JPS60125573A - タイミングパルス発生器 - Google Patents

タイミングパルス発生器

Info

Publication number
JPS60125573A
JPS60125573A JP58232814A JP23281483A JPS60125573A JP S60125573 A JPS60125573 A JP S60125573A JP 58232814 A JP58232814 A JP 58232814A JP 23281483 A JP23281483 A JP 23281483A JP S60125573 A JPS60125573 A JP S60125573A
Authority
JP
Japan
Prior art keywords
register
phase
timing
value
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58232814A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0536752B2 (enrdf_load_stackoverflow
Inventor
Yoshihiko Hayashi
良彦 林
Ikuo Kawaguchi
川口　郁夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58232814A priority Critical patent/JPS60125573A/ja
Publication of JPS60125573A publication Critical patent/JPS60125573A/ja
Publication of JPH0536752B2 publication Critical patent/JPH0536752B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Manipulation Of Pulses (AREA)
JP58232814A 1983-12-12 1983-12-12 タイミングパルス発生器 Granted JPS60125573A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58232814A JPS60125573A (ja) 1983-12-12 1983-12-12 タイミングパルス発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58232814A JPS60125573A (ja) 1983-12-12 1983-12-12 タイミングパルス発生器

Publications (2)

Publication Number Publication Date
JPS60125573A true JPS60125573A (ja) 1985-07-04
JPH0536752B2 JPH0536752B2 (enrdf_load_stackoverflow) 1993-05-31

Family

ID=16945187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58232814A Granted JPS60125573A (ja) 1983-12-12 1983-12-12 タイミングパルス発生器

Country Status (1)

Country Link
JP (1) JPS60125573A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292579A (ja) * 1985-06-20 1986-12-23 Nec Corp 試験信号発生回路
JPH026767A (ja) * 1988-06-20 1990-01-10 Advantest Corp Ｉｃ試験用波形発生装置
WO2004031789A1 (ja) * 2002-10-01 2004-04-15 Advantest Corporation 試験装置、及び試験方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292579A (ja) * 1985-06-20 1986-12-23 Nec Corp 試験信号発生回路
JPH026767A (ja) * 1988-06-20 1990-01-10 Advantest Corp Ｉｃ試験用波形発生装置
WO2004031789A1 (ja) * 2002-10-01 2004-04-15 Advantest Corporation 試験装置、及び試験方法
US7216271B2 (en) 2002-10-01 2007-05-08 Advantest Corporation Testing apparatus and a testing method

Also Published As

Publication number Publication date
JPH0536752B2 (enrdf_load_stackoverflow) 1993-05-31

Similar Documents

Publication Publication Date Title
US6996032B2 (en) BIST circuit for measuring path delay in an IC
US7219269B2 (en) Self-calibrating strobe signal generator
JP3625400B2 (ja) 可変遅延素子のテスト回路
US6060898A (en) Format sensitive timing calibration for an integrated circuit tester
EP0855653A1 (en) Memory controller with a programmable strobe delay
US7184936B1 (en) Timing variation measurement system and method
JPS6117080B2 (enrdf_load_stackoverflow)
KR100356725B1 (ko) 반도체 시험 장치
JP2004125574A (ja) 試験装置、及び試験方法
JPS60125573A (ja) タイミングパルス発生器
US7545691B2 (en) Measuring circuit for qualifying a memory located on a semiconductor device
JP2965049B2 (ja) タイミング発生装置
JP2000090693A (ja) メモリ試験装置
US6647538B1 (en) Apparatus and method for signal skew characterization utilizing clock division
JP3050391B2 (ja) Ｉｃテスタのテスト波形発生装置
JPS6067869A (ja) タイミング信号発生器
JP3061650B2 (ja) Ｉｃテスターの発生パルスモニタ回路
JPH026769A (ja) テスターのタイミング信号発生回路
JPH09304482A (ja) Ｉｃ試験装置
US20020001252A1 (en) Semiconductor memory device and method of operation having delay pulse generation
JP2004279155A (ja) サンプリングデジタイザを使ったジッタ試験装置、方法及びこのサンプリングデジタイザを備えた半導体試験装置
JP2532718B2 (ja) 半導体集積回路装置
JP2004040037A (ja) 半導体集積回路の検査装置
JPH0434703B2 (enrdf_load_stackoverflow)
JPH07151839A (ja) 半導体試験装置