10-07 1974-04-09
US3880684A (en) * 1973-08-03 1975-04-29 Mitsubishi Electric Corp Process for preparing semiconductor
US3839111A (en) * 1973-08-20 1974-10-01 Rca Corp Method of etching silicon oxide to produce a tapered edge thereon
CA1038969A (en) * 1974-08-21 1978-09-19 Samuel Ponczak Edge contouring of semiconductor wafers
JPS51117136A (en) * 1975-04-09 1976-10-15 Tokyo Shibaura Electric Co Plasma etching process
US3986912A (en) * 1975-09-04 1976-10-19 International Business Machines Corporation Process for controlling the wall inclination of a plasma etched via hole

Also Published As

Publication number Publication date
DE2727788A1 (de) 1978-01-05
DE2727788C2 (de) 1982-08-19
NL7607298A (nl) 1978-01-04
FR2356739B1 (OSRAM) 1982-06-18
JPS535974A (en) 1978-01-19
GB1571034A (en) 1980-07-09
CH630961A5 (de) 1982-07-15
US4293375A (en) 1981-10-06
CA1097434A (en) 1981-03-10
FR2356739A1 (fr) 1978-01-27
IT1081122B (it) 1985-05-16

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