JPS60189039A - 自動不良部品解析装置 - Google Patents

自動不良部品解析装置

Info

Publication number
JPS60189039A
JPS60189039A JP59042093A JP4209384A JPS60189039A JP S60189039 A JPS60189039 A JP S60189039A JP 59042093 A JP59042093 A JP 59042093A JP 4209384 A JP4209384 A JP 4209384A JP S60189039 A JPS60189039 A JP S60189039A
Authority
JP
Japan
Prior art keywords
defective
information file
information
signal
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59042093A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0412490B2 (enExample
Inventor
Shinichi Uchimura
内村　信一
Mitsuyuki Kawachi
河内　満幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP59042093A priority Critical patent/JPS60189039A/ja
Publication of JPS60189039A publication Critical patent/JPS60189039A/ja
Publication of JPH0412490B2 publication Critical patent/JPH0412490B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
JP59042093A 1984-03-07 1984-03-07 自動不良部品解析装置 Granted JPS60189039A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59042093A JPS60189039A (ja) 1984-03-07 1984-03-07 自動不良部品解析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59042093A JPS60189039A (ja) 1984-03-07 1984-03-07 自動不良部品解析装置

Publications (2)

Publication Number Publication Date
JPS60189039A true JPS60189039A (ja) 1985-09-26
JPH0412490B2 JPH0412490B2 (enExample) 1992-03-04

Family

ID=12626387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59042093A Granted JPS60189039A (ja) 1984-03-07 1984-03-07 自動不良部品解析装置

Country Status (1)

Country Link
JP (1) JPS60189039A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006226946A (ja) * 2005-02-21 2006-08-31 Fujitsu Ltd 半導体装置および半導体試験装置の検証方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS573975A (en) * 1980-06-05 1982-01-09 Takenaka Komuten Co Damper for preventing fire and smoke
JPS5917625A (ja) * 1982-07-20 1984-01-28 Nec Corp シングルチツプマイクロコンピユ−タ

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS573975A (en) * 1980-06-05 1982-01-09 Takenaka Komuten Co Damper for preventing fire and smoke
JPS5917625A (ja) * 1982-07-20 1984-01-28 Nec Corp シングルチツプマイクロコンピユ−タ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006226946A (ja) * 2005-02-21 2006-08-31 Fujitsu Ltd 半導体装置および半導体試験装置の検証方法

Also Published As

Publication number Publication date
JPH0412490B2 (enExample) 1992-03-04

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