JPS60214241A - 赤外吸収スペクトル測定装置 - Google Patents

赤外吸収スペクトル測定装置

Info

Publication number
JPS60214241A
JPS60214241A JP59070824A JP7082484A JPS60214241A JP S60214241 A JPS60214241 A JP S60214241A JP 59070824 A JP59070824 A JP 59070824A JP 7082484 A JP7082484 A JP 7082484A JP S60214241 A JPS60214241 A JP S60214241A
Authority
JP
Japan
Prior art keywords
sample
absorption spectrum
optical fiber
infrared light
infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59070824A
Other languages
English (en)
Japanese (ja)
Other versions
JPH053538B2 (enrdf_load_stackoverflow
Inventor
Akira Okamoto
明 岡本
Kinya Eguchi
江口　欣也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59070824A priority Critical patent/JPS60214241A/ja
Publication of JPS60214241A publication Critical patent/JPS60214241A/ja
Publication of JPH053538B2 publication Critical patent/JPH053538B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP59070824A 1984-04-11 1984-04-11 赤外吸収スペクトル測定装置 Granted JPS60214241A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59070824A JPS60214241A (ja) 1984-04-11 1984-04-11 赤外吸収スペクトル測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59070824A JPS60214241A (ja) 1984-04-11 1984-04-11 赤外吸収スペクトル測定装置

Publications (2)

Publication Number Publication Date
JPS60214241A true JPS60214241A (ja) 1985-10-26
JPH053538B2 JPH053538B2 (enrdf_load_stackoverflow) 1993-01-18

Family

ID=13442712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59070824A Granted JPS60214241A (ja) 1984-04-11 1984-04-11 赤外吸収スペクトル測定装置

Country Status (1)

Country Link
JP (1) JPS60214241A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01202641A (ja) * 1988-02-09 1989-08-15 Fuji Photo Film Co Ltd 平版印刷版の版面上に存在する物質の定量的計測方法及び装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01202641A (ja) * 1988-02-09 1989-08-15 Fuji Photo Film Co Ltd 平版印刷版の版面上に存在する物質の定量的計測方法及び装置

Also Published As

Publication number Publication date
JPH053538B2 (enrdf_load_stackoverflow) 1993-01-18

Similar Documents

Publication Publication Date Title
US5106196A (en) Single adjustment specular reflection accessory for spectroscopy
US7023954B2 (en) Optical alignment of X-ray microanalyzers
KR930703594A (ko) 동시 다중각/다중파장 타원편광계와 측정방법
US4972092A (en) Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation
JPH061241B2 (ja) 粒子解析装置
JP2000504422A (ja) ２つのコリメータマスクを有するｘ線分析装置
JP4246599B2 (ja) マッピング測定装置
JPS60214241A (ja) 赤外吸収スペクトル測定装置
JP2002529699A (ja) Ｘ線光学基準チャネルを有するｘ線回折装置
JP2000035363A (ja) 光学特性検出装置
JP2002372456A (ja) 赤外分光光度計
JP2960474B2 (ja) ニコチンセンサ
JP2539500B2 (ja) 顕微方式分光光度計
JPH079406B2 (ja) 半導体ウエハの表面検査装置
JPH0795040B2 (ja) 微小異物検査装置
JPH06273330A (ja) 濁度測定装置
JPH0436642A (ja) ラマン分光光度計
JPH0518686Y2 (enrdf_load_stackoverflow)
JPH0613480Y2 (ja) 顕微赤外反射吸収スペクトル測定装置
JPH087331B2 (ja) 赤外吸収スペクトル測定顕微鏡装置
JPH03165300A (ja) Ｘ線分光器検査装置
JPH0513460B2 (enrdf_load_stackoverflow)
RU2096757C1 (ru) Устройство для снятия спектра поверхностного плазменного резонанса
JPH0552896B2 (enrdf_load_stackoverflow)
JP3137148B2 (ja) 顕微拡散反射測定装置