JPS6017952A - Image sensor - Google Patents

Image sensor

Info

Publication number
JPS6017952A
JPS6017952A JP58126636A JP12663683A JPS6017952A JP S6017952 A JPS6017952 A JP S6017952A JP 58126636 A JP58126636 A JP 58126636A JP 12663683 A JP12663683 A JP 12663683A JP S6017952 A JPS6017952 A JP S6017952A
Authority
JP
Japan
Prior art keywords
image sensor
film
transparent resin
sensor element
sealed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58126636A
Other languages
Japanese (ja)
Inventor
Seiichi Iwamatsu
誠一 岩松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP58126636A priority Critical patent/JPS6017952A/en
Publication of JPS6017952A publication Critical patent/JPS6017952A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0203Containers; Encapsulations, e.g. encapsulation of photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

PURPOSE:To obtain a small-sized image sensor which can be manufactured through small number of steps inexpensively by sealing a semiconductor image sensor element with transparent resin. CONSTITUTION:A color filter 12 is formed on the surface of an image sensor element 11, a silicon nitrided film 12 is formed by a normal temperature photo CVD method on the surface of the film 12, the element is then associated with a metal frame 14, and sealed with a transparent resin 15. As a result, a small- sized image sensor having a light transmitting function of the image sensor, good moisture resistance and low cost can be obtained.

Description

【発明の詳細な説明】 本発明はイメージ・センサー装置の構造に関する。[Detailed description of the invention] The present invention relates to the structure of an image sensor device.

従来、半導体イメージ・センサーは、第1図に示すごと
く、素子1の表面にカラー・フィルター2等が形成され
たイメージ・センサー素子ヲセラミック・ステム3に組
立てられ、ガラス窓5をハーメチック・シールされたキ
ャップ4をステム3とハーメチック・シールする方法が
用いられるのが通例であった。
Conventionally, a semiconductor image sensor, as shown in FIG. 1, includes an image sensor element having a color filter 2 formed on the surface of the element 1, assembled onto a ceramic stem 3, and a glass window 5 hermetically sealed. Usually, a method was used in which the cap 4 was hermetically sealed with the stem 3.

しかし、上記従来技術によると、セラミック部品が高価
な事及び、ハーメチック・シールに工数がかかる事等の
欠点があった。
However, the above-mentioned conventional technology has drawbacks such as expensive ceramic parts and a time-consuming process for hermetic sealing.

本発明は、かかる従来技術の欠点をなくシ、低価格で製
作工数が少なくてすむ、小型のイメージ・センサー装置
を提供することを目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to eliminate the drawbacks of the prior art and provide a compact image sensor device that is inexpensive and requires fewer man-hours to manufacture.

上記目的を達成するための本発明の基本的な構成は、イ
メージ・センサーに於て、半導体イメ−ジ・センサー素
子を透明樹脂で封止することを特徴とすること、及び、
半導体イメージ・センサー素子表面にはゼラチンを染色
等して成るカラー・フィルターが画素に対応して形成さ
れて成り、該イメージ・センサー素子が透明樹脂で封止
されて成ることを特徴とすること、及び前記イメージ・
センサー素子のカラー・フィルター表面にはシリコン窒
化膜、シリコン酸化膜、あるいはアルミナ膜等のガラス
膜が形成されて成ることを特徴とする事、及び、少なく
ともイメージ・センサーを封止した透明樹脂表面にはシ
リコン窒化膜、シリコン酸化膜あるいはアルミナ膜等の
ガラス膜が形成されて成ることを特徴とする。
The basic structure of the present invention for achieving the above object is that an image sensor is characterized in that a semiconductor image sensor element is sealed with a transparent resin;
Color filters made of dyed gelatin are formed on the surface of the semiconductor image sensor element corresponding to the pixels, and the image sensor element is sealed with a transparent resin; and said image・
A glass film such as a silicon nitride film, a silicon oxide film, or an alumina film is formed on the color filter surface of the sensor element, and at least the transparent resin surface sealing the image sensor is is characterized in that a glass film such as a silicon nitride film, a silicon oxide film, or an alumina film is formed.

以下、実施例により本発明を詳述する。Hereinafter, the present invention will be explained in detail with reference to Examples.

第2図は本発明の一実施例を示すイメージ・センサー装
置の断面図である。イメージ・センサー素子11の表面
にはカラー・フィルター12が形成され、該カラー・フ
ィルター12の表面にはシリコン窒化膜12が常温での
光OVD法により形成され、該素子を金属フレーム14
に組み立てられた後、透明樹脂15に封止されたもので
ある。
FIG. 2 is a sectional view of an image sensor device showing one embodiment of the present invention. A color filter 12 is formed on the surface of the image sensor element 11, a silicon nitride film 12 is formed on the surface of the color filter 12 by optical OVD method at room temperature, and the element is mounted on a metal frame 14.
After being assembled, it is sealed in transparent resin 15.

