JPS60161548A - 流動微小粒子状物体の散乱光測定装置 - Google Patents

流動微小粒子状物体の散乱光測定装置

Info

Publication number
JPS60161548A
JPS60161548A JP59016577A JP1657784A JPS60161548A JP S60161548 A JPS60161548 A JP S60161548A JP 59016577 A JP59016577 A JP 59016577A JP 1657784 A JP1657784 A JP 1657784A JP S60161548 A JPS60161548 A JP S60161548A
Authority
JP
Japan
Prior art keywords
flowing
scattered light
fine particulate
laser
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59016577A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0442621B2 (ru
Inventor
Bunro Kawaguchi
川口　文朗
Yuji Ito
勇二 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP59016577A priority Critical patent/JPS60161548A/ja
Publication of JPS60161548A publication Critical patent/JPS60161548A/ja
Publication of JPH0442621B2 publication Critical patent/JPH0442621B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP59016577A 1984-01-31 1984-01-31 流動微小粒子状物体の散乱光測定装置 Granted JPS60161548A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59016577A JPS60161548A (ja) 1984-01-31 1984-01-31 流動微小粒子状物体の散乱光測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59016577A JPS60161548A (ja) 1984-01-31 1984-01-31 流動微小粒子状物体の散乱光測定装置

Publications (2)

Publication Number Publication Date
JPS60161548A true JPS60161548A (ja) 1985-08-23
JPH0442621B2 JPH0442621B2 (ru) 1992-07-14

Family

ID=11920140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59016577A Granted JPS60161548A (ja) 1984-01-31 1984-01-31 流動微小粒子状物体の散乱光測定装置

Country Status (1)

Country Link
JP (1) JPS60161548A (ru)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02128142A (ja) * 1988-11-08 1990-05-16 Fuji Electric Co Ltd 光学的微粒子測定装置
JP2010286491A (ja) * 2009-06-15 2010-12-24 Wyatt Technol Corp 粒子の懸濁液の光散乱特性を測定するための円形の試料セルおよびシステム、ならびに粒子の懸濁液によって散乱された光を測定する方法
ES2607633A1 (es) * 2015-10-01 2017-04-03 Universidad Carlos Iii De Madrid Dispositivo de carga múltiple para microscopio de haz láser plano
JP2017529526A (ja) * 2014-08-20 2017-10-05 リサーチ トライアングル インスティテュート 粒子検出のための装置、システム、及び方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02128142A (ja) * 1988-11-08 1990-05-16 Fuji Electric Co Ltd 光学的微粒子測定装置
JP2010286491A (ja) * 2009-06-15 2010-12-24 Wyatt Technol Corp 粒子の懸濁液の光散乱特性を測定するための円形の試料セルおよびシステム、ならびに粒子の懸濁液によって散乱された光を測定する方法
JP2015111163A (ja) * 2009-06-15 2015-06-18 ワイアット テクノロジー コーポレイションＷｙａｔｔ Ｔｅｃｋｎｏｌｏｇｙ Ｃｏｒｐｏｒａｔｉｏｎ 粒子の懸濁液の光散乱特性を測定するための円形の試料セルおよびシステム、ならびに粒子の懸濁液によって散乱された光を測定する方法
JP2017529526A (ja) * 2014-08-20 2017-10-05 リサーチ トライアングル インスティテュート 粒子検出のための装置、システム、及び方法
ES2607633A1 (es) * 2015-10-01 2017-04-03 Universidad Carlos Iii De Madrid Dispositivo de carga múltiple para microscopio de haz láser plano
WO2017055673A1 (es) * 2015-10-01 2017-04-06 Universidad Carlos Iii De Madrid Dispositivo de carga múltiple para microscopio de haz láser plano

Also Published As

Publication number Publication date
JPH0442621B2 (ru) 1992-07-14

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