JPS5990157A - 電子システム - Google Patents
電子システムInfo
- Publication number
- JPS5990157A JPS5990157A JP58140960A JP14096083A JPS5990157A JP S5990157 A JPS5990157 A JP S5990157A JP 58140960 A JP58140960 A JP 58140960A JP 14096083 A JP14096083 A JP 14096083A JP S5990157 A JPS5990157 A JP S5990157A
- Authority
- JP
- Japan
- Prior art keywords
- electronic
- devices
- processor
- semiconductor substrate
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Prevention of errors by analysis, debugging or testing of software
- G06F11/362—Debugging of software
- G06F11/3648—Debugging of software using additional hardware
- G06F11/3656—Debugging of software using additional hardware using a specific debug interface
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Microcomputers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US404094 | 1982-08-02 | ||
| US06/404,094 US4527234A (en) | 1982-08-02 | 1982-08-02 | Emulator device including a semiconductor substrate having the emulated device embodied in the same semiconductor substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5990157A true JPS5990157A (ja) | 1984-05-24 |
| JPH0581937B2 JPH0581937B2 (enExample) | 1993-11-16 |
Family
ID=23598134
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58140960A Granted JPS5990157A (ja) | 1982-08-02 | 1983-08-01 | 電子システム |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US4527234A (enExample) |
| JP (1) | JPS5990157A (enExample) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4609985A (en) * | 1982-12-30 | 1986-09-02 | Thomson Components-Mostek Corporation | Microcomputer with severable ROM |
| US4633417A (en) * | 1984-06-20 | 1986-12-30 | Step Engineering | Emulator for non-fixed instruction set VLSI devices |
| JPS61169941A (ja) * | 1985-01-22 | 1986-07-31 | Sony Corp | 記憶装置 |
| US4809167A (en) * | 1985-07-03 | 1989-02-28 | Metalink Corporation | Circuitry for emulating single chip microcomputer without access to internal buses |
| US4744084A (en) * | 1986-02-27 | 1988-05-10 | Mentor Graphics Corporation | Hardware modeling system and method for simulating portions of electrical circuits |
| US4718064A (en) * | 1986-02-28 | 1988-01-05 | Western Digital Corporation | Automatic test system |
| US5210832A (en) * | 1986-10-14 | 1993-05-11 | Amdahl Corporation | Multiple domain emulation system with separate domain facilities which tests for emulated instruction exceptions before completion of operand fetch cycle |
| NL8602849A (nl) * | 1986-11-11 | 1988-06-01 | Philips Nv | Inrichting voor het emuleren van een microcontroller, middels gebruik maken van een moedermicrocontroller en een dochtermicrocontroller, moedermicrocontroller, respektievelijk dochtermicrocontroller voor gebruik in zo een inrichting, geintegreerde schakeling voor gebruik in zo een dochtermicrocontroller en microcontroller bevattende zo een geintegreerde schakeling. |
| US4853626A (en) * | 1987-03-10 | 1989-08-01 | Xilinx, Inc. | Emulator probe assembly for programmable logic devices |
| EP0306644B1 (en) * | 1987-07-06 | 1997-11-12 | Hitachi, Ltd. | Data processor having a break function |
| US5535331A (en) * | 1987-09-04 | 1996-07-09 | Texas Instruments Incorporated | Processor condition sensing circuits, systems and methods |
| US4939637A (en) * | 1988-02-10 | 1990-07-03 | Metalink Corporation | Circuitry for producing emulation mode in single chip microcomputer |
| US5218691A (en) * | 1988-07-26 | 1993-06-08 | Disk Emulation Systems, Inc. | Disk emulation system |
| US5070474A (en) * | 1988-07-26 | 1991-12-03 | Disk Emulation Systems, Inc. | Disk emulation system |