第3図は本発明によるその他の実施例であり、カラー・
フィルターの付けられたイメージ・センサー素子21を
金属リード・フレーム22に組立て後透明樹脂23で封
止し、該樹脂23の表面に光OVD法によりSi3N4
 膜24を形成したものである。
FIG. 3 shows another embodiment according to the present invention, in which a color
After assembling the image sensor element 21 with the filter attached to the metal lead frame 22, it is sealed with a transparent resin 23, and the surface of the resin 23 is coated with Si3N4 by optical OVD method.
A film 24 is formed thereon.

上記の如く、透明樹脂封止したイメージ・センサー表面
又は封止樹脂表面をガラス等で保護することにより、イ
メージ・センサーの光透過機能を有しつつ、且つ、耐湿
性の良い、低コストで小型のイメージ・センサーを提供
できる効果がある。
As mentioned above, by protecting the surface of an image sensor sealed with a transparent resin or the surface of the sealing resin with glass, etc., it is possible to create a low-cost, small-sized image sensor that has the light transmission function of an image sensor and has good moisture resistance. It is effective in providing an image sensor of

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来技術によるイメージ・センサー装置の断面
図、第2図及び第3図は本発明によるイメージ・センサ
ー装置の実施例を示す断面図である。 1.11.21・・・・・・イメージ・センサー素子2
.12・・・・・・カラー会フィルター3・・・・・・
セラミック・ステム 4……キヤツプ 5・・・・・・ガラス窓 13.24・・・・・・ガラス層 14.22・・・・・・リードΦフレーム15.2.!
l・・・・・・透明樹脂 具 上 第1図 ) 第2図
FIG. 1 is a cross-sectional view of an image sensor device according to the prior art, and FIGS. 2 and 3 are cross-sectional views showing an embodiment of an image sensor device according to the present invention. 1.11.21... Image sensor element 2
.. 12...Color meeting filter 3...
Ceramic stem 4...Cap 5...Glass window 13.24...Glass layer 14.22...Lead Φ frame 15.2. !
l...Transparent resin tool (Fig. 1 above) Fig. 2

Claims (1)

【特許請求の範囲】 1、 半導体イメージ・センサー素子を透明樹脂で封止
することを特徴とするイメージ・センサー。 Z 半導体イメージ・センサー素子表面にはゼラチン等
を染色等して成るカラー・フィルターが画素に対応して
形成されて成ることを特徴とする特許請求の範囲第1項
記載のイメージ・センサー。 3、 カラー・フィルター表面にはシリコン窒化膜、シ
リコン酸化膜、あるいはアルミナ膜等のガラス膜が形成
されて成ることを特徴とする特許請求の範囲fE2項記
載のイメージ・センサー。 4、 少なくとも透明樹脂表面にはシリコン窒化膜、シ
リコン酸化膜あるいはアルミナ膜等のガラス膜が形成さ
れて成ることを特徴とする特許請求の範囲第1項並びに
第2項記載のイメージ・センサ
[Claims] 1. An image sensor characterized in that a semiconductor image sensor element is sealed with a transparent resin. Z. The image sensor according to claim 1, wherein color filters made of dyed gelatin or the like are formed on the surface of the semiconductor image sensor element corresponding to the pixels. 3. The image sensor according to claim fE2, wherein a glass film such as a silicon nitride film, a silicon oxide film, or an alumina film is formed on the surface of the color filter. 4. The image sensor according to claims 1 and 2, characterized in that a glass film such as a silicon nitride film, a silicon oxide film, or an alumina film is formed on at least the surface of the transparent resin.
JP58126636A 1983-07-12 1983-07-12 Image sensor Pending JPS6017952A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58126636A JPS6017952A (en) 1983-07-12 1983-07-12 Image sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58126636A JPS6017952A (en) 1983-07-12 1983-07-12 Image sensor

Publications (1)

Publication Number Publication Date
JPS6017952A true JPS6017952A (en) 1985-01-29

Family

ID=14940096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58126636A Pending JPS6017952A (en) 1983-07-12 1983-07-12 Image sensor

Country Status (1)

Country Link
JP (1) JPS6017952A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6268251U (en) * 1985-10-18 1987-04-28
JPS62196868A (en) * 1986-02-24 1987-08-31 Seiko Epson Corp Color solid-state image sensor
JPH02170557A (en) * 1988-12-23 1990-07-02 Seikosha Co Ltd Semiconductor sealing method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4840664A (en) * 1971-09-30 1973-06-14
JPS5598875A (en) * 1979-01-05 1980-07-28 Hitachi Ltd Semiconductor device with photocell
JPS57124983A (en) * 1981-01-28 1982-08-04 Hitachi Ltd Color solid-state image pickup element

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4840664A (en) * 1971-09-30 1973-06-14
JPS5598875A (en) * 1979-01-05 1980-07-28 Hitachi Ltd Semiconductor device with photocell
JPS57124983A (en) * 1981-01-28 1982-08-04 Hitachi Ltd Color solid-state image pickup element

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6268251U (en) * 1985-10-18 1987-04-28
JPS62196868A (en) * 1986-02-24 1987-08-31 Seiko Epson Corp Color solid-state image sensor
JPH02170557A (en) * 1988-12-23 1990-07-02 Seikosha Co Ltd Semiconductor sealing method
JPH0558654B2 (en) * 1988-12-23 1993-08-27 Seikosha Kk

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