JPS6016996Y2 - 入出力インタフエイス装置のアドレス選択装置 - Google Patents

入出力インタフエイス装置のアドレス選択装置

Info

Publication number
JPS6016996Y2
JPS6016996Y2 JP17075679U JP17075679U JPS6016996Y2 JP S6016996 Y2 JPS6016996 Y2 JP S6016996Y2 JP 17075679 U JP17075679 U JP 17075679U JP 17075679 U JP17075679 U JP 17075679U JP S6016996 Y2 JPS6016996 Y2 JP S6016996Y2
Authority
JP
Japan
Prior art keywords
address
interface device
circuit
input
program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17075679U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5688333U (Direct
Inventor
宏行 本多
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP17075679U priority Critical patent/JPS6016996Y2/ja
Publication of JPS5688333U publication Critical patent/JPS5688333U/ja
Application granted granted Critical
Publication of JPS6016996Y2 publication Critical patent/JPS6016996Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Debugging And Monitoring (AREA)
JP17075679U 1979-12-10 1979-12-10 入出力インタフエイス装置のアドレス選択装置 Expired JPS6016996Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17075679U JPS6016996Y2 (ja) 1979-12-10 1979-12-10 入出力インタフエイス装置のアドレス選択装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17075679U JPS6016996Y2 (ja) 1979-12-10 1979-12-10 入出力インタフエイス装置のアドレス選択装置

Publications (2)

Publication Number Publication Date
JPS5688333U JPS5688333U (Direct) 1981-07-15
JPS6016996Y2 true JPS6016996Y2 (ja) 1985-05-25

Family

ID=29681588

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17075679U Expired JPS6016996Y2 (ja) 1979-12-10 1979-12-10 入出力インタフエイス装置のアドレス選択装置

Country Status (1)

Country Link
JP (1) JPS6016996Y2 (Direct)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
US6970634B2 (en) 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
WO2003100445A2 (en) 2002-05-23 2003-12-04 Cascade Microtech, Inc. Probe for testing a device under test
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
DE202005021386U1 (de) 2004-07-07 2007-11-29 Cascade Microtech, Inc., Beaverton Prüfkopf mit einem Messfühler mit Membranaufhängung
EP1789812A2 (en) 2004-09-13 2007-05-30 Cascade Microtech, Inc. Double sided probing structures
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
EP1932003A2 (en) 2005-06-13 2008-06-18 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus

Also Published As

Publication number Publication date
JPS5688333U (Direct) 1981-07-15

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