| JPH02186448A (ja) * | 1989-01-13 | 1990-07-20 | Nippon Chemicon Corp | デバッグ環境を備えた集積回路 |
| US5158815A (en) * | 1989-03-06 | 1992-10-27 | The Kendall Company | Closure device for shrinkwraps |
| US5077657A (en) * | 1989-06-15 | 1991-12-31 | Unisys | Emulator Assist unit which forms addresses of user instruction operands in response to emulator assist unit commands from host processor |
| US5509019A (en) * | 1990-09-20 | 1996-04-16 | Fujitsu Limited | Semiconductor integrated circuit device having test control circuit in input/output area |
| DE69231227T2 (de) * | 1991-11-12 | 2001-03-01 | Microchip Technology Inc., Chandler | Mikrokontroller mit schmelzsicherungs-emulierenden speichern und testverfahren |
| WO1993016433A1 (en) * | 1992-02-07 | 1993-08-19 | Seiko Epson Corporation | Hardware emulation accelerator and method |
| US5878269A (en) * | 1992-03-27 | 1999-03-02 | National Semiconductor Corporation | High speed processor for operation at reduced operating voltage |
| JPH0728665A (ja) * | 1993-07-07 | 1995-01-31 | Nec Corp | マイクロコンピュータ用エミュレーション装置 |
| GB9417297D0 (en) * | 1994-08-26 | 1994-10-19 | Inmos Ltd | Method and apparatus for testing an integrated circuit device |
| US5699554A (en) * | 1994-10-27 | 1997-12-16 | Texas Instruments Incorporated | Apparatus for selective operation without optional circuitry |
| US5784291A (en) * | 1994-12-22 | 1998-07-21 | Texas Instruments, Incorporated | CPU, memory controller, bus bridge integrated circuits, layout structures, system and methods |
| JPH09152979A (ja) * | 1995-09-28 | 1997-06-10 | Matsushita Electric Ind Co Ltd | 半導体装置 |
| SE507127C3 (sv) * | 1996-12-20 | 1998-05-04 | Ericsson Telefon Ab L M | Metoder och anordning vid kretskortskonstruktion |
| DE10100344A1 (de) * | 2001-01-05 | 2002-07-25 | Infineon Technologies Ag | Integrierte Schaltung und Verfahren zum Herstellen einer integrierten Schaltung |
| US7036046B2 (en) | 2002-11-14 | 2006-04-25 | Altera Corporation | PLD debugging hub |
| US7076751B1 (en) | 2003-01-24 | 2006-07-11 | Altera Corporation | Chip debugging using incremental recompilation |
| US7539900B1 (en) | 2003-07-29 | 2009-05-26 | Altera Corporation | Embedded microprocessor for integrated circuit testing and debugging |
| JP2006134107A (ja) * | 2004-11-05 | 2006-05-25 | Nec Electronics Corp | マイクロコンピュータチップ及びエミュレータ |
| JP4304538B2 (ja) * | 2007-03-27 | 2009-07-29 | セイコーエプソン株式会社 | エミュレーションシステム |
| US8898051B2 (en) * | 2009-06-12 | 2014-11-25 | Cadence Design Systems, Inc. | System and method for implementing a trace interface |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4180772A (en) * | 1977-05-31 | 1979-12-25 | Fujitsu Limited | Large-scale integrated circuit with integral bi-directional test circuit |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4413271A (en) * | 1981-03-30 | 1983-11-01 | Sprague Electric Company | Integrated circuit including test portion and method for making |
| US4441154A (en) * | 1981-04-13 | 1984-04-03 | Texas Instruments Incorporated | Self-emulator microcomputer |
-
1982
- 1982-08-02 US US06/404,094 patent/US4527234A/en not_active Expired - Lifetime
-
1983
- 1983-08-01 JP JP58140960A patent/JPS5990157A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4180772A (en) * | 1977-05-31 | 1979-12-25 | Fujitsu Limited | Large-scale integrated circuit with integral bi-directional test circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| US4527234A (en) | 1985-07-02 |
| JPH0581937B2 (enExample) | 1993-11-16 |
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