JPS60253429A - 眼科検査装置 - Google Patents

眼科検査装置

Info

Publication number
JPS60253429A
JPS60253429A JP59109145A JP10914584A JPS60253429A JP S60253429 A JPS60253429 A JP S60253429A JP 59109145 A JP59109145 A JP 59109145A JP 10914584 A JP10914584 A JP 10914584A JP S60253429 A JPS60253429 A JP S60253429A
Authority
JP
Japan
Prior art keywords
eye
examined
light amount
ophthalmological examination
infrared filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59109145A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0477568B2 (enrdf_load_stackoverflow
Inventor
勲 松村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP59109145A priority Critical patent/JPS60253429A/ja
Publication of JPS60253429A publication Critical patent/JPS60253429A/ja
Publication of JPH0477568B2 publication Critical patent/JPH0477568B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Eye Examination Apparatus (AREA)
JP59109145A 1984-05-29 1984-05-29 眼科検査装置 Granted JPS60253429A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59109145A JPS60253429A (ja) 1984-05-29 1984-05-29 眼科検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59109145A JPS60253429A (ja) 1984-05-29 1984-05-29 眼科検査装置

Publications (2)

Publication Number Publication Date
JPS60253429A true JPS60253429A (ja) 1985-12-14
JPH0477568B2 JPH0477568B2 (enrdf_load_stackoverflow) 1992-12-08

Family

ID=14502743

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59109145A Granted JPS60253429A (ja) 1984-05-29 1984-05-29 眼科検査装置

Country Status (1)

Country Link
JP (1) JPS60253429A (enrdf_load_stackoverflow)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63200737A (ja) * 1987-02-16 1988-08-19 東洋メデイカル株式会社 眼位異常検査装置
JPH02185228A (ja) * 1989-01-11 1990-07-19 Canon Inc 眼屈折力計
WO1992018050A1 (en) * 1991-04-13 1992-10-29 Itoh, Shinsuke Nystagmograph
JPH0938164A (ja) * 1995-07-28 1997-02-10 Sony Corp 眼球運動訓練装置および方法
JP2009178502A (ja) * 2008-02-01 2009-08-13 Topcon Corp 眼科測定装置
JP2010187786A (ja) * 2009-02-16 2010-09-02 Si:Kk 遮眼具
WO2017159225A1 (ja) * 2016-03-18 2017-09-21 国立大学法人大阪大学 眼疲労検査装置及び眼疲労検査方法
JP2018042760A (ja) * 2016-09-15 2018-03-22 株式会社トプコン 眼科検査装置
JP2019069049A (ja) * 2017-10-10 2019-05-09 株式会社ニデック 眼科装置
WO2020066959A1 (ja) * 2018-09-25 2020-04-02 パイオニア株式会社 光学試料、光学部材、および光学装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS567411A (en) * 1979-06-30 1981-01-26 Matsushita Electric Works Ltd Polarized electromagnet device
JPS5822027A (ja) * 1981-08-03 1983-02-09 竹井機器工業株式会社 瞳孔検査装置における撮像装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS567411A (en) * 1979-06-30 1981-01-26 Matsushita Electric Works Ltd Polarized electromagnet device
JPS5822027A (ja) * 1981-08-03 1983-02-09 竹井機器工業株式会社 瞳孔検査装置における撮像装置

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63200737A (ja) * 1987-02-16 1988-08-19 東洋メデイカル株式会社 眼位異常検査装置
JPH02185228A (ja) * 1989-01-11 1990-07-19 Canon Inc 眼屈折力計
WO1992018050A1 (en) * 1991-04-13 1992-10-29 Itoh, Shinsuke Nystagmograph
JPH0938164A (ja) * 1995-07-28 1997-02-10 Sony Corp 眼球運動訓練装置および方法
JP2009178502A (ja) * 2008-02-01 2009-08-13 Topcon Corp 眼科測定装置
JP2010187786A (ja) * 2009-02-16 2010-09-02 Si:Kk 遮眼具
WO2017159225A1 (ja) * 2016-03-18 2017-09-21 国立大学法人大阪大学 眼疲労検査装置及び眼疲労検査方法
JP2017169601A (ja) * 2016-03-18 2017-09-28 国立大学法人大阪大学 眼疲労検査装置及び眼疲労検査方法
EP3430976A4 (en) * 2016-03-18 2019-04-17 Osaka University DEVICE FOR EXAMINING EYE DIFFICULTY AND METHOD FOR STUDYING EYE TEMPERANCE
US10959615B2 (en) 2016-03-18 2021-03-30 Topcon Corporation Eye-fatigue examining device and eye-fatigue examining method
JP2018042760A (ja) * 2016-09-15 2018-03-22 株式会社トプコン 眼科検査装置
JP2019069049A (ja) * 2017-10-10 2019-05-09 株式会社ニデック 眼科装置
WO2020066959A1 (ja) * 2018-09-25 2020-04-02 パイオニア株式会社 光学試料、光学部材、および光学装置

Also Published As

Publication number Publication date
JPH0477568B2 (enrdf_load_stackoverflow) 1992-12-08

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