DE69231227T2 - Mikrokontroller mit schmelzsicherungs-emulierenden speichern und testverfahren - Google Patents
Mikrokontroller mit schmelzsicherungs-emulierenden speichern und testverfahrenInfo
- Publication number
- DE69231227T2 DE69231227T2 DE69231227T DE69231227T DE69231227T2 DE 69231227 T2 DE69231227 T2 DE 69231227T2 DE 69231227 T DE69231227 T DE 69231227T DE 69231227 T DE69231227 T DE 69231227T DE 69231227 T2 DE69231227 T2 DE 69231227T2
- Authority
- DE
- Germany
- Prior art keywords
- eprom
- fuses
- microcontroller
- program memory
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/30—Arrangements for executing machine instructions, e.g. instruction decode
- G06F9/30145—Instruction analysis, e.g. decoding, instruction word fields
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
- G06F15/76—Architectures of general purpose stored program computers
- G06F15/78—Architectures of general purpose stored program computers comprising a single central processing unit
- G06F15/7807—System on chip, i.e. computer system on a single chip; System in package, i.e. computer system on one or more chips in a single package
- G06F15/7814—Specially adapted for real time processing, e.g. comprising hardware timers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/30—Arrangements for executing machine instructions, e.g. instruction decode
- G06F9/30145—Instruction analysis, e.g. decoding, instruction word fields
- G06F9/3016—Decoding the operand specifier, e.g. specifier format
- G06F9/30167—Decoding the operand specifier, e.g. specifier format of immediate specifier, e.g. constants
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Software Systems (AREA)
- Quality & Reliability (AREA)
- Computing Systems (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Microcomputers (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US79096991A | 1991-11-12 | 1991-11-12 | |
PCT/US1992/009466 WO1993010501A1 (en) | 1991-11-12 | 1992-11-12 | Microcontroller with fuse-emulating latches |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69231227D1 DE69231227D1 (de) | 2000-08-10 |
DE69231227T2 true DE69231227T2 (de) | 2001-03-01 |
Family
ID=25152281
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69231227T Expired - Fee Related DE69231227T2 (de) | 1991-11-12 | 1992-11-12 | Mikrokontroller mit schmelzsicherungs-emulierenden speichern und testverfahren |
Country Status (4)
Country | Link |
---|---|
US (1) | US5455937A (de) |
EP (1) | EP0612422B1 (de) |
DE (1) | DE69231227T2 (de) |
WO (1) | WO1993010501A1 (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3727670B2 (ja) * | 1994-04-28 | 2005-12-14 | 富士通株式会社 | マイクロコントローラ |
US5737212A (en) * | 1995-12-04 | 1998-04-07 | Industrial Technology Research Institute | Flag setting circuit for microcontroller |
US5694067A (en) * | 1996-05-24 | 1997-12-02 | Microchip Technology Incorporated | Microcontroller having a minimal number of external components |
US6339413B1 (en) * | 1996-06-28 | 2002-01-15 | Microchip Technology Incorporated | Microcontroller with internal clock for liquid crystal display |
US5889679A (en) * | 1997-07-15 | 1999-03-30 | Integrated Device Technology, Inc. | Fuse array control for smart function enable |
US6115814A (en) * | 1997-11-14 | 2000-09-05 | Compaq Computer Corporation | Memory paging scheme for 8051 class microcontrollers |
US6163492A (en) * | 1998-10-23 | 2000-12-19 | Mosel Vitelic, Inc. | Programmable latches that include non-volatile programmable elements |
US6708268B1 (en) * | 1999-03-26 | 2004-03-16 | Microchip Technology Incorporated | Microcontroller instruction set |
JP4125475B2 (ja) * | 2000-12-12 | 2008-07-30 | 株式会社東芝 | Rtl生成システム、rtl生成方法、rtl生成プログラム及び半導体装置の製造方法 |
US6882583B2 (en) * | 2003-04-30 | 2005-04-19 | International Business Machines Corporation | Method and apparatus for implementing DRAM redundancy fuse latches using SRAM |
WO2005043383A1 (en) | 2003-10-23 | 2005-05-12 | Microchip Technology Incorporated | Microcontroller instruction set |
EP1650862B1 (de) * | 2004-10-22 | 2019-08-07 | Dialog Semiconductor GmbH | System-On-Chip für Hochspannungsanwendung |
US7747415B1 (en) * | 2005-12-22 | 2010-06-29 | Microstrain, Inc. | Sensor powered event logger |
US8793426B2 (en) | 2009-02-11 | 2014-07-29 | Microchip Technology Incorporated | Microcontroller with linear memory access in a banked memory |
US10936459B2 (en) | 2018-12-07 | 2021-03-02 | Microsoft Technology Licensing, Llc | Flexible microcontroller support for device testing and manufacturing |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4527234A (en) * | 1982-08-02 | 1985-07-02 | Texas Instruments Incorporated | Emulator device including a semiconductor substrate having the emulated device embodied in the same semiconductor substrate |
US4691316A (en) * | 1985-02-14 | 1987-09-01 | Support Technologies, Inc. | ROM emulator for diagnostic tester |
US4857774A (en) * | 1986-09-19 | 1989-08-15 | Actel Corporation | Testing apparatus and diagnostic method for use with programmable interconnect architecture |
US5068823A (en) * | 1988-07-11 | 1991-11-26 | Star Semiconductor Corporation | Programmable integrated circuit using topological and parametric data to selectively connect and configure different high level functional blocks thereof |
US5003507A (en) * | 1988-09-06 | 1991-03-26 | Simon Johnson | EPROM emulator for selectively simulating a variety of different paging EPROMs in a test circuit |
US5101490A (en) * | 1989-01-10 | 1992-03-31 | Bull Hn Information Systems Inc. | Peripheral device controller with an EEPROM with microinstructions for a RAM control store |
US5138706A (en) * | 1989-02-21 | 1992-08-11 | Compaq Computer Corporation | Password protected enhancement configuration register for addressing an increased number of adapter circuit boards with target machine emulation capabilities |
US5031152A (en) * | 1989-09-29 | 1991-07-09 | Sgs-Thomson Microelectronics, Inc. | Test circuit for non-volatile storage cell |
FR2656939B1 (fr) * | 1990-01-09 | 1992-04-03 | Sgs Thomson Microelectronics | Verrous de securite pour circuit integre. |
-
1992
- 1992-11-12 WO PCT/US1992/009466 patent/WO1993010501A1/en active IP Right Grant
- 1992-11-12 DE DE69231227T patent/DE69231227T2/de not_active Expired - Fee Related
- 1992-11-12 EP EP92924264A patent/EP0612422B1/de not_active Expired - Lifetime
-
1994
- 1994-06-30 US US08/268,673 patent/US5455937A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0612422A4 (en) | 1996-05-22 |
WO1993010501A1 (en) | 1993-05-27 |
EP0612422B1 (de) | 2000-07-05 |
US5455937A (en) | 1995-10-03 |
EP0612422A1 (de) | 1994-08-31 |
DE69231227D1 (de) | 2000-08-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |